Zobrazeno 1 - 10
of 177
pro vyhledávání: '"FRANCK DELMOTTE"'
Publikováno v:
Applied Sciences, Vol 14, Iss 3, p 956 (2024)
This paper presents an X-ray reflectivity study of a Sc/SiC/Al periodic multilayer deposited via magnetron sputtering and its possible adaptation to be used as a dispersive element in the crystal spectrometers equipping scanning electron microscopes
Externí odkaz:
https://doaj.org/article/6a235971938e4ad887d24e05fbeb794d
Autor:
Franck Delmotte, Regina Soufli, Catherine Burcklen, Irene Papagiannouli, Farhad Salmassi, Eric Gullikson
Publikováno v:
Optical and EUV Nanolithography XXXVI.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4996e21a19c07b700ec5cd05914677a2
https://doi.org/10.1117/12.2660664
https://doi.org/10.1117/12.2660664
Autor:
Franck Delmotte, Catherine Burcklen, Jennifer Alameda, Farhad Salmassi, Eric Gullikson, Regina Soufli
Publikováno v:
Optics express. 30(13)
We have developed a new method for the determination of photoabsorption at extreme ultraviolet wavelengths longer than 20 nm, where reliable refractive index values are sparse or non-existent. Our method overcomes the obstacle of multiple reflections
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::92a54ef2cacdfa19d9436cce744d0287
https://pubmed.ncbi.nlm.nih.gov/36225052
https://pubmed.ncbi.nlm.nih.gov/36225052
Autor:
Julien E. Rault, Evgueni Meltchakov, Franck Delmotte, Regina Soufli, Christopher C. Walton, Catherine Burcklen, Eric M. Gullikson, Jennifer Rebellato
Publikováno v:
Journal of Nanoscience and Nanotechnology
Journal of Nanoscience and Nanotechnology, American Scientific Publishers, 2019, 19 (1), pp.554-561. ⟨10.1166/jnn.2019.16480⟩
Journal of Nanoscience and Nanotechnology, American Scientific Publishers, 2019, 19 (1), pp.554-561. ⟨10.1166/jnn.2019.16480⟩
International audience; This paper demonstrates that highly reflective Cr/B 4 C multilayer interference coatings with nano-metric layer thicknesses, designed to operate in the soft X-ray photon energy range, have stable reflective performance for a p
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::065268c3160387cb0ded5cd06ad3b7c0
https://doi.org/10.1166/jnn.2019.16480
https://doi.org/10.1166/jnn.2019.16480
Autor:
J. Hansotte, R. Müller, M. Hailey, P. Schlatter, A. Lawrenson, M. Monecke, Hardi Peter, Julien Rosin, Koen Stegen, Jean-Claude Vial, S. Parenti, Ali BenMoussa, Etienne Renotte, N. Szwec, Marie-Laure Hellin, R. Enge, M. Haberreiter, A. Philippon, P. Coker, B. Giordanengo, L. Dolla, K. Heerlein, Werner Schmutz, Matthew J. West, K. Ruane, J.-F. Hochedez, M. Chaigneau, M. Kahle, Emmanuel Mazy, J. Scanlan, J. Tandy, J. Barbay, B. Chares, T. Appourchaux, Laurence Rossi, C. Dumesnil, E. Pylyser, R. Aznar Cuadrado, Louise K. Harra, S. Meyer, F. Cabé, Benoit Marquet, Evgueni Meltchakov, Andrei Zhukov, D. Westwood, Bogdan Nicula, G. Willis, M.-F. Ravet-Krill, B. Borgo, S. Hemsley, Isabelle Tychon, N. Guerreiro, D. Linder, R. Mercier, Sylvie Liébecq, Thomas Wiegelmann, Philip J. Smith, M. Gyo, L. Mountney, G. Davison, Frédéric Rabecki, Jean-Marie Gillis, P. Langer, P. Roth, Sami K. Solanki, Luciano Rodriguez, Jean-Philippe Halain, L. Cadiergues, P. Addison, V. Büchel, D. Markiewicz-Innes, X. Zhang, Daniel Pfiffner, M. Roulliay, Antoine Rousseau, Stéphane Roose, Udo Schühle, M. Spescha, Jean-Yves Plesseria, Lionel Jacques, J. C. Le Clec’h, Yvan Stockman, G. Del Zanna, T. Kennedy, C. Beurthe, B. Mampaey, Franck Delmotte, C. Theobald, C. Choque Cortez, S. Meining, S. François, David Long, M. Bergmann, F. Rouesnel, S. Koller, C. Tamiatto, M. Bouzit, David Berghmans, D. Bates, L. Bradley, E. Kotsialos, A. Hafiz, D. Davies, J. B. L. Jones, S. Smit, Véronique Delouille, Gilles Morinaud, Aline Hermans, S. Coumar, J. Rebellato, Yvette Houbrechts, Stephan Werner, Werner Curdt, J. Cutler, K. Bonte, Daniel B. Seaton, Jean-Marc Defise, F. Moron, M. Klaproth, Eric Buchlin, J.-J. Fourmond, I. Phillips, Jörg Büchner, Pierre Rochus, M. Kolleck, Christophe Hecquet, Sarah A. Matthews, L. van Driel-Gesztelyi, Lucie M. Green, Cis Verbeeck, S. Gissot, F. Dürig, M. Condamin, Cedric Lenaerts, F. Auchère, K. Ihsan, K. Silliman, A. Guilbaud, Luca Teriaca, E. Kraaikamp, F. Monfort, A. Jérôme, Andreas Zerr, E. Marsch, Berend Winter, D. N. Baker, Alexandra Mazzoli, A. Spencer, V. Hervier
