Zobrazeno 1 - 10
of 83
pro vyhledávání: '"Erdinger F"'
Autor:
Maffessanti S; Deutsches Elektronen-Synchrotron DESY, Notkestr. 85, 22607, Hamburg, Germany. stefano.maffessanti@desy.de., Hansen K; Deutsches Elektronen-Synchrotron DESY, Notkestr. 85, 22607, Hamburg, Germany., Aschauer S; PNSensor GmbH, 81739, Munich, Germany., Castoldi A; Dipartimento di Elettronica, Informazione e Bioingegneria, Politecnico di Milano, 20133, Milan, Italy.; Istituto Nazionale di Fisica Nucleare, Sezione di Milano, 20133, Milan, Italy., Erdinger F; EXTOLL GmbH, 68159, Mannheim, Germany., Fiorini C; Dipartimento di Elettronica, Informazione e Bioingegneria, Politecnico di Milano, 20133, Milan, Italy.; Istituto Nazionale di Fisica Nucleare, Sezione di Milano, 20133, Milan, Italy., Fischer P; Institute for Computer Engineering (ZITI), Heidelberg University, 69120, Heidelberg, Germany., Kalavakuru P; Deutsches Elektronen-Synchrotron DESY, Notkestr. 85, 22607, Hamburg, Germany., Klär H; European XFEL, Holzkoppel 4, 22869, Schenefeld, Germany., Manghisoni M; Dipartimento di Ingegneria e Scienze Applicate, Università di Bergamo, 24044, Dalmine, Italy.; Istituto Nazionale di Fisica Nucleare, Sezione di Pavia, 27100, Pavia, Italy., Reckleben C; Deutsches Elektronen-Synchrotron DESY, Notkestr. 85, 22607, Hamburg, Germany., Strüder L; PNSensor GmbH, 81739, Munich, Germany.; University of Siegen, 51228, Siegen, Germany., Porro M; European XFEL, Holzkoppel 4, 22869, Schenefeld, Germany.; Department of Molecular Sciences and Nanosystems, Ca' Foscari University of Venice, 30172, Venezia, Italy.
Publikováno v:
Scientific reports [Sci Rep] 2023 Jul 21; Vol. 13 (1), pp. 11799. Date of Electronic Publication: 2023 Jul 21.
Autor:
Le Guyader L; European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany., Eschenlohr A; Faculty of Physics and Center for Nanointegration Duisburg-Essen (CENIDE), University Duisburg-Essen, Lotharstrasse 1, 47057 Duisburg, Germany., Beye M; Deutsches Elektronen-Synchrotron DESY, Notkestrasse 85, 22607 Hamburg, Germany., Schlotter W; Linear Coherent Light Source, SLAC National Accelerator Lab, 2575 Sand Hill Rd, Menlo Park, CA 94025, USA., Döring F; Paul Scherrer Institute, 5232 Villigen PSI, Switzerland., Carinan C; European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany., Hickin D; European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany., Agarwal N; European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany., Boeglin C; Université de Strasbourg, CNRS, Institut de Physique et Chimie des Matériaux de Strasbourg, UMR 7504, F-67000 Strasbourg, France., Bovensiepen U; Faculty of Physics and Center for Nanointegration Duisburg-Essen (CENIDE), University Duisburg-Essen, Lotharstrasse 1, 47057 Duisburg, Germany., Buck J; Deutsches Elektronen-Synchrotron DESY, Notkestrasse 85, 22607 Hamburg, Germany., Carley R; European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany., Castoldi A; Politecnico di Milano, Dip. Elettronica, Informazione e Bioingegneria and INFN, Sezione di Milano, Milano, Italy., D'Elia A; IOM-CNR, Laboratorio Nazionale TASC, Basovizza SS-14, km 163.5, 34012 Trieste, Italy., Delitz JT; European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany., Ehsan W; European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany., Engel R; Deutsches Elektronen-Synchrotron DESY, Notkestrasse 85, 22607 Hamburg, Germany., Erdinger F; Institute for Computer Engineering, University of Heidelberg, Mannheim, Germany., Fangohr H; European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany., Fischer P; Institute for Computer Engineering, University of Heidelberg, Mannheim, Germany., Fiorini C; Politecnico di Milano, Dip. Elettronica, Informazione e Bioingegneria and INFN, Sezione di Milano, Milano, Italy., Föhlisch A; Institute for Methods and Instrumentation for Synchrotron Radiation Research (PS-ISRR), Helmholtz-Zentrum Berlin für Materialien und Energie GmbH (HZB), Albert-Einstein Straße 15, 12489 Berlin, Germany., Gelisio L; European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany., Gensch M; Institute