Zobrazeno 1 - 10
of 21
pro vyhledávání: '"Enrique A. López-Guerra"'
Publikováno v:
Beilstein Journal of Nanotechnology, Vol 12, Iss 1, Pp 1063-1077 (2021)
Viscoelastic characterization of materials at the micro- and the nanoscale is commonly performed with the aid of force–distance relationships acquired using atomic force microscopy (AFM). The general strategy for existing methods is to fit the obse
Externí odkaz:
https://doaj.org/article/d1e8edf66a2d43dcb873dfc348e337d2
Publikováno v:
Beilstein Journal of Nanotechnology, Vol 11, Iss 1, Pp 1409-1418 (2020)
Atomic force microscopy (AFM) is a widely use technique to acquire topographical, mechanical, or electromagnetic properties of surfaces, as well as to induce surface modifications at the micrometer and nanometer scale. Viscoelastic materials, example
Externí odkaz:
https://doaj.org/article/449e4971851c4ef9bb8f206453b60fba
Publikováno v:
Scientific Reports, Vol 8, Iss 1, Pp 1-16 (2018)
Abstract Scanning probe microscopy has enabled nanoscale mapping of mechanical properties in important technological materials, such as tissues, biomaterials, polymers, nanointerfaces of composite materials, to name only a few. To improve and widen t
Externí odkaz:
https://doaj.org/article/dc55e19766744da0a8c3be14b65718e1
Publikováno v:
Beilstein Journal of Nanotechnology, Vol 9, Iss 1, Pp 1116-1122 (2018)
In this short paper we explore the use of higher eigenmodes in single-eigenmode amplitude-modulation atomic force microscopy (AFM) for the small-indentation imaging of soft viscoelastic materials. In viscoelastic materials, whose response depends on
Externí odkaz:
https://doaj.org/article/f5a39b2879234269af05862a114a983d
Publikováno v:
Beilstein Journal of Nanotechnology, Vol 8, Iss 1, Pp 2230-2244 (2017)
We explore the contact problem of a flat-end indenter penetrating intermittently a generalized viscoelastic surface, containing multiple characteristic times. This problem is especially relevant for nanoprobing of viscoelastic surfaces with the highl
Externí odkaz:
https://doaj.org/article/815272fe0f21435fa0df4fe9792a8bc1
Publikováno v:
Beilstein Journal of Nanotechnology, Vol 5, Iss 1, Pp 2149-2163 (2014)
We examine different approaches to model viscoelasticity within atomic force microscopy (AFM) simulation. Our study ranges from very simple linear spring–dashpot models to more sophisticated nonlinear systems that are able to reproduce fundamental
Externí odkaz:
https://doaj.org/article/f9f119b433f84866928fc1f206bd9269
Publikováno v:
Beilstein Journal of Nanotechnology
Beilstein Journal of Nanotechnology, Vol 11, Iss 1, Pp 1409-1418 (2020)
Beilstein Journal of Nanotechnology, Vol 11, Iss 1, Pp 1409-1418 (2020)
Atomic force microscopy (AFM) is a widely use technique to acquire topographical, mechanical, or electromagnetic properties of surfaces, as well as to induce surface modifications at the micrometer and nanometer scale. Viscoelastic materials, example
Publikováno v:
Journal of Polymer Science Part B: Polymer Physics. 55:804-813
We explore the physics of an atomic force microscopy (AFM) cantilever tip interacting with a generalized viscoelastic sample containing an arbitrary number of characteristic times, when the cantilever's base is driven with constant velocity toward th
Publikováno v:
Scientific Reports, Vol 9, Iss 1, Pp 1-10 (2019)
Scientific Reports
Scientific Reports
Traditionally, dynamic atomic force microscopy (AFM) techniques are based on the analysis of the quasi-steady state response of the cantilever deflection in terms of Fourier analysis. Here we describe a technique that instead exploits the often disre
Biofilms are a cluster of bacteria embedded in extracellular polymeric substances (EPS) that contain a complex composition of polysaccharides, proteins, and extracellular DNA (eDNA). Desirable mechanical properties of the biofilms are critical for th
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::45e07f64ceb2970ef0fa0724dfc19c14
http://arxiv.org/abs/1901.03792
http://arxiv.org/abs/1901.03792