Zobrazeno 1 - 10
of 573
pro vyhledávání: '"FRIGERI, C."'
Autor:
Musayeva, N., Orujov, T., Hasanov, R., Sultanov, Ch., Ferrari, C., Frigeri, C., Trevisi, G., Beretta, S., Bosi, M., Verucchi, R., Aversa, L., Sansone, F., Rispoli, F., Baldini, L.
Publikováno v:
In Materials Today: Proceedings 2020 20 Part 1:46-49
Publikováno v:
In Thin Solid Films 1 June 2019 679:58-63
Publikováno v:
J Mater Sci: Mater Electron (2008) 19:S289-S293
A study is presented of the structural changes occurring as a function of the annealing conditions in hydrogenated amorphous Si/Ge multilayers prepared by sputtering. Annealing changes the structure of the as-deposited multilayer except for the less
Externí odkaz:
http://arxiv.org/abs/0902.1814
Multilayers of hydrogenated ultrathin (3 nm) amorphous a-Si and a-Ge layers prepared by sputtering have been studied by atomic force microscopy (AFM) and transmission electron microscopy (TEM) to check the influence of annealing on their structural s
Externí odkaz:
http://arxiv.org/abs/0902.1679
Autor:
Csik, A., Serenyi, M., Erdelyi, Z., Nemcsics, A., Cserhati, C., Langer, G. A., Beke, D. L., Frigeri, C., Simon, A.
Thermal stability of hydrogenated amorphous Si/Ge multilayers has been investigated by Scanning Electron Microscopy (SEM), Transmission Electron Microscopy (TEM) and Small-Angle X-Ray Diffraction (SAXRD) techniques. Amorphous H-Si/Ge multilayers were
Externí odkaz:
http://arxiv.org/abs/0902.1674
Autor:
Piñero, J.C., Araújo, D., Pastore, C.E., Gutierrez, M., Frigeri, C., Benali, A., Lelièvre, J.F., Gendry, M.
Publikováno v:
In Applied Surface Science 15 February 2017 395:195-199
Autor:
Attolini, G., Ponraj, J.S., Frigeri, C., Buffagni, E., Ferrari, C., Musayeva, N., Jabbarov, R., Bosi, M.
Publikováno v:
In Applied Surface Science 1 January 2016 360 Part A:157-163
Publikováno v:
In Solar Energy September 2015 119:225-232
Autor:
Landesman, J.P., Levallois, C., Jiménez, J., Pommereau, F., Léger, Y., Beck, A., Delhaye, T., Torres, A., Frigeri, C., Rhallabi, A.
Publikováno v:
In Microelectronics Reliability August-September 2015 55(9-10):1750-1753
Publikováno v:
In Applied Surface Science 15 March 2013 269:12-16