Zobrazeno 1 - 8
of 8
pro vyhledávání: '"Evelyn Mintarno"'
Autor:
Subhasish Mitra, Stephen Boyd, Yu Cao, Evelyn Mintarno, Rui Zheng, Robert W. Dutton, Jyothi Velamala, Joëlle Skaf
Publikováno v:
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 30:760-773
This paper presents an integrated framework, together with control policies, for optimizing dynamic control of self-tuning parameters of a digital system over its lifetime in the presence of circuit aging. A variety of self-tuning parameters such as
Autor:
Subhasish Mitra, Jie Zhang, Sung-Boem Park, Nishant Patil, Ted Hong, Hyungmin Cho, Hai Wei, Larkhoon Leem, Diana Mui, Young Moon Kim, David Lin, Yanjing Li, Hsiao-Heng Kelin Lee, Evelyn Mintarno
Publikováno v:
IPSJ Transactions on System LSI Design Methodology. 4:2-30
Robust system design is essential to ensure that future electronic systems perform correctly despite rising complexity and increasing disturbances. In contrast, today's mainstream systems typically assume that transistors and interconnects operate co
Publikováno v:
IEEE Design & Test of Computers. 26:28-39
The prospect of system failure has increased because of device and chip-level effects in the late CMOS era. In this article, the authors present novel system-level architecture and design innovations to cope with these lifetime reliability challenges
Autor:
Evelyn Mintarno, Robert W. Dutton, David Victor Pietromonaco, Vikas Chandra, Robert Campbell Aitken
Publikováno v:
2013 IEEE International Reliability Physics Symposium (IRPS).
This paper analyzes aging effects on various design hierarchies of a sub-45nm commercial processor running realistic applications. Dependencies of aging effects on switching-activity and power-state of workloads are quantified. This paper presents an
Autor:
Evelyn Mintarno, Joelle Skaf, null Rui Zheng, Jyothi Velamala, null Yu Cao, Stephen Boyd, Robert W Dutton, Subhasish Mitra
Publikováno v:
2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010).
Autor:
Steven Yun Ji, Evelyn Mintarno
Publikováno v:
2009 IEEE 18th Conference on Electrical Performance of Electronic Packaging and Systems.
System IO power and performance are critical computer platform design parameters. IO power forms a significant portion of the overall power while its performance is often the bottleneck in achieving overall performance specification. This paper exper
Autor:
Evelyn Mintarno, Rui Zheng, Srikanth Krishnan, Subhasish Mitra, Jyothi Velamala, Varsha Balakrishnan, Yu Cao, Vijay Reddy
Publikováno v:
CICC
Low-power circuit operations, such as dynamic voltage scaling and the sleep mode, pose a unique challenge to aging prediction. Traditional aging models assume constant voltage and averaged activity factor, ignoring the impact of the long sleep period
Publikováno v:
IEEE Design & Test. :1-1
The biggest challenge in designing robust systems is to minimize the costs of error detection. Most existing error detection techniques suffer from high power and performance costs, and / or additional design complexity. Circuit failure prediction, t