Zobrazeno 1 - 10
of 32
pro vyhledávání: '"Eslam Yahya"'
Publikováno v:
2022 IEEE International Symposium on Circuits and Systems (ISCAS).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::312e9b492d6c726a829484ab4557106f
https://doi.org/10.1109/iscas48785.2022.9937692
https://doi.org/10.1109/iscas48785.2022.9937692
Autor:
Islam Elsadek, Sohrab Aftabjahani, Doug Gardner, Erik MacLean, John Ross Wallrabenstein, Eslam Yahya Tawfik
Publikováno v:
2022 IEEE International Symposium on Circuits and Systems (ISCAS).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d4f627a98652bbff9c8dbfb7f9bef280
https://doi.org/10.1109/iscas48785.2022.9937755
https://doi.org/10.1109/iscas48785.2022.9937755
Hardware and Energy Efficiency Evaluation of NIST Lightweight Cryptography Standardization Finalists
Autor:
Islam Elsadek, Sohrab Aftabjahani, Doug Gardner, Erik MacLean, John Ross Wallrabenstein, Eslam Yahya Tawfik
Publikováno v:
2022 IEEE International Symposium on Circuits and Systems (ISCAS).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::667d5c3d82eecceed445e592b39d9db2
https://doi.org/10.1109/iscas48785.2022.9937643
https://doi.org/10.1109/iscas48785.2022.9937643
Autor:
Eslam Yahya Tawfik, Sayed Elgendy
Publikováno v:
ISCAS
FPGA-based designs dominate many applications for their faster implementation, configurability, and low design cost. These applications need a root of trust to be secured against malicious activities. Physical unclonable functions (PUF) are promising
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2befd41a97b25db9d6f58a71033d76a7
https://doi.org/10.1109/iscas51556.2021.9401140
https://doi.org/10.1109/iscas51556.2021.9401140
Autor:
Waleed Khalil, Eslam Yahya Tawfik
Publikováno v:
Emerging Topics in Hardware Security ISBN: 9783030644475
Asynchronous circuits are increasingly used as an efficient countermeasure for a wide range of threats in the microelectronics industry. This chapter provides a tutorial on the basic concepts of asynchronous design, with an elaboration on their poten
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c88b4c47bca81b6ab20a77b16b5a091d
https://doi.org/10.1007/978-3-030-64448-2_19
https://doi.org/10.1007/978-3-030-64448-2_19
Publikováno v:
IEEE Transactions on Circuits and Systems I: Regular Papers. 65:1909-1918
Nowadays, the high power density and the process, voltage, and temperature variations became the most critical issues that limit the performance of the digital integrated circuits because of the continuous scaling of the fabrication technology. Dynam
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::82577efbbdf4efd6f4c841433c30b043
https://doi.org/10.1109/tcsi.2017.2771821
https://doi.org/10.1109/tcsi.2017.2771821
Publikováno v:
ISCAS
To protect intellectual property, hardware obfuscation is necessary to conceal the implemented function. Besides logic-level approaches, hardware obfuscation can be done through algorithmic modifications. Prior algorithmic obfuscations address signal
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b600ed01e2fad0865f211bde4eb76705
https://doi.org/10.1109/iscas.2019.8702285
https://doi.org/10.1109/iscas.2019.8702285
Publikováno v:
IEEE Transactions on Circuits and Systems II: Express Briefs. 63:1069-1073
The reliability of the synchronous circuits is a critical issue due to the continuous scaling of the fabrication technology. Process, voltage, and temperature (PVT) variations increase the probability of violating the timing constraints. Different te
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::57264d5a7e0b6ec4c8f3939f34443e2d
https://doi.org/10.1109/tcsii.2016.2548261
https://doi.org/10.1109/tcsii.2016.2548261
Publikováno v:
Microelectronics Journal. 46:1291-1303
In this paper, a novel library-based macro-modeling technique is developed to extract equivalent RLGC model which is spice compatible for TSV arrays of any size N×M. The built model accounts for Through Silicon Via (TSV) parasitic dependence on the
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f9bba6a8372f5d43020157d7a756a581
https://doi.org/10.1016/j.mejo.2015.10.005
https://doi.org/10.1016/j.mejo.2015.10.005
Publikováno v:
Embedded Multi-Core Systems ISBN: 9781439829110
Power management techniques; Controlling uncertainty and handling process variability; Data synchronization in GALS system; Conclusions; Glossary
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::2acca5fc9e6476a75d413532bdc6bf4e
https://doi.org/10.1201/9781315217826-15
https://doi.org/10.1201/9781315217826-15