Výsledky vyhledávání - "Evgueni, Meltchakov"

Akademický článek

Sc/SiC/Al Multilayer Optimization for Li K Spectroscopy

Autor: Khalil Hassebi, Evgueni Meltchakov, Franck Delmotte, Angelo Giglia, Philippe Jonnard

Publikováno v: Applied Sciences, Vol 14, Iss 3, p 956 (2024)

This paper presents an X-ray reflectivity study of a Sc/SiC/Al periodic multilayer deposited via magnetron sputtering and its possible adaptation to be used as a dispersive element in the crystal spectrometers equipping scanning electron microscopes

Externí odkaz: https://doaj.org/article/6a235971938e4ad887d24e05fbeb794d

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Lifetime Stability and Microstructure Properties of Cr/B4C X-ray Reflective Multilayer Coatings

Autor: Julien E. Rault, Evgueni Meltchakov, Franck Delmotte, Regina Soufli, Christopher C. Walton, Catherine Burcklen, Eric M. Gullikson, Jennifer Rebellato

Publikováno v: Journal of Nanoscience and Nanotechnology
Journal of Nanoscience and Nanotechnology, American Scientific Publishers, 2019, 19 (1), pp.554-561. ⟨10.1166/jnn.2019.16480⟩

International audience; This paper demonstrates that highly reflective Cr/B 4 C multilayer interference coatings with nano-metric layer thicknesses, designed to operate in the soft X-ray photon energy range, have stable reflective performance for a p

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::065268c3160387cb0ded5cd06ad3b7c0
https://doi.org/10.1166/jnn.2019.16480

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The Solar Orbiter EUI instrument: The Extreme Ultraviolet Imager

Autor: J. Hansotte, R. Müller, M. Hailey, P. Schlatter, A. Lawrenson, M. Monecke, Hardi Peter, Julien Rosin, Koen Stegen, Jean-Claude Vial, S. Parenti, Ali BenMoussa, Etienne Renotte, N. Szwec, Marie-Laure Hellin, R. Enge, M. Haberreiter, A. Philippon, P. Coker, B. Giordanengo, L. Dolla, K. Heerlein, Werner Schmutz, Matthew J. West, K. Ruane, J.-F. Hochedez, M. Chaigneau, M. Kahle, Emmanuel Mazy, J. Scanlan, J. Tandy, J. Barbay, B. Chares, T. Appourchaux, Laurence Rossi, C. Dumesnil, E. Pylyser, R. Aznar Cuadrado, Louise K. Harra, S. Meyer, F. Cabé, Benoit Marquet, Evgueni Meltchakov, Andrei Zhukov, D. Westwood, Bogdan Nicula, G. Willis, M.-F. Ravet-Krill, B. Borgo, S. Hemsley, Isabelle Tychon, N. Guerreiro, D. Linder, R. Mercier, Sylvie Liébecq, Thomas Wiegelmann, Philip J. Smith, M. Gyo, L. Mountney, G. Davison, Frédéric Rabecki, Jean-Marie Gillis, P. Langer, P. Roth, Sami K. Solanki, Luciano Rodriguez, Jean-Philippe Halain, L. Cadiergues, P. Addison, V. Büchel, D. Markiewicz-Innes, X. Zhang, Daniel Pfiffner, M. Roulliay, Antoine Rousseau, Stéphane Roose, Udo Schühle, M. Spescha, Jean-Yves Plesseria, Lionel Jacques, J. C. Le Clec’h, Yvan Stockman, G. Del Zanna, T. Kennedy, C. Beurthe, B. Mampaey, Franck Delmotte, C. Theobald, C. Choque Cortez, S. Meining, S. François, David Long, M. Bergmann, F. Rouesnel, S. Koller, C. Tamiatto, M. Bouzit, David Berghmans, D. Bates, L. Bradley, E. Kotsialos, A. Hafiz, D. Davies, J. B. L. Jones, S. Smit, Véronique Delouille, Gilles Morinaud, Aline Hermans, S. Coumar, J. Rebellato, Yvette Houbrechts, Stephan Werner, Werner Curdt, J. Cutler, K. Bonte, Daniel B. Seaton, Jean-Marc Defise, F. Moron, M. Klaproth, Eric Buchlin, J.-J. Fourmond, I. Phillips, Jörg Büchner, Pierre Rochus, M. Kolleck, Christophe Hecquet, Sarah A. Matthews, L. van Driel-Gesztelyi, Lucie M. Green, Cis Verbeeck, S. Gissot, F. Dürig, M. Condamin, Cedric Lenaerts, F. Auchère, K. Ihsan, K. Silliman, A. Guilbaud, Luca Teriaca, E. Kraaikamp, F. Monfort, A. Jérôme, Andreas Zerr, E. Marsch, Berend Winter, D. N. Baker, Alexandra Mazzoli, A. Spencer, V. Hervier

Publikováno v: Astronomy and Astrophysics-A&A
Astronomy and Astrophysics-A&A, EDP Sciences, 2020, 642, pp.A8. ⟨10.1051/0004-6361/201936663⟩
Astronomy and Astrophysics-A&A, EDP Sciences, 2020, 642, ⟨10.1051/0004-6361/201936663⟩

Context.The Extreme Ultraviolet Imager (EUI) is part of the remote sensing instrument package of the ESA/NASA Solar Orbiter mission that will explore the inner heliosphere and observe the Sun from vantage points close to the Sun and out of the eclipt

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::4fde6c949827de1c6d33fe569ab239b5
https://hal.archives-ouvertes.fr/hal-02991327

