Zobrazeno 1 - 7
of 7
pro vyhledávání: '"F. J. Fraikor"'
Autor:
F. J. Fraikor, J. P. Hirth
Publikováno v:
Journal of Applied Physics. 38:2312-2318
The equilibrium vacancy concentration of gold single crystals and polycrystalline wires was determined by a dilatometric technique and was found to agree well with the results of Simmons and Balluffi. Similar measurements on gold‐silver alloys and
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::17804bc8751c796d7134443590af603a
https://doi.org/10.1063/1.1709876
https://doi.org/10.1063/1.1709876
Autor:
P. K. Govind, F. J. Fraikor
Publikováno v:
Journal of Applied Physics. 42:2476-2481
Electron microscopy has been used to study the ion‐fluence dependence of structural disorder in CdS single‐crystal platelets following 25‐keV bismuth implantations at room temperature in the dose range of 7×1015−3.2×1016 ions/cm2. Bright‐
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::aec94f703974129115ea2eae5e7c97b5
https://doi.org/10.1063/1.1660565
https://doi.org/10.1063/1.1660565
Publikováno v:
Journal of scientific instruments. 1(3)
A foot-operated electric drive has been developed for the tilt mechanism of the standard rotating-tilting stage of a Phillips EM-200 electron microscope. The device facilitates the ease of maintaining specimen focus while continuously tilting the spe
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::ac6fa7990309e5cdf99c07132283469b
https://pubmed.ncbi.nlm.nih.gov/5649286
https://pubmed.ncbi.nlm.nih.gov/5649286
Autor:
F. J. Fraikor, A. W. Brewer
Publikováno v:
Proceedings, annual meeting, Electron Microscopy Society of America. 26:426-427
A number of investigators have examined moire patterns on precipitate particles in various age-hardening alloys. For example, Phillips has analyzed moire fringes at cobalt precipitates in copper and Von Heimendahl has reported on moire fringes in the
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d010859e7de6c390fb039d6727d437a6
https://doi.org/10.1017/s0424820100101888
https://doi.org/10.1017/s0424820100101888
Autor:
P. K. Govind, F. J. Fraikor
Publikováno v:
Journal of Applied Physics. 43:2448-2449
An electron beam microprobe was utilized to study the depth distribution of ion‐implanted bismuth in CdS. The results, shown as a plot of relative Bi concentration vs depth, indicate that the bismuth concentration profile is of the type exp(−x/λ
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::53eb38f4ae5c81906fbb098c6e39e5c2
https://doi.org/10.1063/1.1661522
https://doi.org/10.1063/1.1661522