Zobrazeno 1 - 5
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pro vyhledávání: '"Fabio A. Velarde Gonzalez"'
Publikováno v:
2022 IEEE International Integrated Reliability Workshop (IIRW).
Circuit simulations are an important step in the verification process of integrated circuits during design projects. They employ compact models that describe the behavior of integrated transistors depending on technology details, geometry, bias condi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::3e62b08578de3e4bb00b940334b62a9a
https://publica.fraunhofer.de/handle/publica/428286
https://publica.fraunhofer.de/handle/publica/428286
Publikováno v:
2021 IEEE International Integrated Reliability Workshop (IIRW).
Autor:
André Lange, Fabio A. Velarde Gonzalez, Kay-Uwe Giering, Anastasios Vervantidis, Lukas Hahne, Andy Heinig, Roland Jancke
Publikováno v:
Microelectronics Reliability. 137:114775
The importance of integrated circuit (IC) reliability has been growing to benefit from the potentials of advanced semiconductor technologies in long-living applications, such as automotive electronics. Today, prototypes and products are tested for th
Publikováno v:
ESSDERC
The degradation of integrated field effect transistors (FETs) is an increasingly critical effect for electronic systems and their product lifetimes. To allow reliability investigations during integrated circuit (IC) design already, multiple electroni