Zobrazeno 1 - 10
of 32
pro vyhledávání: '"Eugene Albert"'
Autor:
Sofia Feoktistova, Marya Sayganova, Kseniya Trutneva, Olga Glazova, Artem S. Blagodatski, Liudmila Shevkova, Anna Navoikova, Yuriy Anisimov, Eugene Albert, Olga Mityaeva, Pavel Volchkov, Andrey Deviatkin
Publikováno v:
Viruses, Vol 16, Iss 4, p 568 (2024)
Influenza A viruses (IAVs) pose a serious threat to global health. On the one hand, these viruses cause seasonal flu outbreaks in humans. On the other hand, they are a zoonotic infection that has the potential to cause a pandemic. The most important
Externí odkaz:
https://doaj.org/article/b5a3d5d76886446b92c9eb38b9ad81ad
Autor:
Uliana Vladimirova, Pavel Rumiantsev, Marianna Zolotovskaia, Eugene Albert, Aleksander Abrosimov, Konstantin Slashchuk, Petr Nikiforovich, Olga Chukhacheva, Nurshat Gaifullin, Maria Suntsova, Galina Zakharova, Alexander Glusker, Daniil Nikitin, Andrew Garazha, Xinmin Li, Dmitriy Kamashev, Alexei Drobyshev, Irina Kochergina-Nikitskaya, Maxim Sorokin, Anton Buzdin
Publikováno v:
Heliyon, Vol 7, Iss 3, Pp e06408- (2021)
DNA repair can prevent mutations and cancer development, but it can also restore damaged tumor cells after chemo and radiation therapy. We performed RNA sequencing on 95 human pathological thyroid biosamples including 17 follicular adenomas, 23 folli
Externí odkaz:
https://doaj.org/article/89654cc2c56142ac9048953d21263541
Publikováno v:
Biomedicines, Vol 8, Iss 3, p 67 (2020)
Gastric cancer is globally the fifth leading cause of cancer death. We present a case report describing the unique genomic characteristics of an Epstein−Barr virus-negative gastric cancer with esophageal invasion and regional lymph node metastasis.
Externí odkaz:
https://doaj.org/article/dea2918dc3c0467b9c0224cba3ad8e31
Autor:
Christos Messinis, Nitesh Pandey, Theodorus T. M. van Schaijk, Xiaomeng Liu, Armand Eugene Albert Koolen, Ilan Shlesinger, Johannes F. de Boer, Stefan Witte, Arie Jeffrey Den Boef
Publikováno v:
Optics Express, 29(23), 38237-38256. The Optical Society
Messinis, C, van Schaijk, T T M, Pandey, N, Koolen, A, Shlesinger, I, Liu, X, Witte, S, Boer, J F D E & Den Boef, A 2021, ' Aberration calibration and correction with nano-scatterers in digital holographic microscopy for semiconductor metrology ', Optics Express, vol. 29, no. 23, pp. 38237-38256 . https://doi.org/10.1364/OE.438026
Messinis, C, van Schaijk, T T M, Pandey, N, Koolen, A, Shlesinger, I, Liu, X, Witte, S, Boer, J F D E & Den Boef, A 2021, ' Aberration calibration and correction with nano-scatterers in digital holographic microscopy for semiconductor metrology ', Optics Express, vol. 29, no. 23, pp. 38237-38256 . https://doi.org/10.1364/OE.438026
Overlay metrology measures pattern placement between two layers in a semiconductor chip. The continuous shrinking of device dimensions drives the need to explore novel optical overlay metrology concepts that can address many of the existing metrology
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::5da20f31a19b5c22f862399ded656f7c
https://research.vu.nl/en/publications/db775a0b-4747-4004-846b-000598d87a1d
https://research.vu.nl/en/publications/db775a0b-4747-4004-846b-000598d87a1d
Autor:
T.T.M. van Schaijk, Stefan Witte, Christos Messinis, Nitesh Pandey, Armand Eugene Albert Koolen, J. de Boer, A.J. den Boef
Publikováno v:
Vrije Universiteit Amsterdam
Computational Optical Sensing and Imaging 2021 (COSI): [Proceedings]
Computational Optical Sensing and Imaging 2021 (COSI)
Messinis, C, van Schaijk, T T M, Pandey, N, Koolen, A, de Boer, J F, Witte, S & den Boef, A J 2021, Lens aberration calibration and correction with plasmonic nanoparticles in off-axis dark-field digital holographic microscope for semiconductor metrology . in Computational Optical Sensing and Imaging 2021 (COSI) : [Proceedings] ., CF2E.7, Optics InfoBase Conference Papers, OSA-The Optical Society, Computational Optical Sensing and Imaging, COSI 2021-Part of OSA Imaging and Applied Optics Congress 2021, Virtual, Online, United States, 19/07/21 . < https://www.osapublishing.org/abstract.cfm?uri=COSI-2021-CF2E.7 >
Computational Optical Sensing and Imaging 2021 (COSI): [Proceedings]
Computational Optical Sensing and Imaging 2021 (COSI)
Messinis, C, van Schaijk, T T M, Pandey, N, Koolen, A, de Boer, J F, Witte, S & den Boef, A J 2021, Lens aberration calibration and correction with plasmonic nanoparticles in off-axis dark-field digital holographic microscope for semiconductor metrology . in Computational Optical Sensing and Imaging 2021 (COSI) : [Proceedings] ., CF2E.7, Optics InfoBase Conference Papers, OSA-The Optical Society, Computational Optical Sensing and Imaging, COSI 2021-Part of OSA Imaging and Applied Optics Congress 2021, Virtual, Online, United States, 19/07/21 . < https://www.osapublishing.org/abstract.cfm?uri=COSI-2021-CF2E.7 >
We present a method to calibrate and correct lens aberrations in dark-field Digital Holographic Microscope (df-DHM). In this method a gold nanoparticle is used to measure the point-spread function (PSF) of the df-DHM.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::7113b5f768b779cce1397ca0b2257890
https://doi.org/10.1364/cosi.2021.cf2e.7
https://doi.org/10.1364/cosi.2021.cf2e.7