Zobrazeno 1 - 10
of 26
pro vyhledávání: '"Evert P. Houwman"'
Autor:
Zixiong Sun, Sizhao Huang, Wenxuan Zhu, Yorick A. Birkhölzer, Xing Gao, Romar Angelo Avila, Houbing Huang, Xiaojie Lou, Evert P. Houwman, Minh D. Nguyen, Gertjan Koster, Guus Rijnders
Publikováno v:
APL Materials, Vol 11, Iss 10, Pp 101129-101129-8 (2023)
BaTiO3 thin films with different annealing times were grown on LSMO/STO (001) substrates by pulsed laser deposition. An interesting phenomenon of loss-and-reappearance of the interfacial layer in BaTiO3 was detected in the x-ray diffraction results,
Externí odkaz:
https://doaj.org/article/fdb85368a4454b52b110d7310138675b
Autor:
Muhammad Boota, Evert P. Houwman, Matthijn Dekkers, Minh D. Nguyen, Kurt H. Vergeer, Giulia Lanzara, Gertjan Koster, Guus Rijnders
Publikováno v:
Science and Technology of Advanced Materials, Vol 17, Iss 1, Pp 45-57 (2016)
Epitaxial (PbMg1/3Nb2/3O3)2/3-(PbTiO3)1/3 (PMN-PT) films with different out-of-plane orientations were prepared using a CeO2/yttria stabilized ZrO2 bilayer buffer and symmetric SrRuO3 electrodes on silicon substrates by pulsed laser deposition. The o
Externí odkaz:
https://doaj.org/article/b2fd42c2497f46c2a6fd2f67010e6708
Autor:
Yorick Birkhölzer, M. Bowen, Yanwei Cao, Guanglei Cheng, Woo Seok Choi, Nicholas G. Combs, M. Dawber, Regina Dittmann, Minh T. Do, Hongchu Du, Vincenzo Esposito, D.D. Fong, Hangwen Guo, Evert P. Houwman, Mark Huijben, Chun-Lin Jia, Adam P. Kajdos, Lior Kornblum, Gertjan Koster, Yoshiharu Krockenberger, Ho Nyung Lee, Carlos Leon, Zhaoliang Liao, Michio Naito, Luuk Okkerman, Nini Pryds, Guus Rijnders, Alessia Sambri, Jacobo Santamaria, Simone Santucci, Ambrose Seo, Sander Smink, Changhee Sohn, Matjaž Spreitzer, Susanne Stemmer, Johan E. ten Elshof, Arturas Vailionis, LingFei Wang, Hideki Yamamoto, Haiwu Zhang, Jiandi Zhang, H. Zhou
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::71a2a74ab9b57538a5b212bb341abfad
https://doi.org/10.1016/b978-0-08-102945-9.01002-9
https://doi.org/10.1016/b978-0-08-102945-9.01002-9
Publikováno v:
Epitaxial Growth of Complex Metal Oxides: Second Edition, 137-155
STARTPAGE=137;ENDPAGE=155;TITLE=Epitaxial Growth of Complex Metal Oxides
STARTPAGE=137;ENDPAGE=155;TITLE=Epitaxial Growth of Complex Metal Oxides
Interfaces can play an important role in the properties of ferroelectric devices, which effects especially show up in devices with thin ferroelectric layers. Here we describe the measured changes in the slanting, coercive, and self-bias field of the
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::6ef07726b1425adcf07edc831d7a0e0f
http://www.scopus.com/inward/record.url?scp=85137475924&partnerID=8YFLogxK
http://www.scopus.com/inward/record.url?scp=85137475924&partnerID=8YFLogxK
Autor:
Minh D. Nguyen, Evert P. Houwman, Matthijn Dekkers, Chi T. Q. Nguyen, Hung N. Vu, Guus Rijnders
Publikováno v:
APL Materials, Vol 4, Iss 8, Pp 080701-080701-8 (2016)
Pb0.9La0.1(Zr0.52Ti0.48)O3 (PLZT) relaxor-ferroelectric thin films were grown on SrRuO3/SrTiO3/Si substrates by pulsed laser deposition. A large recoverable storage density (Ureco) of 13.7 J/cm3 together with a high energy efficiency (η) of 88.2% un
Externí odkaz:
https://doaj.org/article/51b8a18eb35c4794856e79768c6443db
Publikováno v:
AIP Advances, Vol 6, Iss 5, Pp 055303-055303-10 (2016)
The pulsed laser deposition process of 300nm thick films of Pb(Mg1/3Nb2/3)O3)0.67-(PbTiO3)0.33 on (001)-oriented SrTiO3 was studied by varying deposition pressure, substrate deposition temperature, laser fluence on the target and target-substrate dis
Externí odkaz:
https://doaj.org/article/445ba0422d0c407eb2a898ccf3535c4d
Publikováno v:
Advanced Energy Materials. 12:2200517
Publikováno v:
Science and Technology of Advanced Materials, Vol 14, Iss 4, p 045006 (2013)
Piezoelectric thin films of PbZr0.45Ti0.55O3 were grown on Si substrates in four different ways, resulting in different crystalline structures, as determined by x-ray analysis. The crystalline structures were different in the spread in tilt angle and
Externí odkaz:
https://doaj.org/article/1a56514c28e94c068a0699e35b2ff047
Autor:
Hans, Boschker, Jaap, Kautz, Evert P, Houwman, Wolter, Siemons, Dave H A, Blank, Mark, Huijben, Gertjan, Koster, Arturas, Vailionis, Guus, Rijnders
Publikováno v:
Physical review letters. 109(15)
We present a study of the thickness dependence of magnetism and electrical conductivity in ultrathin La0.67Sr0.33MnO3 films grown on SrTiO3 (110) substrates. We found a critical thickness of 10 unit cells below which the conductivity of the films dis
Autor:
Sun, Zixiong, Huang, Sizhao, Zhu, Wenxuan, Birkhölzer, Yorick A., Gao, Xing, Avila, Romar Angelo, Huang, Houbing, Lou, Xiaojie, Houwman, Evert P., Nguyen, Minh D., Koster, Gertjan, Rijnders, Guus
Publikováno v:
APL Materials; Oct2023, Vol. 11 Issue 10, p1-8, 8p