of Optical Sensor Systems, DLR (German Aerospace Center), Rutherfordstrasse 2, 12489 Berlin, Germany., Gerasimova N; European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany., Gort R; European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany., Hansen K; Deutsches Elektronen-Synchrotron DESY, Notkestrasse 85, 22607 Hamburg, Germany., Hauf S; European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany., Izquierdo M; European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany., Jal E; Sorbonne Université, CNRS, Laboratoire de Chimie Physique-Matière et Rayonnement, LCPMR, 75005 Paris, France., Kamil E; European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany., Karabekyan S; European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany., Kluyver T; European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany., Laarmann T; Deutsches Elektronen-Synchrotron DESY, Notkestrasse 85, 22607 Hamburg, Germany., Lojewski T; Faculty of Physics and Center for Nanointegration Duisburg-Essen (CENIDE), University Duisburg-Essen, Lotharstrasse 1, 47057 Duisburg, Germany., Lomidze D; European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany., Maffessanti S; Deutsches Elektronen-Synchrotron DESY, Notkestrasse 85, 22607 Hamburg, Germany., Mamyrbayev T; Paul Scherrer Institute, 5232 Villigen PSI, Switzerland., Marcelli A; INFN - Laboratori Nazionali di Frascati, via Enrico Fermi 54, 00044 Frascati, Italy., Mercadier L; European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany., Mercurio G; European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany., Miedema PS; European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany., Ollefs K; Faculty of Physics and Center for Nanointegration Duisburg-Essen (CENIDE), University Duisburg-Essen, Lotharstrasse 1, 47057 Duisburg, Germany., Rossnagel K; Institute of Experimental and Applied Physics, Kiel University, 24098 Kiel, Germany., Rösner B; Paul Scherrer Institute, 5232 Villigen PSI, Switzerland., Rothenbach N; Faculty of Physics and Center for Nanointegration Duisburg-Essen (CENIDE), University Duisburg-Essen, Lotharstrasse 1, 47057 Duisburg, Germany., Samartsev A; European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany., Schlappa J; European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany., Setoodehnia K; European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany., Sorin Chiuzbaian G; Sorbonne Université, CNRS, Laboratoire de Chimie Physique-Matière et Rayonnement, LCPMR, 75005 Paris, France., Spieker L; Faculty of Physics and Center for Nanointegration Duisburg-Essen (CENIDE), University Duisburg-Essen, Lotharstrasse 1, 47057 Duisburg, Germany., Stamm C; Department of Materials, ETH Zürich, 8093 Zürich, Switzerland., Stellato F; Physics Department, University of Rome Tor Vergata and INFN-Sezione di Roma Tor Vergata, Via della Ricerca Scientifica 1, 00133 Roma, Italy., Techert S; Deutsches Elektronen-Synchrotron DESY, Notkestrasse 85, 22607 Hamburg, Germany., Teichmann M; European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany., Turcato M; European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany., Van Kuiken B; European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany., Wende H; Faculty of Physics and Center for Nanointegration Duisburg-Essen (CENIDE), University Duisburg-Essen, Lotharstrasse 1, 47057 Duisburg, Germany., Yaroslavtsev A; European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany., Zhu J; European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany., Molodtsov S; European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany., David C; Paul Scherrer Institute, 5232 Villigen PSI, Switzerland., Porro M; European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany., Scherz A; European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany.
Publikováno v:
Journal of synchrotron radiation [J Synchrotron Radiat] 2023 Mar 01; Vol. 30 (Pt 2), pp. 284-300. Date of Electronic Publication: 2023 Feb 20.
Akademický článek
Tento výsledek nelze pro nepřihlášené uživatele zobrazit.
