Zobrazeno 1 - 9
of 9
pro vyhledávání: '"Eyck, G. A. Ten"'
Autor:
Shirkhorshidian, A., Gamble, John King, Maurer, L., Carr, S. M., Dominguez, J., Eyck, G. A. Ten, Wendt, J. R., Nielsen, E., Jacobson, N. T., Lilly, M. P., Carroll, M. S.
Publikováno v:
Phys. Rev. Applied 10, 044003 (2018)
Despite their ubiquity in nanoscale electronic devices, the physics of tunnel barriers has not been developed to the extent necessary for the engineering of devices in the few-electron regime. This problem is of urgent interest, as this is the precis
Externí odkaz:
http://arxiv.org/abs/1705.01183
Autor:
Lu, T. M., Gamble, J. K., Muller, R. P., Nielsen, E., Bethke, D., Eyck, G. A. Ten, Pluym, T., Wendt, J. R., Dominguez, J., Lilly, M. P., Carroll, M. S., Wanke, M. C.
Enhancement-mode Si/SiGe electron quantum dots have been pursued extensively by many groups for \revEdit{their} potential in quantum computing. Most of the reported dot designs utilize multiple metal-gate layers and use Si/SiGe heterostructures with
Externí odkaz:
http://arxiv.org/abs/1608.08107
Autor:
Tracy, L. A., Nordberg, E. P., Young, R. W., Pinilla, C. Borras, Stalford, H. L., Eyck, G. A. Ten, Eng, K., Childs, K. D., Stevens, J., Lilly, M. P., Eriksson, M. A., Carroll, M. S.
Publikováno v:
Appl. Phys. Lett. 97, 192110 (2010)
We present transport measurements of a tunable silicon metal-oxide-semiconductor double quantum dot device with lateral geometry. Experimentally extracted gate-to-dot capacitances show that the device is largely symmetric under the gate voltages appl
Externí odkaz:
http://arxiv.org/abs/1011.0034
Autor:
Nordberg, E. P., Stalford, H. L., Young, R., Eyck, G. A. Ten, Eng, K., Tracy, L. A., Childs, K. D., Wendt, J. R., Grubbs, R. K., Stevens, J., Lilly, M. P., Eriksson, M. A., Carroll, M. S.
Publikováno v:
Appl. Phys. Lett. 95, 202102 (2009)
Laterally coupled charge sensing of quantum dots is highly desirable, because it enables measurement even when conduction through the quantum dot itself is suppressed. In this work, we demonstrate such charge sensing in a double top gated MOS system.
Externí odkaz:
http://arxiv.org/abs/0909.3547
Autor:
Nordberg, E. P., Eyck, G. A. Ten, Stalford, H. L., Muller, R. P., Young, R. W., Eng, K., Tracy, L. A., Childs, K. D., Wendt, J. R., Grubbs, R. K., Stevens, J., Lilly, M. P., Eriksson, M. A., Carroll, M. S.
Publikováno v:
Phys. Rev. B 80, 115331 (2009)
We present measurements of silicon (Si) metal-oxide-semiconductor (MOS) nanostructures that are fabricated using a process that facilitates essentially arbitrary gate geometries. Stable Coulomb blockade behavior free from the effects of parasitic dot
Externí odkaz:
http://arxiv.org/abs/0906.3748
Autor:
Tracy, L. A., Hwang, E. H., Eng, K., Eyck, G. A. Ten, Nordberg, E. P., Childs, K., Carroll, M. S., Lilly, M. P., Sarma, S. Das
Publikováno v:
Phys. Rev. B 79, 235307 (2009)
By analyzing the temperature ($T$) and density ($n$) dependence of the measured conductivity ($\sigma$) of 2D electrons in the low density ($\sim10^{11}$cm$^{-2}$) and temperature (0.02 - 10 K) regime of high-mobility (1.0 and 1.5 $\times 10^4$ cm$^2
Externí odkaz:
http://arxiv.org/abs/0811.1394
Autor:
Rochette, S., Rudolph, M., Roy, A.-M., Curry, M. J., Eyck, G. A. Ten, Manginell, R. P., Wendt, J. R., Pluym, T., Carr, S. M., Ward, D. R., Lilly, M. P., Carroll, M. S., Pioro-Ladrière, M.
Publikováno v:
Applied Physics Letters; 2/25/2019, Vol. 114 Issue 8, pN.PAG-N.PAG, 5p, 1 Diagram, 2 Graphs
Autor:
Lu, T. M., Gamble, J. K., Nielsen, R. P. Muller, E., Bethke, D., Eyck, G. A. Ten, Pluym, T., Wendt, J. R., Dominguez, J., Lilly, M. P., Carroll, M. S., Wanke, M. C.
Publikováno v:
Applied Physics Letters; 9/5/2016, Vol. 109 Issue 9, p093102-1-093102-4, 4p, 2 Graphs
Publikováno v:
Journal of Comparative Neurology; 1991, Vol. 303 Issue 3, p424-434, 11p