Zobrazeno 1 - 10
of 172
pro vyhledávání: '"Erdmann Frederick Schubert"'
Autor:
Seung Cheol Han, Jun Young Kim, Jae-sik Yoon, Jae-Kwan Kim, Ji-Myon Lee, Jong Kyu Kim, Erdmann Frederick Schubert, Dong-Min Lee
Publikováno v:
Journal of Nanoscience and Nanotechnology. 13:5715-5718
The electrical properties of Ni-based ohmic contacts to N-face p-type GaN were investigated. The specific contact resistance of N-face p-GaN exhibits a linear decrease from 1.01 omega cm2 to 9.05 x 10(-3) omega cm2 for the as-deposited and the anneal
Publikováno v:
Electronic Materials Letters. 10:1155-1157
Investigating the relationship between the breakdown voltage and the capacitance of GaInN light-emitting diodes (LEDs), we find that a lower capacitance due to weaker internal electric field in depletion region or wider depletion width at the pn junc
Autor:
Arya Chatterjee, Peter C. Wayner, Manas Ojha, Joel L. Plawsky, Frank W. Mont, Erdmann Frederick Schubert
Publikováno v:
International Journal of Heat and Mass Transfer. 53:910-922
We compared the phase change behavior of a partially wetting fluid, nonane, on various SiO2 surfaces that had been modified to alter their roughness at the nanoscale. We compared a total of four surfaces: an as-received, smooth surface; a surface rou
Autor:
Di Zhu, Min-Ho Kim, Yongjo Park, Erdmann Frederick Schubert, Jong Kyu Kim, Wonseok Lee, Martin F. Schubert
Publikováno v:
IEEE Journal of Selected Topics in Quantum Electronics. 15:1122-1127
GaInN-based multiple-quantum-well (MQW) blue LEDs with ternary GaInN barriers polarization-matched to GaInN wells are fabricated. Single-layered Ga0.9In0.1N and Ga0.9In0.1N/GaN multiple-layered quantum barriers (MLQBs) are used for 50% polarization m
Publikováno v:
physica status solidi (b). 244:3002-3008
The refractive index, a most fundamental quantity in optics and optoelectronics, determines many figures of merit of optical components such as reflectors, filters, and resonators. Here we present a new class of optical thin-film materials that have
Autor:
Theeradetch Detchprohm, Christian Wetzel, W. Zhao, Y. Xia, J. Senawiratne, Mingwei Zhu, Y. Li, Erdmann Frederick Schubert
Publikováno v:
physica status solidi c. 4:2784-2787
Department of Electrical, Computer, and Systems Engineering, Rensselaer, Troy, NY 12180, USA Received 19 September 2006, accepted 29 November 2006 Published online 31 May 2007 PACS 73.40.Kp, 73.61.Ey, 78.60.Hk, 78.67.De, 85.60.Jb The electroluminesce
Autor:
Y. Xi, W. Liu, Jong Kyu Kim, K. X. Chen, Christian Wetzel, Frank W. Mont, Erdmann Frederick Schubert, J. A. Smart, X. Li
Publikováno v:
Journal of Electronic Materials. 36:533-537
A systematic study is performed to optimize aluminum nitride (AlN) epilayers grown on (0001) sapphire by metal-organic vapor-phase epitaxy. Specifically, the impact of the AlN nucleation conditions on the crystalline quality and surface morphology of
Autor:
Erdmann Frederick Schubert, D. Johnstone, Ishwara B. Bhat, T.P. Chow, Jong Kyu Kim, Kodigala Subba Ramaiah
Publikováno v:
Physica B: Condensed Matter. 391:35-41
We have systematically studied C- and Si-face n -4H-SiC wafers before and after the growth of epitaxial layers using an optical Nomarski microscope (ONM) and an atomic force microscope (AFM). In particular, a number of defects such as micropipes, mic
Autor:
Mingwei Zhu, J. Senawiratne, Y. Li, Christian Wetzel, Erdmann Frederick Schubert, Y. Xi, W. Zhao, Theeradetch Detchprohm, Y. Xia
Publikováno v:
International Journal of High Speed Electronics and Systems. 17:29-33
We analyze GaInN based light emitting diodes emitting in the range of 400-550nm using a new intensity-quantitative spectroscopic cathodoluminescence mapping method. Spectroscopic information of arbitrary sample locations is generated from sequences o
Autor:
Christian Wetzel, Erdmann Frederick Schubert, D. Tsvetkov, Drew Hanser, Y. Xi, Mingwei Zhu, Lianghong Liu, Y. Li, Theeradetch Detchprohm, W. Zhao, Y. Xia
Publikováno v:
Journal of Crystal Growth. 298:272-275
We demonstrate homoepitaxial growth of GaInN/GaN-based light emitting diodes (LED) on quasi-bulk GaN with an atomically flat polished surface. The threading dislocation densities of the epitaxial layers were 2-5 x 10 8 cm -2 which was one order of ma