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Autor:
Zhou Hagström N; Department of Physics, Stockholm University, 106 91 Stockholm, Sweden., Schneider M; Max Born Institute for Nonlinear Optics and Short Pulse Spectroscopy, 12489 Berlin, Germany., Kerber N; Institute of Physics, Johannes Gutenberg-University Mainz, 55099 Mainz, Germany., Yaroslavtsev A; European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany., Burgos Parra E; Synchrotron SOLEIL, Saint-Aubin, Boite Postale 48, 91192 Gif-sur-Yvette Cedex, France., Beg M; European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany., Lang M; Faculty of Engineering and Physical Sciences, University of Southampton, Southampton SO17 1BJ, United Kingdom., Günther CM; Technische Universität Berlin, Zentraleinrichtung Elektronenmikroskopie (ZELMI), Berlin, Germany., Seng B; Institute of Physics, Johannes Gutenberg-University Mainz, 55099 Mainz, Germany., Kammerbauer F; Institute of Physics, Johannes Gutenberg-University Mainz, 55099 Mainz, Germany., Popescu H; Synchrotron SOLEIL, Saint-Aubin, Boite Postale 48, 91192 Gif-sur-Yvette Cedex, France., Pancaldi M; Department of Physics, Stockholm University, 106 91 Stockholm, Sweden., Neeraj K; Department of Physics, Stockholm University, 106 91 Stockholm, Sweden., Polley D; Department of Physics, Stockholm University, 106 91 Stockholm, Sweden., Jangid R; Department of Materials Science and Engineering, University of California Davis, CA, USA., Hrkac SB; Department of Physics, University of California San Diego, La Jolla, CA 92093, USA., Patel SKK; Department of Physics, University of California San Diego, La Jolla, CA 92093, USA., Ovcharenko S; MIREA - Russian Technological University, Moscow 119454, Russia., Turenne D; Department of Physics and Astronomy, Uppsala University, Uppsala, Sweden., Ksenzov D; Naturwissenschaftlich-Technische Fakultät - Department Physik, Universität Siegen, Siegen, Germany., Boeglin C; University of Strasbourg - CNRS, IPCMS, UMR 7504, 67000 Strasbourg, France., Baidakova M; Ioffe Institute, 26 Politekhnicheskaya, St Petersburg 194021, Russian Federation., von Korff Schmising C; Max Born Institute for Nonlinear Optics and Short Pulse Spectroscopy, 12489 Berlin, Germany., Borchert M; Max Born Institute for Nonlinear Optics and Short Pulse Spectroscopy, 12489 Berlin, Germany., Vodungbo B; Sorbonne Université, CNRS, Laboratoire de Chimie Physique - Matière et Rayonnement, LCPMR, 75005 Paris, France., Chen K; Helmholtz-Zentrum Berlin für Materialien und Energie, 12489 Berlin, Germany., Luo C; Helmholtz-Zentrum Berlin für Materialien und Energie, 12489 Berlin, Germany., Radu F; Helmholtz-Zentrum Berlin für Materialien und Energie, 12489 Berlin, Germany., Müller L; Deutsches Elektronen-Synchrotron DESY, 22607 Hamburg, Germany., Martínez Flórez M; Deutsches Elektronen-Synchrotron DESY, 22607 Hamburg, Germany., Philippi-Kobs A; Deutsches Elektronen-Synchrotron DESY, 22607 Hamburg, Germany., Riepp M; Deutsches Elektronen-Synchrotron DESY, 22607 Hamburg, Germany., Roseker W; Deutsches Elektronen-Synchrotron DESY, 22607 Hamburg, Germany., Grübel G; Deutsches Elektronen-Synchrotron DESY, 22607 Hamburg, Germany., Carley R; European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany., Schlappa J; European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany., Van Kuiken BE; European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany., Gort R; European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany., Mercadier L; European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany., Agarwal N; European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany., Le Guyader L; European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany., Mercurio G; European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany., Teichmann M; European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany., Delitz JT; European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany., Reich A; European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany., Broers C; European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany., Hickin D; European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany., Deiter C; European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany., Moore J; European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany., Rompotis D; European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany., Wang J; European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany., Kane D; European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany., Venkatesan S; European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany., Meier