Zobrazeno 1 - 5
of 5
pro vyhledávání: '"Eric Lattner"'
Publikováno v:
Journal of Materials Research and Technology, Vol 12, Iss , Pp 2383-2395 (2021)
Ti/Al multilayer films with a total thickness of 200 nm were deposited on the high-temperature (HT) stable piezoelectric Ca3TaGa3Si2O14 (CTGS) as well as on thermally oxidized Si (SiO2/Si) reference substrates. The Ti–Al films were characterized re
Externí odkaz:
https://doaj.org/article/0750b3908ae640c489f441b86b6ec1f1
Publikováno v:
Materials, Vol 13, Iss 9, p 2039 (2020)
Ti-Al thin films with a thickness of 200 nm were prepared either by co-sputtering from elemental Ti and Al targets or as Ti/Al multilayers with 10 and 20 nm individual layer thickness on thermally oxidized Si substrates. Some of the films were covere
Externí odkaz:
https://doaj.org/article/0e83a17a2e5845a0873a32fad7b82a10
Publikováno v:
Surface and Interface Analysis. 52:924-928
Publikováno v:
Surface and Interface Analysis. 50:991-995
Publikováno v:
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films. 35:061603
Intermetallic phases of binary material systems, such as TiAl, Ti3Al, RuAl, and Ni3Al have special physical properties such as a high oxidation resistance and low creep at high temperatures and a mechanical stability over wide temperature ranges. Due