Výsledky vyhledávání - "Extremes Ultraviolett"

Diffraction-based metrology in the extreme ultraviolet

Autor: Tuitje, Frederik

The growing numerical development of Coherent Diffraction Imaging (CDI) towards ptychography allows for the first time the separate reconstruction of object and the wavefront illuminating it. This work is dedicated to the investigation of further pos

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::515b1f7132c8ac0c4d070490c9ee7e55

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Nanoscale coherent diffractive imaging using high-harmonic XUV sources

Autor: Tadesse, Getnet

Imaging using sources in the XUV and X-ray spectral range combines high resolution with longer penetration depth (compared to electron/ion microscopy) and found applications in many areas of science and technology. Coherent diffractive imaging (CDI)

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::d9b00731d20f966542844ea896092002

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