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Optical, structural and aging properties of Al/Sc-based multilayers for the extreme ultraviolet

Autor: Jennifer Rebellato, Cédric Baumier, Florian Pallier, Eric M. Gullikson, Evgueni Meltchakov, Regina Soufli, Sébastien de Rossi, Franck Delmotte

Publikováno v: Thin Solid Films. 735:138873

This manuscript presents the structural characterization of Al/Sc-based periodic multilayer coatings for the extreme ultraviolet (EUV) spectral range. Based on transmission electron microscopy and electron diffraction as well as grazing-incidence and

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::0d3644732d1f28c772408e1f613de8ce
https://doi.org/10.1016/j.tsf.2021.138873

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Kossel Effect in Periodic Multilayers

Publikováno v: Journal of nanoscience and nanotechnology
19 (2019): 593–601. doi:10.1166/jnn.2019.16472
info:cnr-pdr/source/autori:Le Guen, Karine; Andre, Jean-Michel; Wu, Meiyi; Ilakovac, Vita; Delmotte, Franck; de Rossi, Sebatien; Bridou, Francoise; Meltchakov, Evgueni; Giglia, Angelo; Nannarone, Stefano; Wang, Zhanshan; Huang, Qiushi; Zhang, Zhong; Zhu, Jingtao; Tu, Yuchun; Yuan, Yanyan; Vickridge, Ian; Schmaus, Didier; Briand, Emrick; Steydli, Sebastien; Walter, Philippe; Jonnard, Philippe/titolo:Kossel Effect in Periodic Multilayers/doi:10.1166%2Fjnn.2019.16472/rivista:Journal of nanoscience and nanotechnology (Print)/anno:2019/pagina_da:593/pagina_a:601/intervallo_pagine:593–601/volume:19
Journal of Nanoscience and Nanotechnology
Journal of Nanoscience and Nanotechnology, American Scientific Publishers, 2019, 19 (1), pp.593-601. ⟨10.1166/jnn.2019.16472⟩

International audience; The Kossel effect is the diffraction by a periodically structured medium, of the characteristic X-ray radiation emitted by the atoms of the medium. We show that multilayers designed for X-ray optics applications are convenient

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::bb7674230aa80e374dcf66f8baccde7e

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Laboratory grazing-incidence X-ray fluorescence spectroscopy as an analytical tool for the investigation of sub-nanometer CrSc multilayer water window optics

Autor: Ulrich Waldschläger, Philippe Jonnard, Meiyi Wu, Jonas Baumann, Ioanna Mantouvalou, Veronika Szwedowski-Rammert, Armin Gross, Gesa Goetzke, Evgueni Meltchakov, Franck Delmotte, Birgit Kanngießer, Philipp Hönicke

Publikováno v: Spectrochimica Acta Part B: Atomic Spectroscopy
Spectrochimica Acta Part B: Atomic Spectroscopy, Elsevier, 2020, 174, pp.105995. ⟨10.1016/j.sab.2020.105995⟩

Efficient multilayer optics for radiation in the water window range are difficult to manufacture due to extremely small layer thicknesses and severe intermixing of elements between the layers. Therefore, adequate analytics and short feedback loops ar

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::7c24c2c70e869163334611b8543f0d2f
https://doi.org/10.1016/j.sab.2020.105995

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High efficiency Al/Sc-based multilayer coatings in the EUV wavelength range above 40 nanometers

Autor: Jennifer Rebellato, Regina Soufli, Franck Delmotte, Evgueni Meltchakov, Eric M. Gullikson, Sébastien de Rossi

Publikováno v: Optics Letters
Optics Letters, Optical Society of America-OSA Publishing, 2020, 45 (4), pp.869-872. ⟨10.1364/OL.384734⟩

In this Letter, we have developed new and highly efficient periodic multilayer mirrors Al/Sc, Al/Sc/SiC, and Mo/Al/Sc with optimized reflectance at wavelengths between 40 and 65 nm. We have reached record values in measured peak reflectance: 57.5% at

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::b1098ac177060d8c50148a4071b7e07d
https://doi.org/10.1364/ol.384734

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Lifetime Stability and Microstructure Properties of Cr/B₄C X-ray Reflective Multilayer Coatings

Autor: Catherine, Burcklen, Regina, Soufli, Jennifer, Rebellato, Christopher, Walton, Evgueni, Meltchakov, Julien E, Rault, Eric, Gullikson, Franck, Delmotte

Publikováno v: Journal of nanoscience and nanotechnology. 19(1)

This paper demonstrates that highly reflective Cr/B₄C multilayer interference coatings with nanometric layer thicknesses, designed to operate in the soft X-ray photon energy range, have stable reflective performance for a period of 3 years after de

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=pmid________::394b8fc8e425edfc9b1ea31176d84903
https://pubmed.ncbi.nlm.nih.gov/30327069

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Analyses of tabulated optical constants for thin films in the EUV range and application to solar physics multilayer coatings

Autor: Regina Soufli, Franck Delmotte, Jennifer Rebellato, F. Auchère, Sébastien de Rossi, Xueyan Zhang, Evgueni Meltchakov

Publikováno v: Proc. SPIE
Advances in Optical Thin Films VI
Advances in Optical Thin Films VI, May 2018, Frankfurt, Germany. pp.106911U, ⟨10.1117/12.2313346⟩

The thin film optical constants are key parameters to carry out optical simulation or optimization of multilayer mirrors with high efficiency. However, for most materials, different sets of optical constants can be found in the literature especially

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::03c88d4b0ce43faa386d97c6b9553891
https://hal.archives-ouvertes.fr/hal-01831736

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