Zobrazeno 1 - 10
of 90
pro vyhledávání: '"Etienne Nowak"'
Autor:
Alexandre Levisse, Marc Bocquet, Marco Rios, Mouhamad Alayan, Mathieu Moreau, Etienne Nowak, Gabriel Molas, Elisa Vianello, David Atienza, Jean-Michel Portal
Publikováno v:
IEEE Access, Vol 8, Pp 109297-109308 (2020)
While Resistive Random Access Memories (RRAM) are perceived nowadays as a promising solution for the future of computing, these technologies suffer from intrinsic variability regarding programming voltage, switching speed and achieved resistance valu
Externí odkaz:
https://doaj.org/article/84732fc24896498fbef413232efe5b07
Autor:
Tifenn Hirtzlin, Marc Bocquet, Bogdan Penkovsky, Jacques-Olivier Klein, Etienne Nowak, Elisa Vianello, Jean-Michel Portal, Damien Querlioz
Publikováno v:
Frontiers in Neuroscience, Vol 13 (2020)
The brain performs intelligent tasks with extremely low energy consumption. This work takes its inspiration from two strategies used by the brain to achieve this energy efficiency: the absence of separation between computing and memory functions and
Externí odkaz:
https://doaj.org/article/dbd1743fa64545fea508526d5b5e607c
Publikováno v:
IEEE Journal of the Electron Devices Society, Vol 6, Pp 696-702 (2018)
This paper proposes a novel technique for reducing programming time and energy consumption in resistive random access memory (RRAM) arrays based on ramped voltage stress (RVS). RVS method is correlated to conventional constant voltage stress method (
Externí odkaz:
https://doaj.org/article/67610c348d6c4294b2cac131367a94ed
Autor:
Gabriel Molas, Etienne Nowak
Publikováno v:
Applied Sciences, Vol 11, Iss 23, p 11254 (2021)
This paper presents an overview of emerging memory technologies. It begins with the presentation of stand-alone and embedded memory technology evolution, since the appearance of Flash memory in the 1980s. Then, the progress of emerging memory technol
Externí odkaz:
https://doaj.org/article/3e207d91becc4bed8eb8a5e257a6ae31
Publikováno v:
IEEE Journal of Solid-State Circuits. 55:908-919
The slowdown of the CMOS technology scaling, and the trade-off between efficiency and flexibility have fueled the exploration into novel architectures with emerging post-CMOS technology [e.g., resistive-RAM (RRAM)]. In this article, a nonvolatile ful
Autor:
Etienne Nowak, Damien Querlioz, Marc Bocquet, Axel Laborieux, Atreya Majumdar, Elisa Vianello, Jean-Michel Portal, Tifenn Hirtzlin, Jacques-Olivier Klein
Publikováno v:
IEEE Transactions on Electron Devices
IEEE Transactions on Electron Devices, 2021, 68 (10), pp.4925-4932. ⟨10.1109/TED.2021.3108479⟩
IEEE Transactions on Electron Devices, Institute of Electrical and Electronics Engineers, 2021, 68 (10), pp.4925-4932. ⟨10.1109/TED.2021.3108479⟩
IEEE Transactions on Electron Devices, 2021, 68 (10), pp.4925-4932. ⟨10.1109/TED.2021.3108479⟩
IEEE Transactions on Electron Devices, Institute of Electrical and Electronics Engineers, 2021, 68 (10), pp.4925-4932. ⟨10.1109/TED.2021.3108479⟩
The implementation of current deep learning training algorithms is power-hungry, due to data transfer between memory and logic units. Oxide-based resistive random access memories (RRAMs) are outstanding candidates to implement in-memory computing, wh
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::edcbfdd9a7b73660ad52cf15830ef24e
https://hal.science/hal-03372056/document
https://hal.science/hal-03372056/document
Autor:
Luca Perniola, Piero Olivo, Etienne Nowak, Elisa Vianello, Alessandro Grossi, Pablo Royer, Jean-Philippe Noel, Cristian Zambelli, Bastien Giraud
