Zobrazeno 1 - 8
of 8
pro vyhledávání: '"F. J. Rubio-Sierra"'
Publikováno v:
IEEE Transactions On Nanotechnology. 5:692-700
Current approaches to study the system response of the different modes of dynamic atomic force microscopy (AFM) use model simplification such as single mode approximations or are based on the nontrivial solution of the equation of motion. As an alter
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e7fa2193de531241f3ebdf25f34a7bf6
https://doi.org/10.1109/tnano.2006.883479
https://doi.org/10.1109/tnano.2006.883479
Publikováno v:
physica status solidi (a). 203:1481-1486
Nanomachining of thin polymer resist films with an atomic force microscope (AFM) is a promising route for the fabrication of nanoscale devices. In order to enhance the controllability of the nanomachining process an in-plane acoustic wave is coupled
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::9567dcfe852870a629bea5f4bb5f947d
https://doi.org/10.1002/pssa.200566152
https://doi.org/10.1002/pssa.200566152
Publikováno v:
Advanced Engineering Materials. 7:193-196
The linking of our macroscopic world to the nanoscopic world of single molecules, nanoparticles and functional nanostructures is a technological challenge. Researchers in nanobiotechnology face the questions “How extract and analyze a single nano-o
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c488b48453469df94ad4bb8dba89f7f6
https://doi.org/10.1002/adem.200400174
https://doi.org/10.1002/adem.200400174
Publikováno v:
Applied Physics A: Materials Science & Processing. 76:903-906
In order to manipulate materials at the nanometer scale, new methods and devices have to be developed. A nanomanipulator interface was designed and implemented in a commercial atomic-force-microscope (AFM) system. With the aid of a positioning joysti
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f1225f9b875cf2869b1f243b821d72a3
https://doi.org/10.1007/s00339-002-1973-8
https://doi.org/10.1007/s00339-002-1973-8
Publikováno v:
ACC
Scopus-Elsevier
ResearcherID
Scopus-Elsevier
ResearcherID
Current methods to study atomic force microscope (AFM) cantilever dynamics use model simplification, or are based on the non-trivial solutions of the equation of motion. As an alternative method, transfer function analysis gives a complete descriptio
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::4cb50242454bee4f7b9f46dbb7c41b32
https://doi.org/10.1109/acc.2006.1655411
https://doi.org/10.1109/acc.2006.1655411
Publikováno v:
Design Engineering, Parts A and B.
Current methods to study atomic force microscope (AFM) cantilever dynamics use model simplification or are based on the non-trivial solution of the equation of motion. As an alternative method, transfer function analysis gives a more complete descrip
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::480bbd52439c5f5eb6dcc3cb39c6eba6
https://doi.org/10.1115/imece2005-81156
https://doi.org/10.1115/imece2005-81156
Publikováno v:
Scopus-Elsevier
An atomic force microscope (AFM) based system has been built for the manipulation of materials at the nanometer scale. The AFM is combined with an inverse optical microscope and an UV-laser microbeam system for photoablation. The actuators of the AFM
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::75a894c4c0d9f1510a679f055d734ab2
http://www.scopus.com/inward/record.url?eid=2-s2.0-20344363191&partnerID=MN8TOARS
http://www.scopus.com/inward/record.url?eid=2-s2.0-20344363191&partnerID=MN8TOARS
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