Zobrazeno 1 - 10
of 69
pro vyhledávání: '"Eric Lorfevre"'
Autor:
Fabien Widmer, Delphine Lagarde, Pierre Calvel, Xavier Marie, Eric Lorfevre, N. Chatry, M. Mauguet, R. Marec, Francoise Bezerra
Publikováno v:
IEEE Transations on Nuclear Science
Conference on Radiation and Its Effects on Components and Systems
Conference on Radiation and Its Effects on Components and Systems, Oct 2017, Genève, Switzerland. pp.8, ⟨10.1109/TNS.2018.2813096⟩
Conference on Radiation and Its Effects on Components and Systems
Conference on Radiation and Its Effects on Components and Systems, Oct 2017, Genève, Switzerland. pp.8, ⟨10.1109/TNS.2018.2813096⟩
International audience; This paper is dedicated to the investigation of single-event effects (SEEs) in different types of silicon Schottky diodes using heavy ions and laser pulses. The objectives are both to progress in heavy ions and laser correlati
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::bda24d5e524df3e658070e5c25a4757a
https://hal.inrae.fr/hal-02738159
https://hal.inrae.fr/hal-02738159
Autor:
Jason Dardié, Frédéric Wrobel, Antoine Touboul, A. Michez, Francoise Bezerra, T. Maraine, Jerome Boch, Eric Lorfevre, Frédéric Saigné
Publikováno v:
IEEE RADECS
IEEE RADECS, 2017, Genève, Switzerland
IEEE RADECS, 2017, Genève, Switzerland
Response to Total Ionizing Dose of a component varies widely depending on applied bias, temperature and dose rate. Thus testing a component that will be used in radiative environment implies to experimentally check all the combinations of these param
Autor:
L. Gouyet, Robert Ecoffet, P. Pourrouquet, A. Samaras, Francoise Bezerra, N. Chatry, Eric Lorfevre, N. Sukhaseum, B. Vandevelde
Publikováno v:
IEEE Transactions on Nuclear Science. 61:3055-3060
This paper presents the single-event upset characterization of a commercial field programmable gate array (FPGA) using electron radiation. FPGA radiation test results under high energy electrons are described and the dependence between electron energ
Autor:
Daniel Boscher, Robert Ecoffet, P. Bourdoux, T. Baldran, S. Bourdarie, Vincent Maget, G. Rolland, Thomas E. Cayton, Didier Lazaro, Eric Lorfevre
Publikováno v:
IEEE Transactions on Nuclear Science. 61:3395-3400
Measurements of the ICARE-NG/CARMEN-1 (Influence sur les Composants Avances des Radiations de l'Espace-Nouvelle Generation/CARacterisatin et Modelisation de l'Environnement spatial) detector on board the low Earth orbit Argentinean satellite SAC-D ar
Autor:
Eric Lorfevre, Vincent Maget, S. Bourdarie, Didier Lazaro, Daniel Boscher, Robert Ecoffet, G. Rolland
Publikováno v:
IEEE Transactions on Nuclear Science. 61:1687-1694
This paper presents an enhanced approach to extract as much as possible information from raw measurements of a given solid-state detector. Here we focus on the benefits of a singular value decomposition approach applied to the special case of the CNE
Autor:
Sebastien Bourdarie, Eric Lorfevre, A. Sicard-Piet, Daniel Boscher, G. Rolland, Didier Lazaro, Robert Ecoffet
Publikováno v:
IEEE Transactions on Nuclear Science. 61:1671-1678
In the frame of the ONERA-CNES CRATERRE project, which aims to organize studies around radiation belt specification models, the local database Ionizing Particle ONERA Database (IPODE), gathering measurements from many radiation detectors, is presente
Autor:
J.-R. Vaille, Andre Touboul, Frédéric Saigné, S. Bourdarie, A. Privat, G. Chaumont, A. Michez, Richard Arinero, Frédéric Wrobel, N. Chatry, Eric Lorfevre
Publikováno v:
IEEE Transactions on Nuclear Science
IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2013, 60 (6), pp.4166-4174. ⟨10.1109/TNS.2013.2287974⟩
IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2013, 60 (6), pp.4166-4174. ⟨10.1109/TNS.2013.2287974⟩
Electrical characterizations are used to understand power MOSFETs failure mechanisms after heavy ion irradiation. Results indicate that both bias levels and impact localization of heavy ion are important parameters for SEGR triggering or latent defec
Autor:
Antoine Touboul, Vincent Pouget, Luigi Dilillo, Frédéric Saigné, Eric Lorfevre, Frédéric Wrobel
Publikováno v:
IEEE Transactions on Nuclear Science
IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2016, 64 (1), pp.427-433. ⟨10.1109/TNS.2016.2608004⟩
NSREC: Nuclear and Space Radiation Effects Conference
NSREC: Nuclear and Space Radiation Effects Conference, IEEE NPSS (Nuclear & Plasma Sciences Society ), Jul 2016, Portland, United States
IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2016, 64 (1), pp.427-433. ⟨10.1109/TNS.2016.2608004⟩
NSREC: Nuclear and Space Radiation Effects Conference
NSREC: Nuclear and Space Radiation Effects Conference, IEEE NPSS (Nuclear & Plasma Sciences Society ), Jul 2016, Portland, United States
International audience; Instead of using encapsulated sensitive volumes to simulate charge collection during single event upset (SEU) mechanism, we use continuous variation of the charge collection in the device. Basically, the collection efficiency
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::5045272ea9a2bde96844e273c560f229
https://hal-lirmm.ccsd.cnrs.fr/lirmm-01382480
https://hal-lirmm.ccsd.cnrs.fr/lirmm-01382480
Autor:
Eric Lorfevre, S. Bourdarie, D. Falguere, Christian Poivey, Denis Standarovski, Christophe Inguimbert, Jean-Roch Vaillé, Robert Ecoffet, A. Sicard-Piet
Publikováno v:
RADECS 2016
RADECS 2016, Sep 2016, BREME, Germany
IEEE Transactions on Nuclear Science
IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2017, 64 (8), pp.2023-2030. ⟨10.1109/TNS.2017.2654687⟩
RADECS 2016, Sep 2016, BREME, Germany
IEEE Transactions on Nuclear Science
IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2017, 64 (8), pp.2023-2030. ⟨10.1109/TNS.2017.2654687⟩
International audience; In-flight feedback data are collected, such as displacement damage doses, ionizing doses, and cumulated Single Event upset (SEU) on board various space vehicles and are compared to predictions performed with: proton measuremen
Autor:
J. Guillermin, David Dangla, A. Rousset, L. Gouyet, R. Gaillard, Eric Lorfevre, N. Chatry, N. Sukhaseum, B. Vandevelde
Publikováno v:
2016 16th European Conference on Radiation and Its Effects on Components and Systems (RADECS).
The work presented here investigates the impact of multiple write cycles on NAND Flash memory radiation sensitivity. Cobalt 60 tests have been performed in order to study the memory array data corruption evolution with respect to the TID level. Heavy