J; European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany., Pallas F; European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany., Jezynski T; European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany., Lederer M; European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany., Boukhelef D; European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany., Szuba J; European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany., Wrona K; European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany., Hauf S; European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany., Zhu J; European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany., Bergemann M; European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany., Kamil E; European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany., Kluyver T; European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany., Rosca R; European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany., Spirzewski M; European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany., Kuster M; European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany., Turcato M; European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany., Lomidze D; European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany., Samartsev A; European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany., Engelke J; European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany., Porro M; European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany., Maffessanti S; Deutsches Elektronen-Synchrotron DESY, 22607 Hamburg, Germany., Hansen K; Deutsches Elektronen-Synchrotron DESY, 22607 Hamburg, Germany., Erdinger F; Department of Physics, Stockholm University, 106 91 Stockholm, Sweden., Fischer P; Department of Physics, Stockholm University, 106 91 Stockholm, Sweden., Fiorini C; Max Born Institute for Nonlinear Optics and Short Pulse Spectroscopy, 12489 Berlin, Germany., Castoldi A; Max Born Institute for Nonlinear Optics and Short Pulse Spectroscopy, 12489 Berlin, Germany., Manghisoni M; European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany., Wunderer CB; Department of Physics and Astronomy, Uppsala University, Uppsala, Sweden., Fullerton EE; Center for Memory and Recording Research, University of California San Diego, La Jolla, CA 92093, USA., Shpyrko OG; Department of Physics, University of California San Diego, La Jolla, CA 92093, USA., Gutt C; Naturwissenschaftlich-Technische Fakultät - Department Physik, Universität Siegen, Siegen, Germany., Sanchez-Hanke C; Synchrotron SOLEIL, Saint-Aubin, Boite Postale 48, 91192 Gif-sur-Yvette Cedex, France., Dürr HA; Department of Physics and Astronomy, Uppsala University, Uppsala, Sweden., Iacocca E; Unité Mixte de Physique, CNRS, Thales, Université Paris-Saclay, 91767 Palaiseau, France., Nembach HT; Faculty of Engineering and Physical Sciences, University of Southampton, Southampton SO17 1BJ, United Kingdom., Keller MW; Department of Earth Science and Engineering, Imperial College London, London SW7 2AZ, United Kingdom., Shaw JM; Department of Earth Science and Engineering, Imperial College London, London SW7 2AZ, United Kingdom., Silva TJ; Department of Earth Science and Engineering, Imperial College London, London SW7 2AZ, United Kingdom., Kukreja R; Department of Materials Science and Engineering, University of California Davis, CA, USA., Fangohr H; European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany., Eisebitt S; Max Born Institute for Nonlinear Optics and Short Pulse Spectroscopy, 12489 Berlin, Germany., Kläui M; Institute of Physics, Johannes Gutenberg-University Mainz, 55099 Mainz, Germany., Jaouen N; Synchrotron SOLEIL, Saint-Aubin, Boite Postale 48, 91192 Gif-sur-Yvette Cedex, France., Scherz A; European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany., Bonetti S; Department of Physics, Stockholm University, 106 91 Stockholm, Sweden., Jal E; Sorbonne Université, CNRS, Laboratoire de Chimie Physique - Matière et Rayonnement, LCPMR, 75005 Paris, France.
Publikováno v:
Journal of synchrotron radiation [J Synchrotron Radiat] 2022 Nov 01; Vol. 29 (Pt 6), pp. 1454-1464. Date of Electronic Publication: 2022 Sep 29.
Akademický článek
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Autor:
Hansen, K., Klar, H., Kalavakuru, P., Reckleben, C., Venzmer, A., Wustenhagen, E., Schappeit, R., Zeides, O. -C., Okrent, F., Wunderer, C., Lemke, M., Graafsma, H., Schlosser, I., Manghisoni, M., Riceputi, E., Aschauer, S., Struder, L., Soldat, J., Tangl, M., Erdinger, F., Kugel, A., Fischer, P., Andricek, L., Ninkovic, J., Turcato, M., Porro, M.
