Zobrazeno 1 - 10
of 13
pro vyhledávání: '"Erin E. Flater"'
Autor:
Erin E. Flater, Saurabh Gupta, William A Hudson, Abbigail A Fahrenkamp, Arya C. Mugdha, Jason P. Killgore, Jesse W. Wilson
Publikováno v:
Measurement Science and Technology. 31:115009
In contact resonance force microscopy and related dynamic atomic force microscopy methods, an accurate description of the real-time cantilever dynamics is essential to the mapping of local material properties, such as viscoelasticity, piezo response,
Autor:
George E. Zacharakis-Jutz, Charles A. Clifford, Braulio Dumba, Erin E. Flater, Isaac A. White
Publikováno v:
Ultramicroscopy. 146:130-143
Quantitative determination of the geometry of an atomic force microscope (AFM) probe tip is critical for robust measurements of the nanoscale properties of surfaces, including accurate measurement of sample features and quantification of tribological
Autor:
Jayse M Weaver, Subarna Khanal, W. Robert Ashurst, Erin E. Flater, Aimee R Poda, N. Ansari, Jared D Barnes, Jesse A Hitz Graff, Tevis D. B. Jacobs
Publikováno v:
Review of Scientific Instruments. 89:113708
Sliding wear is particularly problematic for micro- and nano-scale devices and applications, and is often studied at the small scale to develop practical and fundamental insights. While many methods exist to measure and quantify the wear of a sliding
Publikováno v:
Langmuir. 23:9242-9252
We use atomic force microscopy (AFM) to determine the frictional properties of nanoscale single-asperity contacts involving octadecyltrichlorosilane (OTS) monolayers and silicon. Quantitative AFM measurements in the wearless regime are performed usin
Publikováno v:
Wear. 260:580-593
Friction and wear are major limiting factors for the development and commercial implementation of devices fabricated by surface micromachining techniques. These tribological properties are studied using a polycrystalline silicon nanotractor device, w
Autor:
Mark D. Street, M. J. Starr, Can K. Bora, Erin E. Flater, Robert W. Carpick, Michael E. Plesha, James M. Redmond
Publikováno v:
Tribology Letters. 19:37-48
Investigation of contact and friction at multiple length scales is necessary for the design of surfaces in sliding microelectromechanical system (MEMS). A method is developed to investigate the geometry of summits at different length scales. Analysis
Publikováno v:
Journal of Adhesion Science and Technology. 19:291-311
Over the last 15 years, researchers have applied theories of continuum contact mechanics to nanotribology measurements to determine fundamental parameters and processes at play in nanometer-scale contacts. In this paper we discuss work using the atom
Publikováno v:
JOM. 56:48-52
This paper present a study of contact, adhesion, and friction for nanoasperities using atomic-force microscopy. Proportionality was observed between friction and true contact area, as well as agreement with continuum mechanics models at the nanometer
Publikováno v:
ICMENS
A classical mechanistic model was developed to capture the existence of pre-sliding tangential deflection (PSTD) in contacting polysilicon and coated polysilicon surfaces. For the purposes of modeling asperity friction, experiments have shown, and be
Autor:
William R. Ashurst, Maarten P. de Boer, Fernando Bitsie, Mark D. Street, Anton Hartono Sumali, Robert W. Carpick, Bonnie R. Antoun, Reese E. Jones, Earl David Reedy, Ghatu Subhash, Michael James Starr, Alex David Corwin, Erin E. Flater, James M. Redmond
The primary goals of the present study are to: (1) determine how and why MEMS-scale friction differs from friction on the macro-scale, and (2) to begin to develop a capability to perform finite element simulations of MEMS materials and components tha
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::844c0c86a3b521a869dba4b5f553ba76
https://doi.org/10.2172/919635
https://doi.org/10.2172/919635