Zobrazeno 1 - 10
of 63
pro vyhledávání: '"F. Eggenstein"'
There are a large number of soft X-ray grating monochromators for high-resolution synchrotron radiation experiments in operation worldwide. At BESSY II eighteen of the monochromators currently in use are equipped with Heidenhain UHV RON905 angle enco
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::38e273695025cf0a2aeb89de93ec2451
http://www.helmholtz-berlin.de/pubbin/oai_publication?VT=1&ID=105202
http://www.helmholtz-berlin.de/pubbin/oai_publication?VT=1&ID=105202
Autor:
Frederik Bijkerk, Z. S. Wang, Jacobus Marinus Sturm, Ch. Waberski, Thomas Zeschke, I. Rudolph, Grzegorz Gwalt, Robbert Wilhelmus Elisabeth van de Kruijs, Alexei Erko, Frank Siewert, O. Kutz, J. Wolf, Eric Louis, I. Packe, Andrey Sokolov, Franz Schäfers, Stephanie Lemke, F. Senf, M. Mertin, F. Eggenstein, Qiushi Huang
Publikováno v:
Optics express, 24(12), 13220-13230. The Optical Society
For photon energies of 1 – 5 keV, blazed gratings with multilayer coating are ideally suited for the suppression of stray and higher orders light in grating monochromators. We developed and characterized a blazed 2000 lines/mm grating coated with a
Autor:
Ch. Waberski, Thomas Zeschke, St. Lemke, Grzegorz Gwalt, I. Zizak, F. Frost, Tino Seliger, Rolf Follath, F. Senf, O. Kutz, I. Rudolph, B. Nelles, F. Eggenstein, Andrey Sokolov, Alexei Erko, Frank Siewert, Bernd Löchel, Thomas Arnold, J. Wolf, Franz Schäfers, Alexander Firsov, F. Pietag, Jana Buchheim
Publikováno v:
Journal of Synchrotron Radiation
Establishing a facility for the production of gratings for synchrotron and free-electron laser applications is reported.
Blazed gratings are of dedicated interest for the monochromatization of synchrotron radiation when a high photon flux is req
Blazed gratings are of dedicated interest for the monochromatization of synchrotron radiation when a high photon flux is req
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::bda1e202bafd926fd9aae3ebbee6022f
http://www.helmholtz-berlin.de/pubbin/oai_publication?VT=1&ID=98021
http://www.helmholtz-berlin.de/pubbin/oai_publication?VT=1&ID=98021
Publikováno v:
Journal of Synchrotron Radiation
The utilization of elliptical dipole radiation in a collimated plane-grating monochromator at BESSY II is described.
A new but yet well proven way of making elliptically polarized dipole radiation from the BESSY II storage ring applicable to the
A new but yet well proven way of making elliptically polarized dipole radiation from the BESSY II storage ring applicable to the
Autor:
Andrei Varykhalov, F. Eggenstein, M. Krivenkov, Franz Schäfers, M.G. Sertsu, Thomas Zeschke, Andrey Sokolov, I. Rudolph, J. Wolf
Publikováno v:
Advances in Metrology for X-Ray and EUV Optics VII.
The contamination of optical elements (mirrors and gratings) with carbon still is an issue when using soft x-ray synchrotron radiation. With an in-house developed HF-plasma treatment we are able to decontaminate our optics in-situ from carbon very ef
Autor:
F. Senf, Rolf Follath, Alexei Erko, Bernd Löchel, Franz Schäfers, Andreas Gaupp, F. Eggenstein, Thomas Zeschke
Publikováno v:
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment. 710:166-171
The design for an UHV-reflectometer for XUV-radiation is presented, which is dedicated to at-wavelength characterisation on high precision gratings. At-Wavelength Metrology is a powerful and necessary characterisation tool for the development and cha
Autor:
Andrey Sokolov, Th. Zeschke, F. Senf, S. Künstner, Franz Schäfers, Frank Siewert, A. Gaupp, Alexei Erko, P. Bischoff, J.-S. Schmidt, M. Mast, F. Eggenstein
Publikováno v:
The Review of scientific instruments. 87(5)
A new Optics Beamline coupled to a versatile UHV reflectometer is successfully operating at BESSY-II. It is used to carry out at-wavelength characterization and calibration of in-house produced gratings and novel nano-optical devices as well as mirro
Autor:
F. Senf, Th. Zeschke, P. Bischoff, F. Eggenstein, Franz Schäfers, Andrey Sokolov, T. Schroeter, Alexei Erko
Publikováno v:
AIP Conference Proceedings.
At BESSY-II a new UV-and XUV optics beamline [1] has recently been setup with an in-house developed versatile reflectometer [2], [3], [4] for at-wavelength metrology on reflective and diffractive optical elements up to 4 kg mass. High precision measu
Autor:
S. Künstner, Th. Zeschke, F. Senf, P. Bischoff, F. Eggenstein, M. Mast, J.-S. Schmidt, A. Gaupp, Andrey Sokolov, Franz Schäfers, Alexei Erko, Frank Siewert
Publikováno v:
Journal of Synchrotron Radiation
A new optics beamline and a versatile 11-axes UHV-reflectometer for at-wavelength characterization of real life-sized UV- and XUV-reflection gratings and other (nano-) optical elements has been set up and is in operation at BESSY-II. Azimuthal rotati
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::4eb043f93a8012209b3e2cd9b1aa7c29
http://www.helmholtz-berlin.de/pubbin/oai_publication?VT=1&ID=87910
http://www.helmholtz-berlin.de/pubbin/oai_publication?VT=1&ID=87910
Autor:
W. Sandner, U. Eichmann, F. Eggenstein, H. Schönagel, E. Gubbini, M Schnürer, G. Reichardt, G. Kommol, M.P. Kalashnikov, Peter V. Nickles
Publikováno v:
Vacuum. 76:45-49
Terawatt laser systems are affected by the problem that optical components, typically installed in vacuum, get contaminated with carbon. In this paper, we describe an “on-line” cleaning system, based on a radiofrequency discharge, to avoid carbon