Zobrazeno 1 - 2
of 2
pro vyhledávání: '"Eric S. Fisher"'
Autor:
James H. Mosher, William B. Lyons, Steven Fortune, Suresh Goyal, Martin K. Gladstein, Gordon Wilfong, Eric S. Fisher
Publikováno v:
Bell Labs Technical Journal. 12:161-173
As electronic products become feature-rich, the amount of manufacturing testing required grows rapidly. This is further compounded because products made with components from several vendors, and in factories distributed all over the world, have simil
Autor:
Steven Fortune, Martin K. Gladstein, James H. Mosher, William B. Lyons, Eric S. Fisher, Suresh Goyal, Gordon Wilfong
Publikováno v:
Bell Labs Technical Journal. 12:175-186
A mathematical model for general manufacturing test strategies is described in a companion paper in this issue. Any given test strategy, or test and repair network, is represented as a directed graph with various node attributes. The nodes represent