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Autor:
Jakub Jurczyk, Lex Pillatsch, Luisa Berger, Agnieszka Priebe, Katarzyna Madajska, Czesław Kapusta, Iwona B. Szymańska, Johann Michler, Ivo Utke
Publikováno v:
Nanomaterials, Vol 12, Iss 15, p 2710 (2022)
Recent developments in nanoprinting using focused electron beams have created a need to develop analysis methods for the products of electron-induced fragmentation of different metalorganic compounds. The original approach used here is termed focused
Externí odkaz:
https://doaj.org/article/2edd5a7483524ed6b4d7c02db1ef64b7
Autor:
Utke, Jakub Jurczyk, Lex Pillatsch, Luisa Berger, Agnieszka Priebe, Katarzyna Madajska, Czesław Kapusta, Iwona B. Szymańska, Johann Michler, Ivo
Publikováno v:
Nanomaterials; Volume 12; Issue 15; Pages: 2710
Recent developments in nanoprinting using focused electron beams have created a need to develop analysis methods for the products of electron-induced fragmentation of different metalorganic compounds. The original approach used here is termed focused
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=multidiscipl::b09fa40ea62a3f81bc18f6033494c08c
Autor:
Jurczyk, Jakub, Pillatsch, Lex, Berger, Luisa, Priebe, Agnieszka, Madajska, Katarzyna, Kapusta, Czeslaw, Szymanska, Iwona B., Michler, Johann, Utke, Ivo
This article belongs to the Special Issue Nanomaterials Fabricated by Electron-Beam-Induced Deposition and Related Processes.
Recent developments in nanoprinting using focused electron beams have created a need to develop analysis methods for th
Recent developments in nanoprinting using focused electron beams have created a need to develop analysis methods for th
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::7d4340c976e989dc763d1cb1a2c72549
http://hdl.handle.net/10261/303948
http://hdl.handle.net/10261/303948
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