Zobrazeno 1 - 8
of 8
pro vyhledávání: '"F. P. Dabkowski"'
Publikováno v:
Microelectronic Engineering. :539-543
Confinement of electrons and holes is assumed to take place within the quantum well of a laser diode for all modes of operation of the diode. Photons are expected to be confined within the Fabry–Perot cavity with little spreading out of the resonat
Publikováno v:
Journal of Applied Physics. 67:1347-1351
Zinc was diffused into GaAs, Al0.38Ga0.62As, and GaAs0.6P0.4 using a 2000–3000‐A‐thick yttria‐stabilized cubic‐zirconia (YSZ) protection layer to produce planar p‐n junctions. The YSZ layer greatly reduced thermal decomposition of the sem
Publikováno v:
Journal of Applied Physics. 80:6547-6549
The output facet temperature of high‐power AlGaAs/GaAs single quantum well (SQW) laser diodes was measured during operation. The front output facets were passivated with Al2O3 coatings. The spectral shift of photoluminescence from the cladding laye
Publikováno v:
Applied Physics Letters. 64:13-15
Measurements of the temperature distribution along the cavity of 0.5 W AlGaAs quantum well lasers are presented. The spatial distribution of temperature was determined by measuring the spectral shift of electroluminescence emitted through a window in
Autor:
M. Milshtein, C. H. Kang, Harry C. Gatos, F. P. Dabkowski, Marek Skowronski, A. M. Hennel, Jacek Lagowski
Publikováno v:
Journal of Applied Physics. 62:3791-3798
A systematic study of plastically deformed (in compression) GaAs was carried out employing deep‐level spectroscopies, optical absorption, and electronic transport measurements. Deformation‐induced changes in the free‐carrier concentration, the
Publikováno v:
Journal of Crystal Growth. 72:595-598
A novel partially confined configuration is proposed for the crystal growth of semiconductors from the melt, including those with volatile constituents. A triangular prism is employed to contain the growth melt. Due to surface tension, the melt will
Publikováno v:
Applied Physics Letters. 47:607-609
We present the first positive identification of a vanadium‐related electron trap in V‐doped GaAs crystals grown by the liquid encapsulated Czochralski technique in pyrolytic boron nitride crucibles. Detailed deep level transient spectroscopy and
Publikováno v:
Applied Physics Letters. 53:1729-1731
Diffusion of zinc into GaAs through an yttria‐stabilized cubic zirconia (YSZ) passivation layer has been demonstrated with an open‐tube diffusion method. Pure zinc or GaAs/Zn2As3 sources produced high quality planar p‐n junctions. The YSZ layer