Zobrazeno 1 - 2
of 2
pro vyhledávání: '"F. M. Akhmedova"'
Publikováno v:
Optics and Spectroscopy. 126:458-462
GaS thin films have been grown by the SILAR method, their structures have been analyzed, and their optical and photoelectric properties have been investigated. The internal structure of the samples obtained have been studied using X-ray diffraction (
Autor:
R. M. Mamedov, A. G. Kyazym-zade, V. M. Salmanov, A. A. Salmanova, A. G. Guseinov, F. M. Akhmedova, Z. A. Agamaliev
Publikováno v:
Technical Physics. 64:555-558
Conductivity inversion in thin n-InSe films under intense pulsed laser irradiation was obser. A p–n structure based on indium selenide formed between irradiated and nonirradiated regions of a thin-film sample. It was confirmed by EDAX analysis that