Zobrazeno 1 - 10
of 18
pro vyhledávání: '"Fadi Batarseh"'
Autor:
Munir Abu-Helalah, Asma’a Al-Mnayyis, Hamed Alzoubi, Ruba Al-Abdallah, Hussein Jdaitawi, Omar Nafi, Kamel Abu-Sal, Alaa Altawalbeh, Alia Khlaifat, Enas Al-Zayadneh, Ihsan Almaaitah, Ibrahim Borghol, Fadi Batarseh, Omar Okkeh, Abdallah Dalal, Ahmad Alhendi, Mohammad Almaaitah, Adnan Al-Lahham, Mahmoud Gazo, Faisal Abu Ekteish, Ziad Elnasser
Publikováno v:
Vaccines, Vol 11, Iss 9, p 1396 (2023)
Introduction: Streptococcus pneumoniae infections are a major cause of mortality and morbidity worldwide. In Jordan, pneumococcal conjugate vaccines (PCVs) are not included in the national vaccination program. Due to the current availability of sever
Externí odkaz:
https://doaj.org/article/02af2f06b2ce41bea94e31d1b9c38bba
Publikováno v:
DTCO and Computational Patterning II.
Autor:
Lynn T. N. Wang, Klaus-Peter Johnsen, Ivan Tanev, Fadi Batarseh, Chang Su, Pouya Rezaeifakhr, Uwe Paul Schroeder
Publikováno v:
DTCO and Computational Patterning II.
Autor:
Piyush Pathak, Uwe Paul Schroeder, Fadi Batarseh, Philippe Hurat, Jeffrey E. Nelson, Sriram Madhavan, Ya-Chieh Lai
Publikováno v:
Design-Process-Technology Co-optimization XV.
Two-dimensional pattern matching libraries are used to define known hotspots in the design space. These libraries can then be integrated into a physical design router to search and fix such hotspots prior to the design being completed and signed off.
Autor:
Neerja Bawaskar, Fadi Batarseh, Davide Pacifico, Atul Chittora, Shenghua Song, Monisa Ramesh Babu, Shobhit Malik, Janam Bakshi
Publikováno v:
International Symposium for Testing and Failure Analysis.
Many fabless customers do not share the design information such as LEF/DEF (Library Exchange Format and Design Exchange Format), design netlist, and test program information with foundries because they contain proprietary IP. Determining the root-cau
Publikováno v:
Design-Process-Technology Co-optimization for Manufacturability XIV.
With multi patterning being the method of choice for pushing technology further down the shrink roadmap, new design weak points are emerging that have multi-layer components and are difficult to find and to define. On the other hand, advanced OPC met
Publikováno v:
Journal of Knowledge Management. 21:1342-1361
Purpose The purpose of the study is to empirically extend and validate a measure of absorptive capacity (ACAP) and examine its role in leveraging the benefits of diversity on innovation within global virtual teams (GVTs). This study validates a multi
Publikováno v:
International Journal of Management Science and Engineering Management. 13:1-10
Global virtual teams (GVTs) are increasingly utilized in industry given their ability to bring together diverse knowledge and experience from individuals who are not geographically proximal. Having...
Autor:
Fadi Batarseh, Mohamed Ismail, Uwe Paul Schroeder, Janam Bakshi, Nishant Shah, Jason P. Cain, Ahmed Mohyeldin, Ahmed Mounir Elsemary, Moutaz Fakhry
Publikováno v:
Design-Process-Technology Co-optimization for Manufacturability XII.
Via failure has always been a significant yield detractor caused by random and systematic defects. Introducing redundant vias or via bars into the design can alleviate the problem significantly [1] and has, therefore, become a standard DFM procedure
Autor:
Pietro Babighian, Muhammed Pallachali, Nicolai Petrov, Tamer Desouky, Teck Jung Tang, Fadi Batarseh, Deborah Ryan, Shweta Shokale, Mark Terry, Haizhou Yin, Rohan Deshpande, Jiechang Hou, Yixiao Zhang, Sang-Kee Eah, Rao Desineni, Feng Wang, Ahmed Khalil
Publikováno v:
Photomask Technology.
Lithography process variation as well as etch and topography have always been a stubborn challenge for advanced technology nodes, i.e. 14nm and beyond. This variability usually results in defects aggregating around the edge of the wafer and leading t