Zobrazeno 1 - 10
of 634
pro vyhledávání: '"F. Heidel"'
Autor:
F. Palandri, D. Bartoletti, E. M. Elli, G. Auteri, M. Bonifacio, G. Benevolo, F. Heidel, M. M. Trawinska, E. Rossi, C. Bosi, A. Tieghi, M. Tiribelli, A. Iurlo, N. Polverelli, G. Caocci, G. Binotto, F. Cavazzini, E. Beggiato, D. Cilloni, C. Tatarelli, F. Mendicino, M. Miglino, M. Bocchia, M. Crugnola, C. Mazzoni, A. D. Romagnoli, G. Rindone, S. Ceglie, A. D’Addio, E. Santoni, D. Cattaneo, R. M. Lemoli, M. Krampera, A. Cuneo, G. Semenzato, R. Latagliata, E. Abruzzese, N. Vianelli, M. Cavo, A. Andriani, V. De Stefano, G. Palumbo, M. Breccia
Publikováno v:
HemaSphere, Vol 6, Pp 901-902 (2022)
Externí odkaz:
https://doaj.org/article/852b3ffa94774bec8b4a1ece9b4cf527
Autor:
F. Stegelmann, E. Jahn, S. Koschmieder, F. Heidel, A. Hochhaus, H. Hebart, S. Isfort, A. Reiter, M. Bangerter, C. F. Waller, D. Wolleschak, C. Scheid, J. Göthert, P. Schafhausen, T. Kindler, M. P. Radsak, N. Gattermann, R. Möhle, N. von Bubnoff, A. Schrade, T. Brümmendorf, H. Döhner, M. Griesshammer, K. Döhner
Publikováno v:
HemaSphere, Vol 6, Pp 945-946 (2022)
Externí odkaz:
https://doaj.org/article/36481d0c91b7468488d62cf34ee8cfb0
Publikováno v:
GTH Congress 2023 – 67th Annual Meeting of the Society of Thrombosis and Haemostasis Research – The patient as a benchmark.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::7cb3fd9d6a7831bba457c0da10277b30
https://doi.org/10.1055/s-0042-1760611
https://doi.org/10.1055/s-0042-1760611
Autor:
A. Hochhaus, F. Heidel
Publikováno v:
Leukemia
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::fc928fc303d296a4613985556302ecb1
http://europepmc.org/articles/PMC7288260
http://europepmc.org/articles/PMC7288260
Publikováno v:
best practice onkologie. 7:34-44
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2b3170218b554ed091cdb8e35e7913db
https://doi.org/10.1007/s11654-012-0411-4
https://doi.org/10.1007/s11654-012-0411-4
Autor:
Robert A. Reed, Ewart W. Blackmore, James R. Schwank, Richard Wong, Paul E. Dodd, Marty R. Shaneyfelt, Kenneth A. LaBel, Scot E. Swanson, David F. Heidel, Kenneth P. Rodbell, Shi-Jie Wen, Paul W. Marshall, P. M. Gouker, Jonathan A. Pellish, Veronique Ferlet-Cavrois, Nelson Tam, Scott M. Dalton
Publikováno v:
IEEE Transactions on Nuclear Science. 59:1197-1202
The potential for using the degraded beam of high-energy proton radiation sources for proton hardness assurance testing for ICs that are sensitive to proton direct ionization effects are explored. SRAMs were irradiated using high energy proton radiat
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ced0a99c77bdedc3cbed1b55a2efd0c8
https://doi.org/10.1109/tns.2011.2177862
https://doi.org/10.1109/tns.2011.2177862
Autor:
Melanie D. Berg, H.H.K. Tang, Christina Seidleck, David F. Heidel, Anthony M. Phan, M.S. Gordon, Hak Kim, Kevin Stawiasz, Kenneth P. Rodbell, Conal E. Murray, Paul W. Marshall, Jonathan A. Pellish, M. Friendlich, J.R. Schwank, Ken LaBel
Publikováno v:
IEEE Transactions on Nuclear Science. 58:2702-2710
Single event upset (SEU) experimental heavy ion data and modeling results for CMOS, silicon-on-insulator (SOI), 32 nm and 45 nm stacked and DICE latches are presented. Novel data analysis is shown to be important for hardness assurance where Monte Ca
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::aa92468a4324c1a3f29ec933807dbe15
https://doi.org/10.1109/tns.2011.2171715
https://doi.org/10.1109/tns.2011.2171715
Autor:
David F. Heidel, Robert Baumann, Christina Seidleck, Kenneth P. Rodbell, M. Friendlich, James R. Schwank, Brian D. Sierawski, Kenneth A. LaBel, Anthony M. Phan, Robert A. Reed, Hak Kim, Michael A. Xapsos, Michael J. Campola, Paul E. Dodd, C. Perez, Andrew Marshall, Melanie D. Berg, Jeffrey D. Black, Paul W. Marshall, Mark C. Hakey, Ronald D. Schrimpf, Jonathan A. Pellish, Xiaowei Deng, Marty R. Shaneyfelt
Publikováno v:
IEEE Transactions on Nuclear Science. 57:2948-2954
A 1 GeV/amu 56Fe ion beam allows for true 90° tilt irradiations of various microelectronic components and reveals relevant upset trends at the GCR flux energy peak. Three SRAMs and an SRAM-based FPGA evaluated at the NASA Space Radiation Effects Lab
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::02ef9f0b889dbab69d6d8a9c5ff552c7
https://doi.org/10.1109/tns.2010.2066575
https://doi.org/10.1109/tns.2010.2066575
Publikováno v:
IEEE Transactions on Nuclear Science. 56:3145-3151
This paper describes upsets of 65 nm flip-flops caused by Single-Event-Transients in clock-tree circuits. The upset rate is predicted through modeling, and compared to upset rates measured on a 65 nm test chip with 15 MeV carbon ions and 148 MeV prot
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::fdf024aaaf6875a906cb2347c6412520
https://doi.org/10.1109/tns.2009.2033997
https://doi.org/10.1109/tns.2009.2033997
Publikováno v:
IEEE Transactions on Nuclear Science. 56:3093-3097
Novel techniques have been applied to model realistic alpha particle source distributions in complex back-end-of-the-line geometries. Rigorous Monte Carlo simulations with high resolution have been performed to analyze the charge collection in 45 nm
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ac00928dc1efbf5fb2ab4233ab33d73f
https://doi.org/10.1109/tns.2009.2033923
https://doi.org/10.1109/tns.2009.2033923