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pro vyhledávání: '"Eve M. Allen"'
Autor:
James A. Yiannias, Nidhi Singh, Amy V. Prakash, Jill M. Killian, Matthew R. Hall, James H. Keeling, Debra D. Fett, Janis S. Johnson, Eve M. Allen, Diane L. Nordberg Linehan, Leigh Ann Scalf, Michael J. Camilleri, Ashley B. Wentworth, Lisa A. Drage, Mark D.P. Davis, Rochelle R. Torgerson
Publikováno v:
Journal of the American Academy of Dermatology. 70:269-275.e4
Background Patch testing is essential for identification of culprits causing allergic contact dermatitis. Objective We sought to identify trends and allergen changes in our standard series during 2006 to 2010, compared with our previous report (2001-
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::b8c33f05fb5684ce13287fad6d62eb06
https://doi.org/10.1016/j.jaad.2013.09.047
https://doi.org/10.1016/j.jaad.2013.09.047