Publikováno v:
IEEE transactions on nuclear science 66(8), 1966-1975 (2019). doi:10.1109/TNS.2019.2927421
IEEE transactions on nuclear science 66(8), 1966 - 1975 (2019). doi:10.1109/TNS.2019.2927421
The focal-plane module is the key component of the DEPFET sensor with signal compression (DSSC) mega-pixel X-ray imager and handles the data of 128 $\ti
The focal-plane module is the key component of the DEPFET sensor with signal compression (DSSC) mega-pixel X-ray imager and handles the data of 128 $\ti
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::fc2ef490c892281f921977b61cefde61
Autor:
Büttner F; Department of Materials Science and Engineering, Massachusetts Institute of Technology, Cambridge, MA, USA. Felix.Buettner@helmholtz-berlin.de.; Helmholtz-Zentrum für Materialien und Energie GmbH, Berlin, Germany. Felix.Buettner@helmholtz-berlin.de., Pfau B; Max-Born-Institut, Berlin, Germany. Bastian.Pfau@mbi-berlin.de., Böttcher M; Institut für Physik, Johannes Gutenberg Universität Mainz, Mainz, Germany., Schneider M; Max-Born-Institut, Berlin, Germany., Mercurio G; European XFEL, Schenefeld, Germany., Günther CM; Zentraleinrichtung Elektronenmikroskopie (ZELMI), Technische Universität Berlin, Berlin, Germany.; Institut für Optik und Atomare Physik, Technische Universität Berlin, Berlin, Germany., Hessing P; Max-Born-Institut, Berlin, Germany., Klose C; Max-Born-Institut, Berlin, Germany., Wittmann A; Department of Materials Science and Engineering, Massachusetts Institute of Technology, Cambridge, MA, USA., Gerlinger K; Max-Born-Institut, Berlin, Germany., Kern LM; Max-Born-Institut, Berlin, Germany., Strüber C; Max-Born-Institut, Berlin, Germany., von Korff Schmising C; Max-Born-Institut, Berlin, Germany., Fuchs J; Max-Born-Institut, Berlin, Germany., Engel D; Max-Born-Institut, Berlin, Germany., Churikova A; Department of Materials Science and Engineering, Massachusetts Institute of Technology, Cambridge, MA, USA., Huang S; Department of Materials Science and Engineering, Massachusetts Institute of Technology, Cambridge, MA, USA., Suzuki D; Department of Materials Science and Engineering, Massachusetts Institute of Technology, Cambridge, MA, USA., Lemesh I; Department of Materials Science and Engineering, Massachusetts Institute of Technology, Cambridge, MA, USA., Huang M; Department of Materials Science and Engineering, Massachusetts Institute of Technology, Cambridge, MA, USA., Caretta L; Department of Materials Science and Engineering, Massachusetts Institute of Technology, Cambridge, MA, USA., Weder D; Max-Born-Institut, Berlin, Germany., Gaida JH; 4th Physical Institute, University of Göttingen, Göttingen, Germany., Möller M; 4th Physical Institute, University of Göttingen, Göttingen, Germany., Harvey TR; 4th Physical Institute, University of Göttingen, Göttingen, Germany., Zayko S; 4th Physical Institute, University of Göttingen, Göttingen, Germany., Bagschik K; Deutsches Elektronen-Synchrotron (DESY), Hamburg, Germany., Carley R; European XFEL, Schenefeld, Germany., Mercadier L; European XFEL, Schenefeld, Germany., Schlappa J; European XFEL, Schenefeld, Germany., Yaroslavtsev A; European XFEL, Schenefeld, Germany., Le Guyarder L; European XFEL, Schenefeld, Germany., Gerasimova N; European XFEL, Schenefeld, Germany., Scherz A; European XFEL, Schenefeld, Germany., Deiter C; European XFEL, Schenefeld, Germany., Gort R; European XFEL, Schenefeld, Germany., Hickin D; European XFEL, Schenefeld, Germany., Zhu J; European XFEL, Schenefeld, Germany., Turcato M; European XFEL, Schenefeld, Germany., Lomidze D; European XFEL, Schenefeld, Germany., Erdinger F; Institute of Computer Engineering, Heidelberg University, Heidelberg, Germany., Castoldi A; Dipartimento di Elettronica, Informazione e Bioingegneria, Politecnico di Milano, Milano, Italy.; Istituto Nazionale di Fisica Nucleare, Sezione di Milano, Milano, Italy., Maffessanti S; Deutsches Elektronen-Synchrotron (DESY), Hamburg, Germany., Porro M; European XFEL, Schenefeld, Germany., Samartsev A; European XFEL, Schenefeld, Germany., Sinova J; Institut für Physik, Johannes Gutenberg Universität Mainz, Mainz, Germany., Ropers C; 4th Physical Institute, University of Göttingen, Göttingen, Germany., Mentink JH; Institute for Molecules and Materials, Radboud University, Nijmegen, the Netherlands., Dupé B; Institut für Physik, Johannes Gutenberg Universität Mainz, Mainz, Germany.; Nanomat/Q-mat/CESAM, Université de Liège, Belgium and Fonds de la Recherche Scientifique (FNRS), Bruxelles, Belgium., Beach GSD; Department of Materials Science and Engineering, Massachusetts Institute of Technology, Cambridge, MA, USA., Eisebitt S; Max-Born-Institut, Berlin, Germany.; Institut für Optik und Atomare Physik, Technische Universität Berlin, Berlin, Germany.
Publikováno v:
Nature materials [Nat Mater] 2021 Jan; Vol. 20 (1), pp. 30-37. Date of Electronic Publication: 2020 Oct 05.
Akademický článek
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Akademický článek
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