Zobrazeno 1 - 10
of 23
pro vyhledávání: '"F. D. McDaniel"'
Autor:
Yuri M. Strzhemechny, F D McDaniel, B Rout, D. R. Diercks, P.R. Poudel, J. A. Paramo, P.P. Poudel
Publikováno v:
Journal of nanoscience and nanotechnology. 12(3)
Amorphous carbon (a-C) nanoclusters were synthesized by the implantation of carbon ions (C-) into thermally grown silicon dioxide film (-500 nm thick) on a Si (100) wafer and processed by high temperature thermal annealing. The carbon ions were impla
Autor:
S. Matteson, S. N. Renfrow, J.M. Anthony, D. K. Marble, F. D. McDaniel, Y.D. Kim, J.F. Kirchhoff
Publikováno v:
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films. 12:1547-1550
A Cs based secondary‐ion mass spectrometry (SIMS) instrument has been constructed and coupled to a 3 MV tandem accelerator to produce an accelerator mass spectrometry system for impurity detection in materials. Exposed surfaces of the ion optical e
Autor:
D. L. Weathers, R.L. Beavers, S. Matteson, F. D. McDaniel, T.J. Bennett, J.F. Kirchhoff, J.M. Anthony, D. K. Marble
Publikováno v:
Review of Scientific Instruments. 65:1570-1574
An ultraclean accelerator mass spectrometry negative ion source for semiconductor material mass analysis has been built and is in operation at the University of North Texas’ Ion Beam Modification and Analysis Laboratory (IBMAL). The source is uniqu
Autor:
L. J. Mitchell, O. W. Holland, A. Neogi, F. Naab, L. C. Phinney, K. Hossain, F. D. McDaniel, Floyd D. McDaniel, Barney L. Doyle
Publikováno v:
AIP Conference Proceedings.
Carbon‐based nanocrystals, formed in silica by low‐energy carbon implantation and subsequent thermal annealing, have been previously reported, but ambiguities as to the equilibrium morphology and its relationship to the source of photo luminescen
Autor:
P. P. Provencio, F. D. McDaniel, A. J. Antolak, B. L. Doyle, D. H. Morse, Floyd D. McDaniel, Barney L. Doyle
Publikováno v:
AIP Conference Proceedings.
Compact active interrogation sources are being developed that use low‐energy (kilovolt) nuclear reactions to produce high‐energy (megavolt) neutrons or gamma‐rays. We are evaluating target materials for these interrogation sources by performing
Autor:
A. Battistella, Gyorgy Vizkelethy, P. Rossi, Gisella Gennaro, F. D. McDaniel, J. C. Banks, B. L. Doyle, N. D. Wing, M. Mellon, E. Vittone
Publikováno v:
AIP Conference Proceedings.
Irradiation of a single biological cell, instead of a whole tissue, with ions in a known number and position, is a powerful means to study very low dose biological effectiveness. Present methods employ accelerated ion beams which are 1) either collim
Publikováno v:
Proceedings of 11th International Conference on Ion Implantation Technology.
Reduction of metallic contamination during ion implantation is becoming increasingly critical for device performance. Modern implanters are therefore, being developed with novel beamline coating materials and optics to keep sputtered contamination to
Publikováno v:
AIP Conference Proceedings.
The charge state distributions (CSD) produced during molecular dissociation are important to both Trace Element Accelerator Mass Spectrometry (TEAMS) and the ion implantation industry. The CSD of 1.3–1.7 MeV SiN+, SiMg+, SiMn+, and SiZn+ molecules
Publikováno v:
AIP Conference Proceedings.
Ion induced electron emission (IIEE) from solid surfaces is one of the fundamental processes with ion beam applications. The different IIEE yields from different surfaces such as Si, SiO2, metals and photoresist (PR) may cause charging and damage the
Autor:
S. Matteson, J. L. Duggan, F. D. McDaniel, D. L. Weathers, F. Picton, B. F. Hughes, Jian-Yue Jin
Publikováno v:
AIP Conference Proceedings.
Nuclear Reaction Analysis (NRA) using the 19F(p,αγ)16O resonance reaction is a powerful method of fluorine depth profiling. We have used this method to study the fluorine uptake phenomenon in mineral flint, which could potentially develop into a me