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pro vyhledávání: '"Enoal Le Goulven"'
Autor:
Fabien Widmeer, L. Gouyet, Ali Zadeh, Lionel Salvy, Veronique Ferlet-Cavrois, Thomas Caunes, Maxime Vaille, A. Samaras, Benjamin Renaud, Pierre Garcia, Christian Poivey, B. Vandevelde, Maryse Sauvagnac, Alexandre Rousset, Enoal Le Goulven, Marc Poizat, Christian Chatry, Ludovic Puybusque, Christian Erd, Yannick Padie, Jean Paul Abadi, Gael Vignon, Cesar Boatella-Polo
Publikováno v:
2013 IEEE Radiation Effects Data Workshop (REDW).
We present radiation test data on optocouplers from three different vendors including results on neutron (1MeV) and proton (30, 60, 190MeV) induced displacement damage, total ionizing dose (Co60) and proton induced Single Event Transients.