Zobrazeno 1 - 10
of 42
pro vyhledávání: '"Ewald Niehuis"'
Autor:
Lidija Matjacic, Martin P. Seah, Gustavo F. Trindade, Alexander Pirkl, Rasmus Havelund, Jean‐Luc Vorng, Ewald Niehuis, Ian S. Gilmore
Publikováno v:
Surface and Interface Analysis. 54:331-340
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::da02a53e599fe6a6f145694ac5b732b8
https://doi.org/10.1002/sia.7058
https://doi.org/10.1002/sia.7058
Autor:
Lidija Matjacic, Martin P. Seah, Gustavo F. Trindade, Alexander Pirkl, Rasmus Havelund, Jean‐Luc Vorng, Ewald Niehuis, Ian S. Gilmore
Publikováno v:
Surface and Interface Analysis. 54
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::37a77e834cf98be8ab4bb62b2df4d579
https://doi.org/10.1002/sia.7084
https://doi.org/10.1002/sia.7084
Autor:
Thierry Conard, Wilfried Vandervorst, Valentina Spampinato, Alexis Franquet, Kristof Paredis, Paul van der Heide, Ewald Niehuis, Alexander Pirkl, Charlotte Zborowski, Jonathan Ludwig
Publikováno v:
Surface and Interface Analysis. 52:786-791
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::2094104635936eebb69c7b3083837017
https://doi.org/10.1002/sia.6766
https://doi.org/10.1002/sia.6766
Autor:
Felix Kollmer, Alexander Pirkl, Henrik Arlinghaus, Rudolf Möllers, Nathan Havercroft, Ewald Niehuis
Publikováno v:
Microscopy and Microanalysis. 28:942-943
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2453d1378ab38b96572c9f49d8dd492c
https://doi.org/10.1017/s1431927622004123
https://doi.org/10.1017/s1431927622004123
Autor:
Ian S. Gilmore, Peter S. Marshall, Melissa K. Passarelli, Alexander Makarov, Morgan R. Alexander, Dmitry Grinfeld, Stevan Horning, Rudolf Moellers, Colin T. Dollery, Andrew West, Rasmus Havelund, Ewald Niehuis, Carla F. Newman, Alexander Pirkl, Felix Kollmer, Henrik Arlinghaus
Publikováno v:
Nature Methods. 14:1175-1183
© 2017 Nature America, Inc., part of Springer Nature. All rights reserved. We report the development of a 3D OrbiSIMS instrument for label-free biomedical imaging. It combines the high spatial resolution of secondary ion mass spectrometry (SIMS; und
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::8678987b5c985672e48ae22c20695052
https://doi.org/10.1038/nmeth.4504
https://doi.org/10.1038/nmeth.4504
Autor:
Felix Kollmer, Henrik Arlinghaus, Ewald Niehuis, Sven Kayser, Alexander Pirkl, Nathan Havercroft, Rudolf Moellers
Publikováno v:
Microscopy and Microanalysis. 26:76-77
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4a46f05bd02288050b6ec3077d09cae5
https://doi.org/10.1017/s143192762001329x
https://doi.org/10.1017/s143192762001329x
Autor:
Raphaelle Dianoux, Ewald Niehuis, Adi Scheidemann, Henrik Arlinghaus, Sasa Vranjkovic, Rudolf Möllers, Hans-Josef Hug, Felix Kollmer, Laetitia Bernard
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::5fe7e536d37bec0db7f587897bc33872
http://doc.rero.ch/record/290080/files/S143192761500793X.pdf
http://doc.rero.ch/record/290080/files/S143192761500793X.pdf
Autor:
Anja Henss, Ewald Niehuis, Wolfgang Paul, Nathan Havercroft, Felix Kollmer, Rudolf Moellers, Henrik Arlinghaus
Publikováno v:
Microscopy and Microanalysis. 24:1026-1027
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a38ac7ea82e5f9b680d60adf4f7cd056
https://doi.org/10.1017/s1431927618005627
https://doi.org/10.1017/s1431927618005627
Autor:
Nicholas Winograd, Ian S. Gilmore, D. Rading, Rasmus Havelund, Martin P. Seah, Ewald Niehuis, Dan Mao, Steve J. Spencer, Rudolf Moellers, Takuya Miyayama, Alexander G. Shard
Publikováno v:
Analytical Chemistry. 84:7865-7873
The depth profiling of organic materials with argon cluster ion sputtering has recently become widely available with several manufacturers of surface analytical instrumentation producing sources suitable for surface analysis. In this work, we assess
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::0fcdbca4cb85cd64d9f65dac9d79b46f
https://doi.org/10.1021/ac301567t
https://doi.org/10.1021/ac301567t
Autor:
Elke Tallarek, Rudolf Möllers, Joachim Wegener, Daniel Breitenstein, Birgit Hagenhoff, Barbara Goricnik, Ewald Niehuis, Michaela Sperber
Publikováno v:
Surface and Interface Analysis. 45:315-319
Label-free characterization of cellular compartments and molecular structures in single cells has become possible by means of ToF-SIMS 3D analysis [1, 2]. Major molecular building blocks, such as amino acid fragments and phophatidylcholine fragments
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a2aa73816ae9d2df6d845bba11e637ed
https://doi.org/10.1002/sia.5141
https://doi.org/10.1002/sia.5141