Zobrazeno 1 - 10
of 288
pro vyhledávání: '"F.J Humphreys"'
Publikováno v:
Materialwissenschaft und Werkstofftechnik. 43:794-798
The fine-grained microstructure required for superplasticity in commercial aluminium alloys is developed in one of two ways. In alloys such as AA5083 Al-Mg-Mn and AA7475 Al-Zn-Mg-Cr, static recrystallisation produces an equiaxed microstructure prior
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::7165398a6383d021df16b49f710caf81
https://doi.org/10.1002/mawe.201200044
https://doi.org/10.1002/mawe.201200044
Autor:
Y. Huang, F.J. Humphreys
Publikováno v:
Materials Chemistry and Physics. 132:166-174
The effect of solutes (Si, Mn, Mg) in quantities typical of commercial aluminium alloys, on grain boundary mobility in aluminium, has been investigated with in situ annealing and electron backscattered diffraction in the SEM, and grain growth experim
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::01e99827952b88318b08b614786e6d18
https://doi.org/10.1016/j.matchemphys.2011.11.018
https://doi.org/10.1016/j.matchemphys.2011.11.018
Publikováno v:
Acta Materialia. 57:4539-4547
Significant abnormal grain growth has been observed in an Al–3.5 wt.% Cu alloy at temperatures where the volume fraction of small CuAl 2 particles was less than about 0.01. The initial fine-grained material had a weak crystallographic texture and t
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c5bebd0d55fe30bbca34a1114274ae2a
https://doi.org/10.1016/j.actamat.2009.06.018
https://doi.org/10.1016/j.actamat.2009.06.018
Publikováno v:
Scripta Materialia. 60:862-865
A focused ion beam coupled with electron backscatter diffraction was used to reconstruct high-resolution three-dimensional features at silica particles in a cold-rolled and annealed nickel crystal. It was found that cold rolling to a true strain of
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f25b439fda8f42ac6a751f7aead0379f
https://doi.org/10.1016/j.scriptamat.2009.01.034
https://doi.org/10.1016/j.scriptamat.2009.01.034
Publikováno v:
Journal of Microscopy. 233:432-441
The effect of hot deformation on fully recrystallized aluminium-copper alloys (Al-4wt%Cu and Al-33wt%Cu) with different volume fractions of CuAl(2) has been studied. The alloys are Zener pinned systems with different superplastic properties. Strain-i
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::344f35ca2787f7c4a5091b29c363a9cd
https://doi.org/10.1111/j.1365-2818.2009.03131.x
https://doi.org/10.1111/j.1365-2818.2009.03131.x
Publikováno v:
Journal of Microscopy. 230:464-471
In situ electron backscatter diffraction microstructural analysis of recrystallizing interstitial free steels deformed to strains of 0.75 and 1.6 has been carried out in a FEG-SEM. The experimental procedures are discussed, and it is shown that there
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::d617469c766ec145b1209f09cdaa1a8a
https://doi.org/10.1111/j.1365-2818.2008.02006.x
https://doi.org/10.1111/j.1365-2818.2008.02006.x
Publikováno v:
Materials Characterization. 58:961-967
This work describes some techniques developed for focused ion beam (FIB) serial sectioning and electron backscatter diffraction (EBSD) mapping of partially and fully recrystallized metals. A DualBeam™ platform was used to sequentially mill submicro
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::bffb2673bf10d00b5ea997697f51945f
https://doi.org/10.1016/j.matchar.2006.10.001
https://doi.org/10.1016/j.matchar.2006.10.001
Autor:
P.S. Bate, F.J. Humphreys
Publikováno v:
Acta Materialia. 55:5630-5645
The microstructures of Al–0.1Mg polycrystals deformed in plane strain compression at temperatures of 20–400 °C have been investigated by electron backscatter diffraction. At all temperatures, the microstructures are characterized by two types of
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::284ed1d590d2ad51422fed8879f89527
https://doi.org/10.1016/j.actamat.2007.06.032
https://doi.org/10.1016/j.actamat.2007.06.032
Publikováno v:
Acta Materialia. 55:5157-5167
By combining a focused ion beam (FIB) microscope with a field emission gun scanning electron microscope, it is possible to sequentially mill away ∼50 nm sections of a material by FIB and characterize, at high resolution, the crystallographic featur
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a2f38582044d40e9b69a0873aba09cbb
https://doi.org/10.1016/j.actamat.2007.05.045
https://doi.org/10.1016/j.actamat.2007.05.045
Publikováno v:
Materials Science and Technology. 22:1279-1286
The factors which determine the angular resolution in electron backscatter diffraction (EBSD), and the operating conditions which optimise it are considered. On suitable samples the angular resolution may be substantially improved by data averaging u
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::92a2bf5286dff2a1f63d0f8a34dcb34e
https://doi.org/10.1179/174328406x130902
https://doi.org/10.1179/174328406x130902