Zobrazeno 1 - 5
of 5
pro vyhledávání: '"F.P. Centola"'
Publikováno v:
IEEE Transactions on Electromagnetic Compatibility. 46:498-504
Electrostatic discharge (ESD) generators are used for testing the robustness of electronics toward ESD. Most generators are built in accordance with the IEC 61000-4-2 specifications. Using only a few parameters, this standard specifies the peak curre
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::fedd507e683a42c3e766a6393c5e152d
https://doi.org/10.1109/temc.2004.837700
https://doi.org/10.1109/temc.2004.837700
Publikováno v:
2012 International Conference & Exposition on Electrical & Power Engineering; 1/ 1/2012, p585-590, 6p
Autor:
Steven H. Voldman
With the evolution of semiconductor technology and global diversification of the semiconductor business, testing of semiconductor devices to systems for electrostatic discharge (ESD) and electrical overstress (EOS) has increased in importance. ESD Te
Autor:
Steven H. Voldman
Electrostatic discharge (ESD) continues to impact semiconductor components and systems as technologies scale from micro- to nano-electronics. This book studies electrical overstress, ESD, and latchup from a whole-chip ESD design synthesis approach. I