Zobrazeno 1 - 2
of 2
pro vyhledávání: '"Euna Ok"'
Autor:
Ju-Heon Kim, Hyunmi Sim, Dongkeun Na, Tae-Soo Park, Euna Ok, Yong-Beom Cho, Dae Hyun kim, Ho Seok Song, Seok-jun Won
Publikováno v:
International Symposium for Testing and Failure Analysis.
In this paper, impact of carbon on threshold voltage in MOSFET-based device is studied by 3D-atom probe tomography (APT). Carbon is one of most difficult contaminants incorporated from fab-environment to be detected by typical analytical techniques s
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::cee370582d1ddb07d49d0156b4da03d4
https://doi.org/10.31399/asm.cp.istfa2017p0123
https://doi.org/10.31399/asm.cp.istfa2017p0123
Autor:
Euna Ok, Seok-jun Won, Yong-Woon Han, Sunnu Shim, Wonse Kim, Gwang Wook Lee, Daeeun Jeong, Jae Hyun Kim, Seongjun Cho, Suhaeng Heo, Jinsung Kim, JoonMyoung Lee, Hun-Seong Choi
Publikováno v:
Microelectronics Reliability. :113431
Currently, STT-MRAM is the one of the highly demanding device as a good replacement of the conventional working memory with the merits on the cost, power, performance, and reliability. With the new process challenges on MTJ stack, the resistive devic
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::229c24b8b2e06ebb76f3787d95d0ae87
https://doi.org/10.1016/j.microrel.2019.113431
https://doi.org/10.1016/j.microrel.2019.113431