Zobrazeno 1 - 10
of 24
pro vyhledávání: '"Eric S. Windsor"'
Publikováno v:
Surface and Interface Analysis. 50:889-896
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::05329eb597ba097f910c7890fd6d7e1d
https://doi.org/10.1002/sia.6509
https://doi.org/10.1002/sia.6509
Autor:
Tim Barr, Scott A. Wight, Marlon L. Walker, Jennifer R. Verkouteren, Marcela N. Najarro, Eric S. Windsor, Matthew E. Staymates, Aaron Urbas, Greg Gillen
Publikováno v:
Sensors, Vol 15, Iss 11, Pp 29618-29634 (2015)
Sensors (Basel, Switzerland)
Sensors
Volume 15
Issue 11
Pages 29618-29634
Sensors (Basel, Switzerland)
Sensors
Volume 15
Issue 11
Pages 29618-29634
A method has been developed to fabricate patterned arrays of micrometer-sized monodisperse solid particles of ammonium nitrate on hydrophobic silicon surfaces using inkjet printing. The method relies on dispensing one or more microdrops of a concentr
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::3d1fd969a5a47f0d921d019ec6a1f5f3
https://doi.org/10.3390/s151129618
https://doi.org/10.3390/s151129618
Autor:
Sanyuan Yang, Gordon J. Kennedy, W.G. Borghard, Robert A. Fletcher, Anthony F. Marlow, T.W. Vetter, John R. Sieber, Jennifer R. Verkouteren, Alexandra Navrotsky, M.G. Moreno-Ramirez, Rolf Zeisler, Stefan D. Leigh, J.F. Kelly, Mark E. Davis, Brian H. Toby, Shirley Turner, Eric S. Windsor
Publikováno v:
Microporous and Mesoporous Materials. 107:252-267
Zeolites have important industrial applications including use as catalysts, molecular sieves and ion exchange materials. In this study, three zeolite materials have been characterized by the National Institute of Standards and Technology (NIST) as re
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b77fabb7eee6ac70f7ddec958d264309
https://doi.org/10.1016/j.micromeso.2007.03.019
https://doi.org/10.1016/j.micromeso.2007.03.019
Autor:
James D. Batteas, Eric S. Windsor, Kyung Joong Kim, Peter H. Chi, Jennifer R. Verkouteren, Albert J. Fahey, Greg Gillen, John A. Small, Chris A. Michaels
Publikováno v:
Applied Surface Science. 252:6521-6525
A C60+ primary ion source has been coupled to an ion microscope secondary ion mass spectrometry (SIMS) instrument to examine sputtering of silicon with an emphasis on possible application of C60+ depth profiling for high depth resolution SIMS analysi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c74a2c35d5ec8a4d3d16c6a085e4600d
https://doi.org/10.1016/j.apsusc.2006.02.234
https://doi.org/10.1016/j.apsusc.2006.02.234
Publikováno v:
Journal of Research of the National Institute of Standards and Technology
Copper oxide has been detected in the copper containing alloys of NBS Standard Reference Material (SRM) 482. This occurrence is significant because it represents heterogeneity within a standard reference material that was certified to be homogeneous
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::611eeb4356cee25253a6a521fafe87a1
http://europepmc.org/articles/PMC4863857
http://europepmc.org/articles/PMC4863857
Publikováno v:
Powder Diffraction. 17:196-201
A simple ashing procedure for a mixture containing kaolinite and chrysotile is described that converts kaolinite to amorphous metakaolinite while retaining the diffraction intensity of chrysotile. This ashing procedure removes the X-ray diffraction (
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::83b8ae3cc9d8b57ca81ca82f8a0e467f
https://doi.org/10.1154/1.1481038
https://doi.org/10.1154/1.1481038
Autor:
Eric S. Windsor, Greg Gillen, Anna Bloom, Marcela N. Najarro, Bruce A. Benner, Richard Lareau, Robert A. Fletcher
Publikováno v:
Analytical chemistry. 82(20)
The feasibility of the use of piezoelectric drop-on-demand inkjet printing to prepare test materials for trace explosive analysis is demonstrated. RDX (1,3,5-trinitro-1,3,5 triazcyclohexane) was formulated into inkjet printable solutions and jetted o
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::d09ff947b0a4974852221fb0141789ac
https://pubmed.ncbi.nlm.nih.gov/20873797
https://pubmed.ncbi.nlm.nih.gov/20873797
Autor:
James D. Batteas, Eric S. Windsor, Greg Gillen, Albert J. Fahey, Peter H. Chi, David S. Bright
Publikováno v:
AIP Conference Proceedings.
We are evaluating methods to improve depth resolution for SIMS analyses of semiconductors. Two methods that show promise are: (1) backside depth profile analysis and (2) the use of cluster primary ion beams. Backside analysis improves depth resolutio
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::283d48caec42f8c62a6fa0b7c530e2b9
https://doi.org/10.1063/1.2062988
https://doi.org/10.1063/1.2062988
Autor:
Jennifer R. Verkouteren, Scott A. Wight, D. B. Fenner, Eric S. Windsor, Peter H. Chi, Albert J. Fahey, Greg Gillen
Publikováno v:
AIP Conference Proceedings.
We are evaluating the use of bevel depth profiling Secondary Ion Mass Spectrometry (SIMS) for the characterization of layered semiconductor materials. In this procedure, a sub‐degree angle bevel is cut into the analytical sample with an oxygen or c
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::724e18b404d25ed2e9c703fc645cbecf
https://doi.org/10.1063/1.1622549
https://doi.org/10.1063/1.1622549