Zobrazeno 1 - 9
of 9
pro vyhledávání: '"Eric Pieraerts"'
Autor:
Mickael Pommier, K Katarzyna Nowak, S Iochem, Sophie Ledain, Eric Pieraerts, L Guiraud, Henk Jan Bergveld, Jorge Ferreira, Catherine Bunel, F. Le Cornec, Fred Roozeboom
Publikováno v:
Procedia Chemistry. 1:1435-1438
This paper addresses silicon-based integration of passive components applied to 3D integration with dies of other technologies within one package. Particularly, the development of high-density trench capacitors has enabled the realization of small-fo
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::b30dd400a2136dd37b889918e6276acc
https://doi.org/10.1016/j.proche.2009.07.358
https://doi.org/10.1016/j.proche.2009.07.358
Publikováno v:
Embedded Mechatronic Systems 2
Embedded Mechatronic Systems 2, Elsevier, pp.49-77, 2015, ⟨10.1016/B978-1-78548-014-0.50003-7⟩
Embedded Mechatronic Systems 2, Elsevier, pp.49-77, 2015, ⟨10.1016/B978-1-78548-014-0.50003-7⟩
This chapter presents the failure analysis methods used for mechatronics systems. The advantages and disadvantages of resin and ceramic casing opening methods are described as well as the use precautions which are required to maintain the functional
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::ad33b3fd0204ee443f12c34de8d9e46a
https://hal.science/hal-02130929
https://hal.science/hal-02130929
Autor:
Bouzid Ait Amir, Jean-Loup Alvarez, Younes Aoues, Christian Chong, Pierre Richard Dahoo, Karine Dehais-Mourgues, Pascal Dherbecourt, Cédric Duperrier, Abdelkhalak El Hami, Jean-Baptiste Fonder, Christian Gautier, Armelle Girard, Malika Khettab, Olivier Latry, Hichame Maanane, Abderahman Makhloufi, Eric Pieraerts, Philippe Pougnet, Jean-Pierre Sipma, Farid Temcamani
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::bf251089899c8181758439ad3351538e
https://doi.org/10.1016/b978-1-78548-014-0.50012-8
https://doi.org/10.1016/b978-1-78548-014-0.50012-8
Autor:
Ravi Karadi, Mickael Pommier, Sebastien Iochem, Jorge Ferreira, Sophie Ledain, K Katarzyna Nowak, Henk Jan Bergveld, Eric Pieraerts
Publikováno v:
Proc. IEEE Energy Conversion Congress and Exposition (ECCE'09), San Jose, USA, 20-24 Sept. 2009, 3698-3705
STARTPAGE=3698;ENDPAGE=3705;TITLE=Proc. IEEE Energy Conversion Congress and Exposition (ECCE'09), San Jose, USA, 20-24 Sept. 2009
STARTPAGE=3698;ENDPAGE=3705;TITLE=Proc. IEEE Energy Conversion Congress and Exposition (ECCE'09), San Jose, USA, 20-24 Sept. 2009
The increasing number of efficient voltage conversions realized in small volumes in many applications has introduced a trend towards small-form-factor DC-DC converters with integrated passives. Preferably, the DC-DC converter is integrated with the l
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::0f77a9288463318eef92821b8b2107fc
https://doi.org/10.1109/ecce.2009.5316334
https://doi.org/10.1109/ecce.2009.5316334
Publikováno v:
2008 IEEE Power Electronics Specialists Conference; 2008, p3335-3341, 7p
Publikováno v:
Proceedings of the 23rd European Solid-State Circuits Conference; 1997, p292-295, 4p
Autor:
Abdelkhalak El Hami, Philippe Pougnet
Embedded Mechatronic Systems 2: Analysis of Failures, Modeling, Simulation and Optimization presents advances in research within the field of mechatronic systems, which integrates reliability into the design process. Providing many detailed examples,
Autor:
Abdelkhalak El Hami, Philippe Pougnet
In operation, mechatronics embedded systems are stressed by loads of different causes: climate (temperature, humidity), vibration, electrical and electromagnetic. These stresses in components which induce failure mechanisms should be identified and m
Embedded Mechatronic Systems, Volume 2 : Analysis of Failures, Modeling, Simulation and Optimization
Autor:
Abdelkhalak El Hami, Philippe Pougnet
In operation, mechatronics embedded systems are stressed by loads of different causes: climate (temperature, humidity), vibration, electrical and electromagnetic. These stresses in components induce failure mechanisms should be identified and modeled