Zobrazeno 1 - 7
of 7
pro vyhledávání: '"Eric Bonnotte"'
Autor:
Hiroyuki Fujita, K. Worhoff, Ken-ya Hashimoto, Eric Bonnotte, Hiroshi Toshiyoshi, Hideki Kawakatsu, Christophe Gorecki
Publikováno v:
Journal of Lightwave Technology. 17:35-42
This paper presents the design and the realization of a novel integrated Mach-Zehnder interferometer (MZI) with heterodyne scheme. Well-controlled machining as well as ZnO thin-film transducer integration on the same Si substrate permits to transform
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ab086b07ca466e74f2c54f7c7e49be2c
https://doi.org/10.1109/50.737419
https://doi.org/10.1109/50.737419
Publikováno v:
SPIE Proceedings.
As a novel application of silicon-based integrated optics, the results of a compact Mach-Zehnder interferometer are presented. The deposition of a ZnO thin-film transducer on the reference arm of the interferometer transforms this optically passive d
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0be6988000b95c9082d9b241c3863d6d
https://doi.org/10.1117/12.311037
https://doi.org/10.1117/12.311037
Publikováno v:
SPIE Proceedings.
As a novel application of Silicon-based integrated optics, first result of a compact Mach-Zehnder interferometer are presented. This passive device is transformed into an active one by the deposition of a ZnO thin film transducer on the reference arm
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5e419a773c7aada67913f0a66f564603
https://doi.org/10.1117/12.293553
https://doi.org/10.1117/12.293553
Autor:
Eric Bonnotte, Fred Benoit, Christophe Gorecki, Hiroyuki Fujita, Hideki Kawakatsu, Hiroshi Toshioshi
Publikováno v:
SPIE Proceedings.
As a novelty application of Si-based integrated optics, the results of realization of a compact Mach-Zehnder interferometer will be presented. The deposition of a ZnO thin-film transducer on the reference arm of the interferometer will allow to trans
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::8ce2f84d621f969d0917f1a6ce588d72
https://doi.org/10.1117/12.281184
https://doi.org/10.1117/12.281184
Autor:
Eric Bonnotte, Luc Bornier, Patrick Delobelle, Laurent Robert, Bertrand Trolard, Gilbert Tribillon, D. Mairey
Publikováno v:
SPIE Proceedings.
A fringe projection method (contouring) is applied for the mechanical characterization of thin films by bulging tests. This method is then coupled with the technique of phase modulation (phase shifting interferometry) thus allowing the phase image of
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::60f6a30921556811f3fa438cd8ec78c5
https://doi.org/10.1117/12.250800
https://doi.org/10.1117/12.250800
Publikováno v:
SPIE Proceedings.
Center for Holographic Studies and Laser imechaTronicsDepartment of Mechanical EngineeringWorcester Polytechnic InstituteWorcester, MA 01609Gilbert Tribillon*Laboratojre d'Optique PM Duffleux25000 Besancon, France.Eric Bonnotte, Patrick Delobelle, an
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a7f0c26983f984c3a2cc103b29564874
https://doi.org/10.1117/12.245165
https://doi.org/10.1117/12.245165
Publikováno v:
SPIE Proceedings.
Holographic interferometry and contouring are two optical methods used for the characterization of mechanical properties of thin films. Therefore, a phase measurement interferometry applied to these methods is explained. These solutions are discussed
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::17d441e020b81ccd5ca746d49c664003
https://doi.org/10.1117/12.194321
https://doi.org/10.1117/12.194321