Zobrazeno 1 - 10
of 49
pro vyhledávání: '"Engelmann, H.J."'
Autor:
Aubel, O., Meyer, M.A., Feustel, F., Engelmann, H.J., Zienert, I., Poppe, J., Schmidt, H., Gehre, D., Geisler, H., Langer, E., Limbecker, P., Foltyn, T., Witt, C., Yao, W., Thierbach, S., Koschinsky, F., Zistl, C.
Publikováno v:
In Microelectronic Engineering 2008 85(10):2042-2046
Autor:
Zschech, E., Meyer, M.A., Mhaisalkar, S.G., Vairagar, A.V., Krishnamoorthy, A., Engelmann, H.J., Sukharev, V.
Publikováno v:
In Thin Solid Films 2006 504(1):279-283
Publikováno v:
In Thin Solid Films 2002 405(1):198-204
Publikováno v:
In Microelectronics Reliability August-October 2000 40(8-10):1747-1751
Publikováno v:
2011 18th IEEE International Symposium on the Physical & Failure Analysis of Integrated Circuits (IPFA); 2011, p1-4, 4p
Publikováno v:
2009 IEEE International Integrated Reliability Workshop Final Report; 2009, p5-10, 6p
Autor:
Kramer, Bernhard, Kramer, B., Zschech, E., Engelmann, H.J., Ohsiek, S., Tracy, B., Adem, E., Robie, S., Bernard, J., Schmeisser, D.
Publikováno v:
Advances in Solid State Physics (9783540260417); 2005, p375-389, 15p
Publikováno v:
Radiation Protection Dosimetry; 1997, Vol. 70 Issue 1-4, p251-254, 4p
Autor:
Albrecht, E., Kolditz, H., Thielemann, K., Duerr, K., Klarr, K., Kuehn, K., Staupendahl, G., Uerpmann, E.P., Bechthold, W.M., Diefenbacher, W., Engelmann, H.J., Hild, W., Krause, H., Schuchardt, M.C.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::de7fa599f7bc9d31f435d293180a7bd3
https://publikationen.bibliothek.kit.edu/270008577
https://publikationen.bibliothek.kit.edu/270008577
