Zobrazeno 1 - 10
of 62
pro vyhledávání: '"F. Flourens"'
Autor:
Frederic Therond, Didier De-Mata, Eric Lacam, F. Tristant, Alain Sauvage, Marc Poncon, Marc Meyer, F. Flourens
Publikováno v:
2019 International Symposium on Electromagnetic Compatibility - EMC EUROPE.
This paper presents the results of a test campaign conducted on five aeronautical equipment up to 40GHz. The sensitivity of such recent equipment to radiated fields was assessed experimentally. The test conditions were engineered to produce equipment
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::61296c388a868ccba53e0c688c567b95
https://doi.org/10.1109/emceurope.2019.8872085
https://doi.org/10.1109/emceurope.2019.8872085
Publikováno v:
International Conference on Lightning [amp ] Static Electricity (ICOLSE 2015).
A raceway as a means for electromagnetic hazard protection eases the wire bundle installation and bundle maintenance significantly compared to an over-shielded bundle solution; also the raceway provides multiple electric functions, such as fault curr
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1e7e9f1d0aa3bc78272a9903622b48d8
https://doi.org/10.1049/ic.2015.0182
https://doi.org/10.1049/ic.2015.0182
Publikováno v:
International Conference on Lightning [amp ] Static Electricity (ICOLSE 2015).
A study of charge generation and charge relaxation, due to static electrification, is proposed when a liquid, charged in an upstream circuit, is injected into a composite tank. Firstly, the relationship between the generated charge density qg in the
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::48a0d634334b8ea26efb79fdade86dbd
https://doi.org/10.1049/ic.2015.0162
https://doi.org/10.1049/ic.2015.0162
Publikováno v:
International Conference on Lightning [amp ] Static Electricity (ICOLSE 2015).
In the frame of the certification, the final verification of the Lightning Indirect Effects (LIE) protection of the systems has been made thanks to a measurement test campaign on a representative development Aircraft. For this purpose, transfer funct
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a42b90af10d66cb852d910d87e8612c7
https://doi.org/10.1049/ic.2015.0177
https://doi.org/10.1049/ic.2015.0177
Autor:
L. Bary, F. Flourens, S. Melle, David Dubuc, Olivier Vendier, M. Saddaoui, Alexandru Takacs, L. Rabbia, Robert Plana, J.L. Roux, Patrick Pons, A. Boukabache, Hervé Aubert, Katia Grenier, B. Ducarouge
Publikováno v:
Microelectronics Reliability. 44:899-907
This paper presents a fully suspended MEMS based technology to assess the smart microsystem concept. The demonstrator is a redundancy ring for millimeterwave space communication. Reliability investigations are presented showing that the membrane is w
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::98a336de575308bef4d38ddae0b4a686
https://doi.org/10.1016/j.microrel.2004.02.008
https://doi.org/10.1016/j.microrel.2004.02.008
Autor:
Katia Grenier, L Dantas, J. Kuchenbecker, David Dubuc, F. Flourens, Robert Plana, X Chauffleur, Patrick Pons, L. Rabbia, A. Boukabache
Publikováno v:
Sensors and Actuators A: Physical. 112:148-154
We present in this paper results on mechanical behavior of RF switches. The simulations show that the mechanical behavior of the switch is very sensitive to its shape (flat or wavy). The wavy parts of the bridge allow a better relaxation of gold laye
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::806d5a905d1d12e4f642a472d868b6a5
https://doi.org/10.1016/j.sna.2003.11.033
https://doi.org/10.1016/j.sna.2003.11.033
Publikováno v:
2013 IEEE 26th International Conference on Micro Electro Mechanical Systems (MEMS).
In this paper we report an improvement by an order of magnitude of the detection limit of micro gas chromatography systems through the use of m-sequence stochastic injection patterns. Using a sequence length of 127 and using a concentration level of
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a1a3b9af6da452345ab5bb05377cd510
https://doi.org/10.1109/memsys.2013.6474415
https://doi.org/10.1109/memsys.2013.6474415
Autor:
Dan Vasilache, C. Tibeica, K. Yacine, L. Galateanu, V. Ilian, M. Bazu, R. Voicu, F. Flourens, Patrick Pons
Publikováno v:
CAS 2005 Proceedings. 2005 International Semiconductor Conference, 2005..
Analytical and computational approaches for modeling the electrostatically actuated micro-bridges were compared using the pull-in voltage as behavioral parameter. Sets of FEM-based simulations were performed in order to find out the optimum model app
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b13356b6e0c281a45b6257cded644af1
https://doi.org/10.1109/smicnd.2005.1558741
https://doi.org/10.1109/smicnd.2005.1558741
Autor:
K. Yacine, F. Flourens, Robert Plana, Patrick Pons, David Dubuc, S. Melle, A. Boukabache, David Peyrou, Katia Grenier
Publikováno v:
Digest of Papers. 2004 Topical Meeting onSilicon Monolithic Integrated Circuits in RF Systems, 2004..
This paper reports on the reliability investigation on a suspended redundancy ring for millimeter wave applications. Mechanical characterization has shown no major failure when an original method is presented to investigate the charging effect in a c
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0619bbc19e28b09a60acf95511b24408
https://doi.org/10.1109/smic.2004.1398193
https://doi.org/10.1109/smic.2004.1398193
Autor:
Xavier Lafontan, Patrick Pons, Ludovic Salvagnac, Lionel Buchaillot, Q.H. Duong, David Bourrier, P. Calmont, D. Peyrou, Robert Plana, F. Flourens, K. Yacine
Publikováno v:
Microelectronics Reliability
Microelectronics Reliability, 2005, 45, pp.1776-1781. ⟨10.1016/j.microrel.2005.07.093⟩
Microelectronics Reliability, Elsevier, 2005, 45, pp.1776-1781. ⟨10.1016/j.microrel.2005.07.093⟩
Microelectronics Reliability, 2005, 45, pp.1776-1781. ⟨10.1016/j.microrel.2005.07.093⟩
Microelectronics Reliability, Elsevier, 2005, 45, pp.1776-1781. ⟨10.1016/j.microrel.2005.07.093⟩
An analysis as been conducted to determine the biaxial initial stress state of gold bilayer switches. Results are shown that the sensitivity of the sacrificial photoresist layer to process parameters make the wafer curvature technique unreliable to d
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::6314bfb4d2aee700801af1b5c61fb2d4
https://hal.science/hal-00128652
https://hal.science/hal-00128652
