Výsledky vyhledávání

On Using Cell-Aware Models for Representing SRAM Architecture

Autor: Xhafa, Xhesila, Ladhar, Aymen, Faehn, Eric, Anghel, Lorena, Di Pendina, Gregory, Girard, Patrick, Virazel, Arnaud

Publikováno v: 16e Colloque National du GDR SoC²
16e Colloque National du GDR SoC², Jun 2022, Strasbourg, France

National audience; This paper presents a novel approach to memory testing which relies on Cell-Aware (CA) test to further improve the yield in SoCs. Therefore, using CA test shifts the memory testing methodology from functional to structural testing.

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=od______3515::30a67368e0ebf55858f40a3e63ecfcd1
https://hal-lirmm.ccsd.cnrs.fr/lirmm-03987914/document

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SymBIST: Symmetry-Based Analog and Mixed-Signal Built-In Self-Test for Functional Safety

Autor: Pavlidis, Antonios, Louërat, Marie-Minerve, Faehn, Eric, Kumar, Anand, Stratigopoulos, Haralampos-G.

Publikováno v: IEEE Transactions on Circuits and Systems I: Regular Papers
IEEE Transactions on Circuits and Systems I: Regular Papers, IEEE, In press

International audience; We propose a Built-In Self-Test (BIST) paradigm for analog and mixed-signal (A/M-S) Integrated Circuits (ICs), called symmetry-based BIST (SymBIST). SymBIST exploits inherent symmetries in an A/M-S IC to construct signals that

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::82eac33719219ef1353741df60b3d594
https://hal.archives-ouvertes.fr/hal-03171195

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SymBIST: Symmetry-based Analog/Mixed-Signal BIST

Autor: Pavlidis, Antonios, Louërat, Marie-Minerve, Faehn, Eric, Kumar, Anand, Stratigopoulos, Haralampos-G.

Publikováno v: 32. GI / GMM / ITG-Workshop Testmethoden und Zuverlässigkeit von Schaltungen und Systemen
32. GI / GMM / ITG-Workshop Testmethoden und Zuverlässigkeit von Schaltungen und Systemen, Feb 2020, Ludwigsburg, Germany

International audience

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::9e2e96fe0489fc298d08bdb27d0be6ef
https://hal.archives-ouvertes.fr/hal-02466029

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