Publikováno v:
IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 26:2599-2607
Resistive random access memories (RRAMs) feature high-speed operations, low-power consumption, and nonvolatile retention, thus serving as a promising candidate for future memory applications. To explore the applications of the RRAM, switching variabi
Autor:
N. Castellani, G. Molas, Marc Bocquet, L. Grenouillet, J-M. Portal, L. Reganaz, Etienne Nowak, T. Magis, C. Carabasse, G. Navarro, D. Deleruyelle, Mathieu Bernard, J. Minguet Lopez
Publikováno v:
2021 IEEE International Memory Workshop (IMW)
2021 IEEE INTERNATIONAL MEMORY WORKSHOP (IMW)
2021 IEEE INTERNATIONAL MEMORY WORKSHOP (IMW), May 2021, Dresde, Germany. pp.107-110, ⟨10.1109/IMW51353.2021.9439606⟩
2021 IEEE INTERNATIONAL MEMORY WORKSHOP (IMW)
2021 IEEE INTERNATIONAL MEMORY WORKSHOP (IMW), May 2021, Dresde, Germany. pp.107-110, ⟨10.1109/IMW51353.2021.9439606⟩
International audience; In this paper, we address the scalability of GeSeSbN based Ovonic Threshold Switch selector for high density crossbar integration. Impact of cell size down to 80nm on selector electrical characteristics, typical switching volt
Autor:
J. Garrione, Marie-Claire Cyrille, Nicolas Bernier, G. Lama, N. Castellani, Gabriele Navarro, Emmanuel Nolot, Etienne Nowak, Mathieu Bernard, Guillaume Bourgeois
Publikováno v:
IRPS 2021-2021 IEEE International Reliability Physics Symposium
IRPS 2021-2021 IEEE International Reliability Physics Symposium, Mar 2021, Monterey, United States. pp.1-6, ⟨10.1109/IRPS46558.2021.9405116⟩
IRPS
2021 IEEE International Reliability Physics Symposium (IRPS)
IRPS 2021-2021 IEEE International Reliability Physics Symposium, Mar 2021, Monterey, United States. pp.1-6, ⟨10.1109/IRPS46558.2021.9405116⟩
IRPS
2021 IEEE International Reliability Physics Symposium (IRPS)
Phase-Change Memory (PCM) demonstrated to be a mature Non- Volatile Memory technology to address Storage Class Memory (SCM) applications that can be distinguished in memory-type (M-SCM) and storage-type (S-SCM). In this work, we present how aGeSbTe (
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::0536207a1fd4b18652fc5be16bd08df3
https://cea.hal.science/cea-03331482
https://cea.hal.science/cea-03331482
Autor:
Gauthier Lefevre, C. Sabbione, Sylvain David, Etienne Nowak, J. Garrione, N. Castellani, Marie-Claire Cyrille, Anna Lisa Serra, Nicolas Bernier, Christophe Vallée, Guillaume Bourgeois, Gabriele Navarro, Mathieu Bernard, O. Cueto, Christelle Charpin-Nicolle
Publikováno v:
IEEE Transactions on Electron Devices
IEEE Transactions on Electron Devices, Institute of Electrical and Electronics Engineers, 2021, 68 (2), pp.535-540. ⟨10.1109/TED.2020.3044267⟩
IEEE Transactions on Electron Devices, 2021, 68 (2), pp.535-540. ⟨10.1109/TED.2020.3044267⟩
IEEE Transactions on Electron Devices, Institute of Electrical and Electronics Engineers, 2021, 68 (2), pp.535-540. ⟨10.1109/TED.2020.3044267⟩
IEEE Transactions on Electron Devices, 2021, 68 (2), pp.535-540. ⟨10.1109/TED.2020.3044267⟩
International audience; In this paper, we demonstrate at array level and in industrial like devices, the extreme scaling down to nanometric dimensions of the Phase-Change Memory technology thanks to an innovative Self-Nano-Confined PCM device (SNC PC
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::a85ded2bac29098bfe311f43f120a78b
https://hal-cea.archives-ouvertes.fr/cea-03119677/document
https://hal-cea.archives-ouvertes.fr/cea-03119677/document