Publikováno v:
Astronomy and Astrophysics-A&A
Astronomy and Astrophysics-A&A, EDP Sciences, 2020, 642, pp.A8. ⟨10.1051/0004-6361/201936663⟩
Astronomy and Astrophysics-A&A, EDP Sciences, 2020, 642, ⟨10.1051/0004-6361/201936663⟩
Astronomy and Astrophysics-A&A, EDP Sciences, 2020, 642, pp.A8. ⟨10.1051/0004-6361/201936663⟩
Astronomy and Astrophysics-A&A, EDP Sciences, 2020, 642, ⟨10.1051/0004-6361/201936663⟩
Context.The Extreme Ultraviolet Imager (EUI) is part of the remote sensing instrument package of the ESA/NASA Solar Orbiter mission that will explore the inner heliosphere and observe the Sun from vantage points close to the Sun and out of the eclipt
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::4fde6c949827de1c6d33fe569ab239b5
https://hal.archives-ouvertes.fr/hal-02991327
https://hal.archives-ouvertes.fr/hal-02991327
Autor:
Jennifer Rebellato, Cédric Baumier, Florian Pallier, Eric M. Gullikson, Evgueni Meltchakov, Regina Soufli, Sébastien de Rossi, Franck Delmotte
Publikováno v:
Thin Solid Films. 735:138873
This manuscript presents the structural characterization of Al/Sc-based periodic multilayer coatings for the extreme ultraviolet (EUV) spectral range. Based on transmission electron microscopy and electron diffraction as well as grazing-incidence and
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0d3644732d1f28c772408e1f613de8ce
https://doi.org/10.1016/j.tsf.2021.138873
https://doi.org/10.1016/j.tsf.2021.138873
Autor:
Farhad Salmassi, Franck Delmotte, David Girou, Julia Meyer-Ilse, Nicolai Brejnholt, Sonny Massahi, Eric M. Gullikson, Regina Soufli, Finn Erland Christensen
Publikováno v:
Journal of Applied Physics
Journal of Applied Physics, American Institute of Physics, 2019, 125 (8), pp.085106. ⟨10.1063/1.5067366⟩
Soufli, R, Delmotte, F, Meyer-Ilse, J, Salmassi, F, Brejnholt, N, Massahi, S, Girou, D, Christensen, F & Gullikson, E M 2019, ' Optical constants of magnetron sputtered Pt thin films with improved accuracy in the N-and O-electronic shell absorption regions ', Journal of Applied Physics, vol. 125, no. 8, 085106 . https://doi.org/10.1063/1.5067366
Journal of Applied Physics, American Institute of Physics, 2019, 125 (8), pp.085106. ⟨10.1063/1.5067366⟩
Soufli, R, Delmotte, F, Meyer-Ilse, J, Salmassi, F, Brejnholt, N, Massahi, S, Girou, D, Christensen, F & Gullikson, E M 2019, ' Optical constants of magnetron sputtered Pt thin films with improved accuracy in the N-and O-electronic shell absorption regions ', Journal of Applied Physics, vol. 125, no. 8, 085106 . https://doi.org/10.1063/1.5067366
We present an experimental, self-consistent determination of the optical constants (refractive index) of Pt using a combination of photoabsorption and reflectance data in the photon energy range 25–778 eV, which includes the N- and O-shell electron
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::83f6e3ad195067cbb661048a4bfd051b
https://hal-iogs.archives-ouvertes.fr/hal-03349801
https://hal-iogs.archives-ouvertes.fr/hal-03349801
Autor:
Jingtao Zhu, Philippe Jonnard, Stefano Nannarone, Yanyan Yuan, Françoise Bridou, Meiyi Wu, Qiushi Huang, Angelo Giglia, Sébatien de Rossi, Vita Ilakovac, Philippe Walter, Jean-Michel André, Franck Delmotte, S. Steydli, Zhanshan Wang, Karine Le Guen, Emrick Briand, Evgueni Meltchakov, Zhong Zhang, Ian Vickridge, Yuchun Tu, D. Schmaus
