Zobrazeno 1 - 10
of 216
pro vyhledávání: '"Enrico Bellotti"'
Publikováno v:
IEEE Photonics Journal, Vol 16, Iss 3, Pp 1-11 (2024)
This work presents a systematic study of the sensitivities of silicon avalanche photodiode (APD) performance metrics, including gain, excess noise, and bandwidth, to potential variabilities in the fabrication process. The APDs simulations are perform
Externí odkaz:
https://doaj.org/article/a2d60749242645779b51bf31d92f8331
Publikováno v:
IEEE Journal of the Electron Devices Society, Vol 7, Pp 534-543 (2019)
Capacitance-voltage (C-V) profiling is a useful technique for accurate and non-destructive determination of carrier concentrations in semiconductor materials. Recently, this measurement has been applied to the infrared barrier detector to determine t
Externí odkaz:
https://doaj.org/article/22251c0c128442ceabbd026e1150d905
Autor:
Marco Calciati, Michele Goano, Francesco Bertazzi, Marco Vallone, Xiangyu Zhou, Giovanni Ghione, Matteo Meneghini, Gaudenzio Meneghesso, Enrico Zanoni, Enrico Bellotti, Giovanni Verzellesi, Dandan Zhu, Colin Humphreys
Publikováno v:
AIP Advances, Vol 4, Iss 6, Pp 067118-067118-23 (2014)
Electroluminescence (EL) characterization of InGaN/GaN light-emitting diodes (LEDs), coupled with numerical device models of different sophistication, is routinely adopted not only to establish correlations between device efficiency and structural fe
Externí odkaz:
https://doaj.org/article/3f256fc1a6b74d5487ad5fdbe17a7a04
Autor:
Mike Zhu, Ilya Prighozhin, Pradip Mitra, Richard Scritchfield, Chris Schaake, Joanna Martin, Jin Hwan Park, Fikri Aqariden, Enrico Bellotti
Publikováno v:
IEEE Transactions on Electron Devices. 69:4962-4969
Autor:
Jack D. Flicker, Luciano Andres Garcia Rodriguez, Jacob Mueller, Lee Gill, Jason C. Neely, Emily Schrock, Harold P. Hjalmarson, Enrico Bellotti, Peter A. Schultz, Jane M. Lehr, Gregory Pickrell, Robert Kaplar
Publikováno v:
Power Systems ISBN: 9783031265716
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::13a049ae3b514fe7da4c11f7229161a9
https://doi.org/10.1007/978-3-031-26572-3_9
https://doi.org/10.1007/978-3-031-26572-3_9
Publikováno v:
2022 IEEE Research and Applications of Photonics in Defense Conference (RAPID).
Autor:
Arvind I. DSouza, Vaikunth Khalap, Ian Baker, Egle Zemaityte, Ilya Prighozin, Enrico Bellotti
Publikováno v:
Image Sensing Technologies: Materials, Devices, Systems, and Applications IX.
Autor:
Mark O'Masta, Binh-Minh Nguyen, Alexander Gurga, Trevor Sasse, Brian Hempe, Christian Neuhaus, Eric Clough, Jacob Hundley, Pamela Patterson, James Jenkins, Mary Chen, Gregory Jacques, Scott Linton, Francisco Perez, Colin van Ysseldyk, Esther Wang, Yan Tang, Kenta Niwa, Tobias Schaedler, Alexandros Kyrtsos, John Glennon, Andreu Glasmann, Enrico Bellotti, Geoff McKnight
Publikováno v:
Infrared Technology and Applications XLVIII.
Publikováno v:
IEEE Transactions on Electron Devices. :1-9
We present a flexible, full-band, 3-D Monte Carlo (MC) modeling software package for charge transport in semiconductor devices. The numerical model can employ both analytical and full-band descriptions of the band structure simultaneously and uses un