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pro vyhledávání: '"Erik C. Dillingham"'
Autor:
Ronald D. Schrimpf, David Cardoza, Erik C. Dillingham, Nathan P. Wells, Stephen LaLumondiere, Adam C. Scofield, Petras Karuza, J. P. Bonsall, William T. Lotshaw, Andrew L. Sternberg, Dale Brewe, Steven C. Moss
Publikováno v:
IEEE Transactions on Nuclear Science. 65:478-485
We demonstrate the utility of focused, pulsed X-rays for investigating localized total ionizing dose effects in bipolar analog integrated circuits. Using the LM139 comparator as a test vehicle, we show how the technique can be used to identify the so
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d227f645f211ba06470243918d39dd35
https://doi.org/10.1109/tns.2017.2780827
https://doi.org/10.1109/tns.2017.2780827
