Zobrazeno 1 - 5
of 5
pro vyhledávání: '"Enokimoto, Kazunari"'
Autor:
Michael A. Kochte, Miyase, Kohei, Wen, Xiaoqing, Kajihara, Seiji, Yamato, Yuta, Enokimoto, Kazunari, Wunderlich, Hans-Joachim
Publikováno v:
IEEE/ACM International Symposium on Low Power Electronics and Design.
Excessive power dissipation during VLSI testing results in over-testing, yield loss and heat damage of the device. For low power devices with advanced power management features and more stringent power budgets, power-aware testing is even more mandat
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::2cc73dd3ad319b29c9ac63a1191e28b7
https://doi.org/10.1109/islped.2011.5993600
https://doi.org/10.1109/islped.2011.5993600
Autor:
Enokimoto, Kazunari, Wen, Xiaoqing, Miyase, Kohei, Huang, Jiun-Lang, Kajihara, Seiji, Wang, Laung-Terng
Publikováno v:
2013 26th International Conference on VLSI Design & 2013 12th International Conference on Embedded Systems; 1/ 1/2013, p279-284, 6p
Autor:
Miyase, Kohei, Aso, Masao, Ootsuka, Ryou, Wen, Xiaoqing, Furukawa, Hiroshi, Yamato, Yuta, Enokimoto, Kazunari, Kajihara, Seiji
Publikováno v:
2012 IEEE 30th VLSI Test Symposium (VTS); 1/ 1/2012, p197-202, 6p
Autor:
Kochte, Michael A., Miyase, Kohei, Wen, Xiaoqing, Kajihara, Seiji, Yamato, Yuta, Enokimoto, Kazunari, Wunderlich, Hans-Joachim
Publikováno v:
Proceedings of the 17th IEEE/ACM International Symposium: Low-power Electronics & Design; 8/ 1/2011, p33-38, 6p
Publikováno v:
2013 26th International Conference on VLSI Design & 2013 12th International Conference on Embedded Systems; 1/ 1/2013, p392-394, 3p