Publikováno v:
Journal of nanoscience and nanotechnology
19 (2019): 593–601. doi:10.1166/jnn.2019.16472
info:cnr-pdr/source/autori:Le Guen, Karine; Andre, Jean-Michel; Wu, Meiyi; Ilakovac, Vita; Delmotte, Franck; de Rossi, Sebatien; Bridou, Francoise; Meltchakov, Evgueni; Giglia, Angelo; Nannarone, Stefano; Wang, Zhanshan; Huang, Qiushi; Zhang, Zhong; Zhu, Jingtao; Tu, Yuchun; Yuan, Yanyan; Vickridge, Ian; Schmaus, Didier; Briand, Emrick; Steydli, Sebastien; Walter, Philippe; Jonnard, Philippe/titolo:Kossel Effect in Periodic Multilayers/doi:10.1166%2Fjnn.2019.16472/rivista:Journal of nanoscience and nanotechnology (Print)/anno:2019/pagina_da:593/pagina_a:601/intervallo_pagine:593–601/volume:19
Journal of Nanoscience and Nanotechnology
Journal of Nanoscience and Nanotechnology, American Scientific Publishers, 2019, 19 (1), pp.593-601. ⟨10.1166/jnn.2019.16472⟩
19 (2019): 593–601. doi:10.1166/jnn.2019.16472
info:cnr-pdr/source/autori:Le Guen, Karine; Andre, Jean-Michel; Wu, Meiyi; Ilakovac, Vita; Delmotte, Franck; de Rossi, Sebatien; Bridou, Francoise; Meltchakov, Evgueni; Giglia, Angelo; Nannarone, Stefano; Wang, Zhanshan; Huang, Qiushi; Zhang, Zhong; Zhu, Jingtao; Tu, Yuchun; Yuan, Yanyan; Vickridge, Ian; Schmaus, Didier; Briand, Emrick; Steydli, Sebastien; Walter, Philippe; Jonnard, Philippe/titolo:Kossel Effect in Periodic Multilayers/doi:10.1166%2Fjnn.2019.16472/rivista:Journal of nanoscience and nanotechnology (Print)/anno:2019/pagina_da:593/pagina_a:601/intervallo_pagine:593–601/volume:19
Journal of Nanoscience and Nanotechnology
Journal of Nanoscience and Nanotechnology, American Scientific Publishers, 2019, 19 (1), pp.593-601. ⟨10.1166/jnn.2019.16472⟩
International audience; The Kossel effect is the diffraction by a periodically structured medium, of the characteristic X-ray radiation emitted by the atoms of the medium. We show that multilayers designed for X-ray optics applications are convenient
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::bb7674230aa80e374dcf66f8baccde7e
Autor:
Ulrich Waldschläger, Philippe Jonnard, Meiyi Wu, Jonas Baumann, Ioanna Mantouvalou, Veronika Szwedowski-Rammert, Armin Gross, Gesa Goetzke, Evgueni Meltchakov, Franck Delmotte, Birgit Kanngießer, Philipp Hönicke
Publikováno v:
Spectrochimica Acta Part B: Atomic Spectroscopy
Spectrochimica Acta Part B: Atomic Spectroscopy, Elsevier, 2020, 174, pp.105995. ⟨10.1016/j.sab.2020.105995⟩
Spectrochimica Acta Part B: Atomic Spectroscopy, Elsevier, 2020, 174, pp.105995. ⟨10.1016/j.sab.2020.105995⟩
Efficient multilayer optics for radiation in the water window range are difficult to manufacture due to extremely small layer thicknesses and severe intermixing of elements between the layers. Therefore, adequate analytics and short feedback loops ar
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::7c24c2c70e869163334611b8543f0d2f
https://doi.org/10.1016/j.sab.2020.105995
https://doi.org/10.1016/j.sab.2020.105995
Autor:
Jennifer Rebellato, Regina Soufli, Franck Delmotte, Evgueni Meltchakov, Eric M. Gullikson, Sébastien de Rossi
Publikováno v:
Optics Letters
Optics Letters, Optical Society of America-OSA Publishing, 2020, 45 (4), pp.869-872. ⟨10.1364/OL.384734⟩
Optics Letters, Optical Society of America-OSA Publishing, 2020, 45 (4), pp.869-872. ⟨10.1364/OL.384734⟩
In this Letter, we have developed new and highly efficient periodic multilayer mirrors Al/Sc, Al/Sc/SiC, and Mo/Al/Sc with optimized reflectance at wavelengths between 40 and 65 nm. We have reached record values in measured peak reflectance: 57.5% at
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::b1098ac177060d8c50148a4071b7e07d
https://doi.org/10.1364/ol.384734
https://doi.org/10.1364/ol.384734