Zobrazeno 1 - 10
of 30
pro vyhledávání: '"Félix Salazar-Bloise"'
Publikováno v:
Sensors, Vol 21, Iss 16, p 5572 (2021)
To guarantee quality standards for the industry, surface properties, particularly those of roughness, must be considered in many areas of application. Today, several methods are available on the market, but some damage the surface to be tested as the
Externí odkaz:
https://doaj.org/article/140b36f34ae941acafc48e32d090451f
Autor:
Franziska Pöller, Félix Salazar Bloise, Martin Jakobi, Shengjia Wang, Jie Dong, Alexander W. Koch
Publikováno v:
Sensors, Vol 19, Iss 10, p 2215 (2019)
The characteristics of a surface, particularly the roughness, play an important role in different fields of the industry and have to be considered to ensure quality standards. Currently, there are numerous sophisticated methods for measuring surface
Externí odkaz:
https://doaj.org/article/bdd73878534d4679a0200c64029ef79a
Autor:
Martin Jakobi, Shengjia Wang, Félix Salazar Bloise, Jie Dong, Laura Maria Bilgeri, Alexander W. Koch, Franziska Pöller
Publikováno v:
tm - Technisches Messen. 86:22-26
Zusammenfassung Die Oberflächeneigenschaften, insbesondere die Rauheit, sind in der Industrie von großer Bedeutung. Derzeit gibt es zahlreiche Verfahren zur optischen Rauheitsmessung. Ziel der in diesem Artikel beschriebenen Arbeiten ist es, eine V
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::28770a2d8fe44bb691c8bfff4a5c265c
https://doi.org/10.1515/teme-2019-0042
https://doi.org/10.1515/teme-2019-0042
Publikováno v:
Sensors, Vol 17, Iss 3, p 596 (2017)
The surface structure, especially the roughness, has a significant influence on numerous parameters, such as friction and wear, and therefore estimates the quality of technical systems. In the last decades, a broad variety of surface roughness measur
Externí odkaz:
https://doaj.org/article/8fab9a247dbc4d1fa6e79b4234840406
Autor:
Shengjia Wang, Shuai Gao, Hao Tang, Wenze Xiong, Yunxiang Yan, Tao Geng, Alexander W. Koch, Félix Salazar-Bloise, Zhan Gao, Weimin Sun
Publikováno v:
Optics Letters. 47:5409
This Letter communicates a new, to the best of our knowledge, designing framework of shearography. The three elementary functional parts of quantitative shearography, namely imaging, shearing, and phase shifting, are integrated into a single diffract
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::8afd8e7695fd5d9d05d2379ca715732e
https://doi.org/10.1364/ol.474519
https://doi.org/10.1364/ol.474519
Real-time dual-sensitive shearography for simultaneous in-plane and out-of-plane strain measurements
Autor:
Alexander W. Koch, Martin Jakobi, Jie Dong, Min Lu, Félix Salazar Bloise, Laura Maria Bilgeri, Zhanwei Liu, Xingchen Dong, Shengjia Wang, Ali K. Yetisen, Franziska Pöller
Publikováno v:
Optics express. 27(3)
A real-time, dual-sensitive shearography system using a single-wavelength laser was developed for simultaneous and dynamic in-plane and out-of-plane strain measurements. The shearography system is capable of measuring crack-tip deformation fields qua
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::887e691be97ab306d9a11199ea729922
https://pubmed.ncbi.nlm.nih.gov/30732351
https://pubmed.ncbi.nlm.nih.gov/30732351
Autor:
Ali K. Yetisen, Martin Jakobi, Xingchen Dong, Shengjia Wang, Félix Salazar Bloise, Nicholas Ong, Zhanwei Liu, Alexander W. Koch, Franziska Pöller, Jie Dong
Publikováno v:
Optics Letters. 45:1305
A single-aperture common-path speckle interferometer with an unlimited shear amount is developed. This unlimited shear amount is introduced when a Wollaston prism is placed near the Fourier plane of a common-path interferometer, which is built by usi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::9a7218808b5f9a056ffbe96c6a937392
https://doi.org/10.1364/ol.382893
https://doi.org/10.1364/ol.382893
Autor:
Shengjia Wang, Laura Maria Bilgeri, Martin Jakobi, Alexander W. Koch, Min Lu, Félix Salazar Bloise
Publikováno v:
Optics express. 26(7)
A temporal electronic speckle pattern interferometry (ESPI) system is proposed for in-plane rotation measurement. The relationship between the rotation angle and the phase change distribution is established and the rotation direction is indicated by
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::e5e051de8b973346f3c2568ce86edd4b
https://pubmed.ncbi.nlm.nih.gov/29715838
https://pubmed.ncbi.nlm.nih.gov/29715838
Publikováno v:
Automated Visual Inspection and Machine Vision II.
The inspection of technical surfaces is often performed by two-wavelength electronic speckle-pattern interferometry (ESPI) combined with a phase-shifting procedure. As in conventional specular interferometry, the characteristic fringe spacing in the
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::775ef5782be4f6ff6c935587f58bab74
https://doi.org/10.1117/12.2269453
https://doi.org/10.1117/12.2269453