Lumped Resonator and Kron-Branin Hybrid Model of Apertured Enclosure Shieldind Effectiveness

Autor: I. Garcia, T. Soeun, F. De Daran, B. Ravelo

Publikováno v: 2019 ESA Workshop on Aerospace EMC (Aerospace EMC)
2019 ESA Workshop on Aerospace EMC (Aerospace EMC), May 2019, Budapest, Hungary. pp.1-6, ⟨10.23919/AeroEMC.2019.8788954⟩

International audience; This paper describes a new hybrid unfamiliar model of apertured enclosure with lumped resonator networks and Kron-Branin (KB) method. It acts as a radiated EMC model of rectangular cavities regularly used in aeronautics and sp

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::9f5f78bda018e0112ba97ebd154d9699
https://hal.archives-ouvertes.fr/hal-02612806

Modeling Magnetic Radiations of Electronic Circuits Using Near-Field Scanning Method

Autor: C. Arcambal, P. Eudeline, Yolanda Vives-Gilabert, B. Mazari, Anne Louis, F. de Daran

Publikováno v: IEEE Transactions on Electromagnetic Compatibility. 49:391-400

In this paper, a simple method to obtain the equivalent radiation emitting sources of an electronic circuit using the near-field scanning method is presented. The model is based on a set of elemental dipoles that substitutes the electronic circuit an

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::eaf9520a852a1246f91ed5d76e94f54d
https://doi.org/10.1109/temc.2006.890168

Modeling of electromagnetic waves scattered by a system of spherical particles

Autor: J.P. Parneix, F. de Daran, V. Vigneras-Lefebvre

Publikováno v: IEEE Transactions on Magnetics. 31:1598-1601

This paper presents an analytic method allowing us to take into account the multiple scattering effect in heterogeneous media made with spherical inclusions dispersed in a dielectric matrix. The Mie formalism used in the case of a single sphere, is e

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::c7ad7845d6a6bf8f3d4ec1722149639e
https://doi.org/10.1109/20.376338

Prediction of the field radiated at one meter from PCB's and microprocessors from near EM field cartography

Autor: J. Chollet-Ricard, Olivier Maurice, F. de Daran, Frederic Lafon

Publikováno v: 2003 IEEE International Symposium on Electromagnetic Compatibility, 2003. EMC '03..

The paper shows a near field scanning method to characterize chips that leads to the prediction of the coupling phenomena on the electronic board and to the evaluation of the radiated emission at one meter. A theoretical model is first given for simp

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::b94ccf5fb8cc59113410088d9f4518cb
https://doi.org/10.1109/icsmc2.2003.1428296

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