Zobrazeno 1 - 10
of 101
pro vyhledávání: '"FUMIO MURAI"'
Autor:
Hiroya Ohta, Hajime Kawano, Hiroyuki Itoh, Hidetoshi Satoh, Jiro Yamamoto, Yasunari Sohda, Fumio Murai
Publikováno v:
Microelectronic Engineering. :78-86
This paper reviews and introduces recent methods for enhancing the performance of cell-projection lithography and describes various useful applications of this type of lithography. To increase the throughput, the area of the e-beam mask that is avail
Autor:
Tomoyuki Ishii, Tokuo Kure, T. Sano, Fumio Murai, Kazuo Yano, Toshiyuki Mine, Takayuki Hashimoto, T. Kobayashi, Koichi Seki
Publikováno v:
Proceedings of the IEEE. 87:633-651
Starting with a brief review on the single-electron memory and its significance among various single-electron devices, this paper addresses the key issues which one inevitably encounters when one tries to achieve giga-to-tera bit memory integration.
Autor:
Sonoko Migitaka, Michiaki Hashimoto, Fumio Murai, Kyoko Kojima, Hiroshi Shiraishi, Shou-ichi Uchino, Jiro Yamamoto
Publikováno v:
Journal of Photopolymer Science and Technology. 11:555-563
Negative electron beam resists composed of a phenylcarbinol, poly(4-hydroxystyrene) (PHS), and an onium salt have been developed to define patterns below 100-nm. Five phenylcarbinols were evaluated as a precursor of a dissolution inhibitor (PDI) and
Autor:
Toshio Sakamizu, Tadasi Arai, Yasunori Suzuki, Kohji Katoh, Shou-ichi Uchino, Fumio Murai, Hiroshi Shiraishi
Publikováno v:
Journal of Photopolymer Science and Technology. 11:547-552
The effect of m/p-cresol novolak molecular-weight-distribution (MWD) and dissolution inhibitor structure on resist performance were investigated. A novolak resin richer in p-cresol ratio gave a large dissolution inhibition capability of polymeric dis
Autor:
Toshihiko Tanaka, Yumiko Oki, Norio Hasegawa, Katsuya Hayano, Tsuneo Terasawa, Fumio Murai, Akira Imai
Publikováno v:
Electronics and Communications in Japan (Part II: Electronics). 79:73-83
A half-tone phase-shifting mask (HPM) is effective in improving resolution and focus latitude of an isolated hole pattern. HPM can be fabricated by the conventional method and a practical phase-shifting technique can be realized using HPM. The author
Autor:
Yoshiaki Ikenoue, Yasunori Suzuki, Yoshihiro Ohta, Tsutomu Tawa, Hideki Tomozawa, Yoshihiro Saida, Fumio Murai
Publikováno v:
Journal of Photopolymer Science and Technology. 9:707-714
Autor:
Toshio Sakamizu, Keiko Hasegawa, Shinji Okazaki, Hajime Hayakawa, Hiroshi Shiraishi, Fumio Murai, Hidenori Yamaguchi
Publikováno v:
Electronics and Communications in Japan (Part II: Electronics). 78:81-91
A single-layer resist process using a high resistivity positive resist by solubility reversal (PSR) for electron beam direct writing is described. Conventional PSR designed for mask creation is found to have inhomogeneous dissolution characteristics
Autor:
Ryo Nagai, Hiroki Yamashita, I. Shoji, Mayu Aoki, S. Iijima, Takashi Nishida, Masashi Horiguchi, T. Kisu, Eiji Takeda, Makoto Ohkura, Takeshi Sakata, Toshihiro Tanaka, Toru Kaga, Natsuki Yokoyama, Yasushi Gotoh, Y. Nakagome, T. Sekiguchi, Tanaka Haruhiko, E. Yamasaki, Shigeki Ueda, Fumio Murai
Publikováno v:
IEEE Journal of Solid-State Circuits. 30:1165-1173
A distributed-column-control architecture is proposed to reduce the burst-mode cycle time of large-capacity DRAMs. It features independent operation of the I/O block and subarrays, eliminating the wiring delay in the internal buses from the longest p
Publikováno v:
IEEE Transactions on Electron Devices. 41:1831-1836
The influence of extremely shallow source and drain junctions on the short channel effects of Si MOSFET's are experimentally investigated. These extremely shallow junctions are realized in MOSFET's with a triple-gate structure. Two subgates formed as
Publikováno v:
IEEE Transactions on Electron Devices. 41:1628-1638
This paper presents room-temperature operation, for the first time, of single-electron memory, in which one electron represents one bit of information. This is made possible by our new one-transistor memory configuration which has a very high charge