Zobrazeno 1 - 10
of 52
pro vyhledávání: '"F. T. Hartley"'
Publikováno v:
Microsystem Technologies
Microsystem Technologies, Springer Verlag, 2003, 9, pp.409-412
Microsystem Technologies, Springer Verlag, 2003, 9, pp.409-412
The capacity of chemically-assisted focused ion beam (FIB) etching systems to undertake direct and highly anisotropic erosion of thin and thick gold (or other high atomic number {Z}) coatings on X-ray mask membranes/substrates provides new levels of
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::54c626dbd77d05b3348ce95353b645e1
https://doi.org/10.1007/s00542-002-0215-5
https://doi.org/10.1007/s00542-002-0215-5
Autor:
Crasta, Rita, Devadiga, Sushma, Savant, Nikhita Narendra, Naik, Vibha Vinayak, Suresh, Suresha, Dawalekar, Kamalakar Vaijinathrao
Publikováno v:
Radiation Protection Dosimetry; Dec2023, Vol. 199 Issue 20, p2475-2480, 6p
Autor:
Ziaian, Tahereh, Puvimanasinghe, Teresa, Miller, Emily, De Anstiss, Helena, Esterman, Adrian, Dollard, Maureen
Publikováno v:
Australian Psychologist; Apr2021, Vol. 56 Issue 2, p123-136, 14p, 1 Diagram, 1 Chart
Publikováno v:
Nation; 2/6/1954, Vol. 178 Issue 6, p106-109, 4p
Publikováno v:
Energy & Mechanical Engineering - Proceedings of 2015 International Conference; 2016, p840-847, 8p
Publikováno v:
Nation; 2/6/1954, Vol. 178 Issue 6, p104-106, 3p