Zobrazeno 1 - 10
of 29
pro vyhledávání: '"F. Malengreau"'
Publikováno v:
Scopus-Elsevier
Physical Review B, 59(8), 5832-5836. AMER PHYSICAL SOC
Physical Review B, 59(8), 5832-5836. AMER PHYSICAL SOC
We report evidence for surface plasmon excitations in concentric-shell fullerenes. A film of these concentric-shell fullerenes with radii around 5–7 nm was produced by carbon bombardment of a silver polycrystalline target and measured by electron-e
Autor:
Robert Sporken, S. Sivananthan, Jacques Ghijsen, T. van Gemmeren, Jean-Pierre Faurie, Roland Caudano, F. Malengreau, Robert L. Johnson
Publikováno v:
Scopus-Elsevier
University of Namur
University of Namur
Growth of CdTe(111)B on Si(100) by molecular beam epitaxy (MBE) was studied with photoelectron spectroscopy using synchrotron radiation. First, a monolayer of Te forms on top of the Si(100) substrate. We suggest that these Te atoms replace the Si dim
Publikováno v:
University of Namur
The growth of large-size single crystals of aluminium nitride has been obtained by UHV reactive rf-sputtering at high temperature (1050 °C). The growth mode was studied in situ by electron spectroscopy (HREELS, LEED) and by ex-situ High Resolution T
Publikováno v:
University of Namur
We present the epitaxial growth by rf reactive sputtering of aluminum nitride on Si(111) at high temperature. The grain size of the obtained films was sufficient to obtain a good low energy electron diffraction (LEED) pattern from which we determined
Publikováno v:
University of Namur
The growth by RF reactive sputtering of aluminium nitride (AlN) at the surface of oxidised iron was studied by X-ray photoelectron spectroscopy (XPS). The observation of the substrate lines showed that the top layer of the iron oxide, constituted of
Publikováno v:
Surface and Interface Analysis. 22:193-196
We have studied by Auger electron spectroscopy (AES) and electron energy loss spectroscopy (EELS) the room temperature growth of aluminium nitride (AlN) at the surface of clean and oxidized polycrystalline iron. The films were deposited by reactive r
Publikováno v:
Surface Science. 310:347-358
The growth of aluminium nitride (AlN) thin films on clean and oxidised polycrystalline iron was studied by Auger electron spectroscopy. The films of AlN were deposited by reactive RF sputtering (argon + nitrogen atmosphere). On clean iron, a modelisa
Publikováno v:
Ceramic Microstructures ISBN: 9781461374626
In the last 10 years, the III-nitride semiconductors (A1N, GaN, InN and ternary compounds) have revealed promising physical and optical properties. Potential applications include blue light emitting diodes and ultraviolet (UV) detectors, as well as h
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b4e488a66e51cae448a0850ac592fafd
https://doi.org/10.1007/978-1-4615-5393-9_16
https://doi.org/10.1007/978-1-4615-5393-9_16
Autor:
B. Canava, Jacques Vedel, Daniel Lincot, Jean-François Guillemoles, F. Malengreau, H. Ardelean
Publikováno v:
Scopus-Elsevier
The control of the barrier height at the Cu(In,Ga)Se2(CIGS)/CdS interface, via the chemical state of the CIGS surface, is a key to improve solar cell performances. In this paper chemical modifications have been achieved by the electrochemical method,
Autor:
E. Calleja, Roland Caudano, F. J. Sánchez, F. Malengreau, Bernard Beaumont, Robert Sporken, E. Muñoz, Christophe Silien, K. Grigorov, Pierre Gibart
Publikováno v:
University of Namur
Scopus-Elsevier
Scopus-Elsevier
Au/GaN and Pt/GaN contacts have been studied with XPS. According to XPS depth profiling, the N signal is weak in the region below the metal contact and the Pt or Au signal decreases much more slowly than expected for a sharp interface. Next, we have