Zobrazeno 1 - 10
of 44
pro vyhledávání: '"Eric J. Stewart"'
Autor:
Kathrin Fenn, Philip Strandwitz, Eric J. Stewart, Eric Dimise, Sarah Rubin, Shreya Gurubacharya, Jon Clardy, Kim Lewis
Publikováno v:
Microbiome, Vol 5, Iss 1, Pp 1-11 (2017)
Abstract Background The human gut microbiome has been linked to numerous components of health and disease. However, approximately 25% of the bacterial species in the gut remain uncultured, which limits our ability to properly understand, and exploit,
Externí odkaz:
https://doaj.org/article/c38bf6302b354e76b9b6e8cd2cbd8b16
Autor:
Shamima Afroz, Eric J. Stewart, Sara Taylor, Josephine B. Chang, Robert S. Howell, Ken Nagamatsu, Kevin Frey, Shalini Gupta, Sarat Saluru, Jordan Merkel
Publikováno v:
IEEE Electron Device Letters. 40:1048-1051
We report on the super-lattice castellated field-effect transistor (SLCFET) device architecture whose unique geometry enables new scaling and optimization strategies for RF power and performance. Measured transistor values show excellent potential fo
Autor:
Asama Lekbua, Philip Strandwitz, Rob Knight, Marc J. Dubin, Jack A. Gilbert, Conor Liston, Darya Terekhova, Karsten Zengler, Ki Hyun Kim, Jennifer Levering, Anukriti Sharma, Timothy R. Ramadhar, Nader Mroue, Jon Clardy, Joanne K. Liu, Eric J. Stewart, David Dietrich, Kim Lewis, Daniel McDonald
Publikováno v:
Nature microbiology
The gut microbiota affects many important host functions, including the immune response and the nervous system1. However, while substantial progress has been made in growing diverse microorganisms of the microbiota2, 23-65% of species residing in the
Publikováno v:
PLoS Biology, Vol 3, Iss 2, p e45 (2005)
In macroscopic organisms, aging is often obvious; in single-celled organisms, where there is the greatest potential to identify the molecular mechanisms involved, identifying and quantifying aging is harder. The primary results in this area have come
Externí odkaz:
https://doaj.org/article/64631d8e67274ef6b8a6fbe7ee91774f
Autor:
Eric J. Stewart, Josephine B. Chang, Ken Nagamatsu, Kevin Frey, Jeffrey Hartman, Georges Siddiqi, Brian Novak, Karen Renaldo, Annaliese Drechsler, Robert S. Howell, Patrick B. Shea, Shamima Afroz, Sam Wanis, Ron Freitag, Shalini Gupta, Dale Dawson, Monique J. Farrell
Publikováno v:
BCICTS
This report describes the second generation (Gen2) of the Superlattice Castellated Field Effect Transistor (SLCFET) amplifier. The SLCFET amplifier is a new device that uses 3-dimensional device geometry to modulate a superlattice of multiple AlGaN/G
Balanced transcription of cell division genes inBacillus subtilisas revealed by single cell analysis
Publikováno v:
Environmental Microbiology. 15:3196-3209
Cell division in bacteria is carried out by a set of conserved proteins that all have to function at the correct place and time. A cell cycle-dependent transcriptional programme drives cell division in bacteria such as Caulobacter crescentus. Whether
Autor:
Robert S. Howell, Karen Renaldo, Shalini Gupta, Justin Parke, Bettina Nechay, Ishan Wathuthanthri, Pavel Borodulin, Megan Snook, Ron Freitag, H. George Henry, Matt King, Eric J. Stewart, Matt Torpey
Publikováno v:
2016 IEEE Compound Semiconductor Integrated Circuit Symposium (CSICS).
FET-based switched filters do not occupy a large space in the literature due to the high loss of the switches relative to other technologies. The Super-Lattice Castellated Field Effect Transistor (SLCFET) is a low loss, high isolation, broadband RF s
Autor:
H. George Henry, Shalini Gupta, Matthew R. King, Ishan Wathuthanthri, Ron Freitag, Parrish Ralston, Eric J. Stewart, Megan Snook, Robert S. Howell, Justin Parke, Bettina Nechay
Publikováno v:
2016 IEEE MTT-S International Microwave Symposium (IMS).
The Super-Lattice Castellated Field Effect Transistor (SLCFET) uses a super-lattice in the channel region to form multiple parallel current paths in conjunction with castellations etched into that super-lattice to provide a sidewall gate structure. T
Autor:
Victor Veliadis, Damian Urciuoli, Aivars J. Lelis, Eric J. Stewart, Joshua D. Caldwell, Harold Hearne, Charles Scozzie, Robert S. Howell, Megan Snook, Wendi Chang
Publikováno v:
Materials Science Forum. :1013-1016
Electron-hole recombination-induced stacking faults have been shown to degrade the electrical characteristics of SiC power pin and MPS diodes and DMOSFETs with thick drift epitaxial layers. In this paper, we investigate the effects of bipolar injecti
Autor:
Stephen Van Campen, R. Christopher Clarke, Jonathan Hawk, Robert M. Young, Harvey C. Nathanson, Robert S. Howell, Bettina Nechay, Eric J. Stewart, Eric M. Graves, Scott B. Miserendino, Timothy T. Braggins
Publikováno v:
Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena. 28:1060-1065
The authors demonstrate for the first time the injection of electrons across an n-type to p-type silicon junction and their subsequent tunneling from approximately 1 μm tall p-type silicon points into a vacuum gap. The diffusive flow of these minori