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pro vyhledávání: '"F D Natterer"'
Autor:
Q Dubout, F Calleja, G Sclauzero, M Etzkorn, A Lehnert, L Claude, M Papagno, F D Natterer, F Patthey, S Rusponi, Alfredo Pasquarello, H Brune
Publikováno v:
New Journal of Physics, Vol 18, Iss 10, p 103027 (2016)
We report on the strengths and limitations of scanning tunnelling microscopy (STM) when used for characterising atomic-scale features of quasi two-dimensional materials, such as graphene and single layers of hexagonal boron nitride, which may present
Externí odkaz:
https://doaj.org/article/b325e0b1d8e24edb9c8c27ff513185a2
