Zobrazeno 1 - 10
of 96
pro vyhledávání: '"Erich Kubalek"'
Autor:
Erich Kubalek, K. Löhnert
Publikováno v:
Microscopy of Semiconducting Materials, 1983
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f563ca8c8798e65c1f1cc3fd1e802e28
https://doi.org/10.1201/9781003069614-46
https://doi.org/10.1201/9781003069614-46
Publikováno v:
Microscopy of Semiconducting Materials, 1983
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ba44ea3b8d9a7aa7c323c1e8de431c31
https://doi.org/10.1201/9781003069614-63
https://doi.org/10.1201/9781003069614-63
Publikováno v:
Microelectronics Reliability. 43:1633-1638
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::14b0f840d4e4ae97ef5175048611a1de
https://doi.org/10.1016/s0026-2714(03)00287-7
https://doi.org/10.1016/s0026-2714(03)00287-7
Publikováno v:
Microelectronics Reliability. 42:1695-1700
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0641d6fbe11da56955091f036e1d5c37
https://doi.org/10.1016/s0026-2714(02)00214-7
https://doi.org/10.1016/s0026-2714(02)00214-7
Publikováno v:
Journal of Crystal Growth. 223:456-460
Quaternary GaInAsSb epilayer was grown by MOCVD on GaSb substrate, and the crystalline state and mismatch relaxation are studied by scanning transmission electron microscopy (STEM), bright field images and convergent beam electron diffraction (CBED)
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::247fb8f1cf2e92c4a35083d83e8a5026
https://doi.org/10.1016/s0022-0248(01)00616-9
https://doi.org/10.1016/s0022-0248(01)00616-9
Publikováno v:
Microelectronics Reliability. 40:1401-1406
Electric force microscopy (EFM) testing is a new contact-less, circuit internal test technique for function and failure analysis of integrated circuits (ICs), which combines both high temporal and high spatial resolution. Thus, EFM testing is a promi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b73696d52933f40e2437239a2b641dff
https://doi.org/10.1016/s0026-2714(00)00167-0
https://doi.org/10.1016/s0026-2714(00)00167-0
Publikováno v:
Microelectronics Reliability. 40:1389-1394
A magnetic force microscopy (MFM) based current contrast imaging (CCI) test-system is a promising tool for advanced contactless circuit internal function and failure analysis of integrated circuits (IC). Contactless current images of 2μm wide interc
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1d36437cc6db0c06b900dae9300ae2d5
https://doi.org/10.1016/s0026-2714(00)00158-x
https://doi.org/10.1016/s0026-2714(00)00158-x
Publikováno v:
Microelectronics Reliability. 39:969-974
Electric force microscopy (EFM) testing is a promising tool for contact-less circuit internal function and failure analysis of integrated circuits (IC). Up to now several EFM-test techniques have been developed and their efficiency was mostly demonst
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::52c7bf5b0b54260dac6c71e5dbcba2c2
https://doi.org/10.1016/s0026-2714(99)00132-8
https://doi.org/10.1016/s0026-2714(99)00132-8
Publikováno v:
Microelectronics Reliability. 39:975-980
A new probe for scanning force microscope testing of i ntegrated c ircuits (IC) was developed enabling both investigation of topography and contactless current detection in conducting lines via evaluation of the magnetic field due to the currents by
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3890f7b697f47eb52fedb9721d94a226
https://doi.org/10.1016/s0026-2714(99)00133-x
https://doi.org/10.1016/s0026-2714(99)00133-x
Publikováno v:
Microelectronics Reliability. 39:951-956
Recently, a High Frequency-Electric Force Microscope (HF-EFM) test system has been successfully used for contactless testing of internal electric signals in Monolithic Microwave Integrated Circuits (MMIC). Measurements up to operating frequencies of
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::69f3f374d59a51918e7def136d5f0a11
https://doi.org/10.1016/s0026-2714(99)00129-8
https://doi.org/10.1016/s0026-2714(99)00129-8